TL054CD
- Mfr.Part #
- TL054CD
- Manufacturer
- Texas Instruments
- Package / Case
- D
- Datasheet
- Download
- Description
- IC OPAMP JFET 4 CIRCUIT 14SOIC
- Stock
- 18,696
- In Stock :
- 18,696
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- Manufacturer :
- Texas Instruments
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Surface Mount :
- yes
- Peak Reflow Temperature (Cel) :
- 260
- Neg Supply Voltage-Nom (Vsup) :
- -5V
- Number of Terminations :
- 14
- JESD-609 Code :
- e4
- Min Operating Temperature :
- 0°C
- Slew Rate :
- 17.8 V/μs
- Length :
- 8.65mm
- ECCN Code :
- EAR99
- Operating Supply Current :
- 8.4mA
- Pbfree Code :
- yes
- Gain Bandwidth Product :
- 2.7MHz
- Max I/O Voltage :
- 4mV
- Nominal Gain Bandwidth Product :
- 2.7MHz
- Input Offset Current-Max (IIO) :
- 0.001μA
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Terminal Pitch :
- 1.27mm
- Common Mode Rejection Ratio :
- 75 dB
- Bandwidth :
- 2.7MHz
- Number of Functions :
- 4
- Height Seated (Max) :
- 1.75mm
- Frequency Compensation :
- yes
- Pin Count :
- 14
- Number of Elements :
- 4
- Unity Gain BW-Nom :
- 2700 kHz
- Package / Case :
- D
- Lead Free :
- Contains Lead
- Amplifier Type :
- Operational Amplifier
- Number of Pins :
- 14
- Max Operating Temperature :
- 70°C
- Temperature Grade :
- COMMERCIAL
- Low-Offset :
- No
- Packaging :
- Rail/Tube
- Max Dual Supply Voltage :
- 15V
- Low-Bias :
- yes
- Bias Current-Max (IIB) @25C :
- 0.0002μA
- Operating Supply Voltage :
- 15V
- Output Current per Channel :
- 80mA
- Current - Input Bias :
- 200pA
- Supply Voltage :
- 5V
- Voltage Gain :
- 97.15dB
- Terminal Form :
- Gull wing
- Average Bias Current-Max (IIB) :
- 0.0002μA
- Input Offset Voltage (Vos) :
- 5.5mV
- Radiation Hardening :
- No
- Min Dual Supply Voltage :
- 5V
- RoHS Status :
- RoHS Compliant
- Nominal Supply Current :
- 11.2mA
- Datasheets
- TL054CD

[Instrumentation, Texas Instruments TL054CD] Overview
The TL054CD, manufactured by Texas Instruments, is a highly versatile integrated circuit (IC) designed for a wide range of instrumentation applications. This quad JFET input operational amplifier (op-amp) is housed in a 14SOIC package, offering four independent op-amp circuits within a single component. With its superior performance and reliability, the TL054CD is the ideal choice for engineers and professionals seeking high-quality signal amplification solutions.
Featuring advanced JFET input technology, this IC delivers low input bias and offset currents, ensuring accurate signal processing in various instrumentation systems. Its wide operating voltage range and high slew rate further enhance its suitability for precision applications, making it indispensable in industries such as medical, industrial automation, and test and measurement.
Whether you're designing medical diagnostic equipment, industrial control systems, or scientific instruments, the TL054CD provides the performance and versatility required to meet the demands of modern instrumentation.
TL054CD Features
- Quad JFET input operational amplifier
- Low input bias and offset currents
- High input impedance
- Wide supply voltage range
- High slew rate
- Short-circuit protection
- High common-mode rejection ratio (CMRR)
- Low noise
- Industry-standard 14SOIC package
TL054CD Applications
- Medical Instruments: The TL054CD is ideal for use in medical instrumentation such as patient monitoring systems, ECG amplifiers, and medical imaging equipment. Its low noise and high accuracy ensure precise signal amplification in critical healthcare applications.
- Industrial Automation: In industrial automation systems, the TL054CD can be employed in sensor signal conditioning, process control, and motor control circuits. Its high input impedance and short-circuit protection make it well-suited for robust and reliable operation in harsh industrial environments.
- Test and Measurement Equipment: For test and measurement applications, the TL054CD offers exceptional performance in data acquisition systems, signal generators, and spectrum analyzers. Its high CMRR and wide supply voltage range enable accurate signal processing across a variety of testing scenarios.
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