TLC082AIDRG4
- Mfr.Part #
- TLC082AIDRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 8-SOIC (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC OPAMP GP 2 CIRCUIT 8SOIC
- Stock
- 881
- In Stock :
- 881
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- Manufacturer :
- Texas Instruments
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Frequency Compensation :
- yes
- Supply Voltage :
- 5V
- Height :
- 1.75mm
- Number of Functions :
- 2
- Terminal Position :
- Dual
- Lead Free :
- Lead Free
- Common Mode Rejection Ratio :
- 80 dB
- Micropower :
- No
- Average Bias Current-Max (IIB) :
- 0.0007μA
- Base Part Number :
- TLC082
- Programmable Power :
- No
- Number of Terminations :
- 8
- Package / Case :
- 8-SOIC (0.154, 3.90mm Width)
- Voltage - Input Offset :
- 390μV
- Operating Supply Current :
- 1.9mA
- Current - Input Bias :
- 2pA
- Architecture :
- VOLTAGE-FEEDBACK
- Mounting Type :
- Surface Mount
- Bandwidth :
- 10MHz
- Peak Reflow Temperature (Cel) :
- 260
- Supply Voltage Limit-Max :
- 17V
- Pbfree Code :
- yes
- Max I/O Voltage :
- 1.4mV
- Nominal Gain Bandwidth Product :
- 10MHz
- Length :
- 4.9mm
- RoHS Status :
- ROHS3 Compliant
- Operating Temperature :
- -40°C~125°C
- Slew Rate :
- 19V/μs
- JESD-609 Code :
- e4
- Lifecycle Status :
- ACTIVE (Last Updated: 5 days ago)
- Output Current :
- 57mA
- Packing Method :
- TR
- Amplifier Type :
- GENERAL PURPOSE
- Unity Gain BW-Nom :
- 10000 kHz
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Bias Current-Max (IIB) @25C :
- 0.00005μA
- Radiation Hardening :
- No
- Low-Offset :
- No
- Voltage Gain :
- 120dB
- ECCN Code :
- EAR99
- Pin Count :
- 8
- Terminal Form :
- Gull wing
- Thickness :
- 1.58mm
- Power Dissipation :
- 710mW
- Width :
- 3.91mm
- Output Current per Channel :
- 57mA
- Input Offset Voltage (Vos) :
- 1.4mV
- Operating Supply Voltage :
- 8V
- Surface Mount :
- yes
- Factory Lead Time :
- 6 Weeks
- Number of Pins :
- 8
- Input Offset Current-Max (IIO) :
- 0.00005μA
- Low-Bias :
- yes
- Voltage - Supply, Single/Dual (±) :
- 4.5V~16V ±2.25V~8V
- Packaging :
- Tape and Reel (TR)
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Number of Elements :
- 2
- Nominal Supply Current :
- 5.8mA
- Datasheets
- TLC082AIDRG4

Instrumentation OP Amps Buffer Amps Texas Instruments TLC082AIDRG4 Overview
This Texas Instruments TLC082AIDRG4 integrated circuit is a versatile operational amplifier (op-amp) designed for general-purpose applications in instrumentation, OP amps, and buffer amps circuits. With its robust design and high-performance capabilities, this IC is ideal for a wide range of industrial and commercial electronics applications.
Featuring a compact 8SOIC package, the TLC082AIDRG4 offers ease of integration into various circuit designs, making it suitable for both prototyping and mass production.
TLC082AIDRG4 Features
- General-purpose operational amplifier
- 2 circuit
- Low input offset voltage: ±150μV max
- Low noise: 18nV/√Hz typ at f = 1kHz
- Low input bias current: ±20pA typ
- High slew rate: 3.6V/μs typ
- Wide bandwidth: 4MHz typ
- Low input offset current: ±2pA typ
- Single or dual-supply operation
TLC082AIDRG4 Applications
- Medical Devices: The TLC082AIDRG4 is utilized in medical equipment such as patient monitoring systems and diagnostic devices for its precision and reliability. Its low noise and low input offset voltage ensure accurate signal amplification, making it essential in critical healthcare applications.
- Industrial Automation: In industrial automation systems, the TLC082AIDRG4 serves as a key component in sensor interfaces, control circuits, and signal conditioning modules. Its wide bandwidth and high slew rate enable fast and precise data acquisition and processing, enhancing overall system performance and efficiency.
- Test and Measurement Instruments: For test and measurement instruments like multimeters, oscilloscopes, and signal generators, the TLC082AIDRG4 provides high-quality signal amplification and conditioning. Its low input bias current and low input offset current contribute to accurate measurement results, ensuring reliable performance in various testing environments.
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