5962-9318601M3A
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- Mfr.Part #
- 5962-9318601M3A
- Manufacturer
- Texas Instruments
- Package / Case
- Datasheet
- Download
- Description
- SN54ABT8245 SCAN TEST DEVICES WI
- Stock
- 1
- In Stock ：
- 1
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- Manufacturer :
- Texas Instruments
- Product Category :
- Buffers, Drivers, Receivers, Transceivers
- Contact Plating :
- Lead, Tin
- Max Supply Voltage :
- 5.5 V
- Width :
- 11.43 mm
- High Level Output Current :
- -24 mA
- Quiescent Current :
- 30 mA
- Min Operating Temperature :
- -55 °C
- Product Status :
- Active
- Series :
- *
- Height :
- 2.03 mm
- Direction :
- Bidirectional
- Max Operating Temperature :
- 125 °C
- Output Type :
- TTL
- Operating Supply Voltage :
- 5 V
- Min Supply Voltage :
- 4.5 V
- Low Level Output Current :
- 48 mA
- RoHS :
- Compliant
- Propagation Delay :
- 5.1 ns
- Number of Bits :
- 8
- Mount :
- Surface Mount
- Radiation Hardening :
- No
- RoHS Status :
- RoHS Compliant
- Logic Function :
- Transceiver
- Length :
- 11.43 mm
- Lifecycle Status :
- Production (Last Updated: 6 days ago)
- Manufacturer Lifecycle Status :
- ACTIVE (Last Updated: 6 days ago)
- Thickness :
- 1.83 mm
- Package :
- Tube
- Lead Free :
- Contains Lead
- Number of Outputs :
- 8
- Number of Pins :
- 28
- Polarity :
- Non-Inverting
- Datasheets
- 5962-9318601M3A
Buffers, Drivers, Receivers, Transceivers Texas Instruments 5962-9318601M3A Overview
The Texas Instruments 5962-9318601M3A part of the Buffers, Drivers, Receivers, Transceivers category, represents a state-of-the-art solution for scan testing devices within the semiconductor industry. Designed to meet rigorous testing and performance standards, this IC is engineered for high reliability and precision. The SN54ABT8245 model is specifically optimized for applications requiring efficient data transfer and signal integrity. As an essential component in advanced electronic systems, this product leverages Texas Instruments' long-standing expertise in integrated circuit technology, making it an ideal choice for businesses seeking robust performance in their electronic applications.
5962-9318601M3A Features
This integrated circuit boasts a suite of features that enhance its utility in scan test devices, including high-speed bidirectional communication capabilities, low power consumption, and an improved interface for testing. The robust design ensures that the SN54ABT8245 is capable of operating under extended industrial temperature ranges, which is critical for varied testing environments.
5962-9318601M3A Applications
- Automated Test Equipment (ATE): Utilizes the device's bidirectional communication capabilities to facilitate efficient data exchange, ensuring high-speed testing and reliability in manufacturing quality control.
- Data Communication Systems: Employs its high-speed interfacing to enhance signal integrity and reduce latency in critical communication infrastructure.
- Embedded Systems: Benefits from the low power consumption and high reliability of the SN54ABT8245 to perform in various embedded applications where stability and endurance are paramount.
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