5962-9172701QLA
- Mfr.Part #
- 5962-9172701QLA
- Manufacturer
- Texas Instruments
- Package / Case
- Datasheet
- Download
- Description
- SN54BCT8374A SCAN TEST DEVICES W
- Stock
- 66
- In Stock :
- 66
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- * Fullname:
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- Comment:
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- Manufacturer :
- Texas Instruments
- Product Category :
- Buffers, Drivers, Receivers, Transceivers
- Logic IC Type :
- BOUNDARY SCAN BUS DRIVER
- Family :
- BCT/FBT
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Power Supply Current-Max (ICC) :
- 52 mA
- Power Supplies :
- 5 V
- Supply Voltage-Max (Vsup) :
- 5.5 V
- JESD-30 Code :
- R-GDIP-T24
- Base Product Number :
- 5962-9172701
- Surface Mount :
- No
- Propagation Delay (tpd) :
- 10.5 ns
- Number of Ports :
- 2
- Max I(ol) :
- 0.064 A
- Control Type :
- INDEPENDENT CONTROL
- Count Direction :
- Unidirectional
- Output Characteristics :
- 3-STATE
- Series :
- *
- Screening Level :
- MIL-PRF-38535 Class Q
- Length :
- 32 mm
- Brand Name :
- Texas
- Width :
- 6.92 mm
- Pin Count :
- 24
- Product Status :
- Active
- Terminal Form :
- THROUGH-HOLE
- Terminal Pitch :
- 2.54 mm
- Manufacturer :
- Texas
- Number of Functions :
- 1
- Number of Terminals :
- 24
- HTS Code :
- 8542.39.00.01
- Temperature Grade :
- Military
- Supply Voltage-Min (Vsup) :
- 4.5 V
- Terminal Position :
- Dual
- Qualification Status :
- Qualified
- Number of Bits :
- 8
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Subcategory :
- Bus Driver/Transceiver
- Package Shape :
- RECTANGULAR
- Seated Height-Max :
- 5.08 mm
- Packing Method :
- Tube
- Translation :
- n/a
- Technology :
- BICMOS
- Package :
- Tube
- Factory Lead Time :
- 1 Week
- Reach Compliance Code :
- not_compliant
- Output Polarity :
- TRUE
- Trigger Type :
- POSITIVE EDGE
- Datasheets
- 5962-9172701QLA

Buffers, Drivers, Receivers, Transceivers Texas Instruments 5962-9172701QLA Overview
The Buffers, Drivers, Receivers, Transceivers Texas Instruments 5962-9172701QLA is a state-of-the-art integrated circuit designed for high reliability and precise functionality in scan test applications. Developed by Texas Instruments, a leader in semiconductor innovation, this component is tailored to enhance the efficiency and accuracy of test environments. The SN54BCT8374A model stands out for its robust performance and adaptability, making it a prime choice for critical and high-stakes applications where precision is paramount.
5962-9172701QLA Features
This integrated circuit comes packed with features that optimize its performance in various scanning and testing operations. It supports extended temperature ranges, ensuring reliability under varying environmental conditions. Its high-speed logic gate technology accelerates processing times, while its compatibility with multiple signal standards allows for versatile usage across different systems and platforms. The compact form factor of the SN54BCT8374A facilitates easier integration into existing setups without significant adjustments.
5962-9172701QLA Applications
- Automated Test Equipment (ATE): Enhances the reliability and speed of testing in manufacturing processes, providing precise measurements and diagnostics to ensure product quality.
- Military and Aerospace Systems: Ideal for use in environments requiring stringent quality and reliability standards; contributes to the robustness and durability of military and aerospace hardware.
- Data Communication Systems: Facilitates error-free data transfer and communication, ensuring integrity and accuracy of information in critical applications.
- Complex Digital Systems: Provides the necessary buffering, driving, and receiving capabilities to maintain signal integrity across various stages of digital processing.
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