TLC082AIDRG4
- Mfr.Part #
- TLC082AIDRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 8-SOIC (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC OPAMP GP 2 CIRCUIT 8SOIC
- Stock
- 881
- In Stock :
- 881
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- Manufacturer :
- Texas Instruments
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Power Dissipation :
- 710mW
- Lifecycle Status :
- ACTIVE (Last Updated: 5 days ago)
- Lead Free :
- Lead Free
- Number of Pins :
- 8
- Architecture :
- VOLTAGE-FEEDBACK
- Supply Voltage Limit-Max :
- 17V
- Amplifier Type :
- GENERAL PURPOSE
- Voltage - Supply, Single/Dual (±) :
- 4.5V~16V ±2.25V~8V
- Micropower :
- No
- Output Current per Channel :
- 57mA
- Surface Mount :
- yes
- Nominal Gain Bandwidth Product :
- 10MHz
- Nominal Supply Current :
- 5.8mA
- Factory Lead Time :
- 6 Weeks
- Pin Count :
- 8
- Packing Method :
- TR
- Length :
- 4.9mm
- Average Bias Current-Max (IIB) :
- 0.0007μA
- Terminal Position :
- Dual
- Operating Supply Current :
- 1.9mA
- Pbfree Code :
- yes
- Package / Case :
- 8-SOIC (0.154, 3.90mm Width)
- Input Offset Voltage (Vos) :
- 1.4mV
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Packaging :
- Tape and Reel (TR)
- Low-Offset :
- No
- Bandwidth :
- 10MHz
- Programmable Power :
- No
- Low-Bias :
- yes
- Number of Functions :
- 2
- Max I/O Voltage :
- 1.4mV
- ECCN Code :
- EAR99
- Input Offset Current-Max (IIO) :
- 0.00005μA
- Number of Terminations :
- 8
- Width :
- 3.91mm
- Radiation Hardening :
- No
- Current - Input Bias :
- 2pA
- Slew Rate :
- 19V/μs
- Mounting Type :
- Surface Mount
- Operating Temperature :
- -40°C~125°C
- Voltage - Input Offset :
- 390μV
- Terminal Form :
- Gull wing
- Thickness :
- 1.58mm
- Peak Reflow Temperature (Cel) :
- 260
- Operating Supply Voltage :
- 8V
- Unity Gain BW-Nom :
- 10000 kHz
- Voltage Gain :
- 120dB
- Height :
- 1.75mm
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Output Current :
- 57mA
- Common Mode Rejection Ratio :
- 80 dB
- Base Part Number :
- TLC082
- JESD-609 Code :
- e4
- Supply Voltage :
- 5V
- Number of Elements :
- 2
- RoHS Status :
- ROHS3 Compliant
- Bias Current-Max (IIB) @25C :
- 0.00005μA
- Frequency Compensation :
- yes
- Datasheets
- TLC082AIDRG4

Instrumentation OP Amps Buffer Amps Texas Instruments TLC082AIDRG4 Overview
This Texas Instruments TLC082AIDRG4 integrated circuit is a versatile operational amplifier (op-amp) designed for general-purpose applications in instrumentation, OP amps, and buffer amps circuits. With its robust design and high-performance capabilities, this IC is ideal for a wide range of industrial and commercial electronics applications.
Featuring a compact 8SOIC package, the TLC082AIDRG4 offers ease of integration into various circuit designs, making it suitable for both prototyping and mass production.
TLC082AIDRG4 Features
- General-purpose operational amplifier
- 2 circuit
- Low input offset voltage: ±150μV max
- Low noise: 18nV/√Hz typ at f = 1kHz
- Low input bias current: ±20pA typ
- High slew rate: 3.6V/μs typ
- Wide bandwidth: 4MHz typ
- Low input offset current: ±2pA typ
- Single or dual-supply operation
TLC082AIDRG4 Applications
- Medical Devices: The TLC082AIDRG4 is utilized in medical equipment such as patient monitoring systems and diagnostic devices for its precision and reliability. Its low noise and low input offset voltage ensure accurate signal amplification, making it essential in critical healthcare applications.
- Industrial Automation: In industrial automation systems, the TLC082AIDRG4 serves as a key component in sensor interfaces, control circuits, and signal conditioning modules. Its wide bandwidth and high slew rate enable fast and precise data acquisition and processing, enhancing overall system performance and efficiency.
- Test and Measurement Instruments: For test and measurement instruments like multimeters, oscilloscopes, and signal generators, the TLC082AIDRG4 provides high-quality signal amplification and conditioning. Its low input bias current and low input offset current contribute to accurate measurement results, ensuring reliable performance in various testing environments.
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