SN74LVTH18502APM
- Mfr.Part #
- SN74LVTH18502APM
- Manufacturer
- Texas Instruments
- Package / Case
- 64-LQFP
- Datasheet
- Download
- Description
- IC SCAN-TEST-DEV/XCVR 64-LQFP
- Stock
- 8,198
- In Stock :
- 8,198
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Package / Case :
- 64-LQFP
- Height :
- 1.6mm
- Factory Lead Time :
- 6 Weeks
- RoHS Status :
- ROHS3 Compliant
- High Level Output Current :
- -32mA
- Termination :
- SMD/SMT
- JESD-609 Code :
- e4
- Packaging :
- Tray
- Number of Functions :
- 2
- Number of Ports :
- 2
- Thickness :
- 1.4mm
- Output Characteristics :
- 3-STATE
- Number of Terminations :
- 64
- Operating Supply Voltage :
- 3.3V
- Number of Bits :
- 18
- Logic Type :
- ABT Scan Test Device With Universal Bus Transceivers
- Translation :
- n/a
- Length :
- 10mm
- Direction :
- Bidirectional
- Trigger Type :
- POSITIVE EDGE
- Series :
- 74LVTH
- Number of Pins :
- 64
- Pbfree Code :
- yes
- Radiation Hardening :
- No
- Output Type :
- TTL
- Logic Function :
- Transceiver
- Number of Circuits :
- 2
- Mount :
- Surface Mount
- Load Capacitance :
- 50pF
- Contact Plating :
- Gold
- Supply Voltage :
- 2.7V~3.6V
- Low Level Output Current :
- 64mA
- Peak Reflow Temperature (Cel) :
- 260
- Prop. Delay@Nom-Sup :
- 4.9 ns
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Quiescent Current :
- 18mA
- Min Supply Voltage :
- 2.7V
- Lead Free :
- Lead Free
- Operating Temperature :
- -40°C~85°C
- Terminal Pitch :
- 0.5mm
- REACH SVHC :
- No SVHC
- Weight :
- 342.689036mg
- Terminal Form :
- Gull wing
- Turn On Delay Time :
- 20 ns
- Polarity :
- Non-Inverting
- Family :
- LVT
- Control Type :
- INDEPENDENT CONTROL
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Terminal Position :
- QUAD
- Max Supply Voltage :
- 3.6V
- Base Part Number :
- 74LVTH18502
- Propagation Delay :
- 20 ns
- Width :
- 10mm
- Mounting Type :
- Surface Mount
- Pin Count :
- 64
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- ECCN Code :
- EAR99
- Datasheets
- SN74LVTH18502APM

[Specialty Logic Texas Instruments SN74LVTH18502APM] Overview
Introducing the cutting-edge integrated circuit solution from Texas Instruments, the SN74LVTH18502APM. This innovative device redefines the landscape of scan test development and transmission, offering unparalleled performance and reliability. Crafted with precision engineering and advanced technology, it serves as a cornerstone in the realm of integrated circuits, facilitating seamless operation and robust functionality.
With its 64LQFP package, this IC embodies a perfect blend of compact design and superior functionality, making it an ideal choice for diverse applications in the electronics industry. Whether deployed in industrial settings or consumer electronics, the SN74LVTH18502APM excels in delivering exceptional performance, elevating the standards of efficiency and productivity.
Embrace the future of integrated circuit technology with the SN74LVTH18502APM, your ultimate solution for scan test development and transmission needs.
SN74LVTH18502APM Features
- Advanced scan test development and transmission capabilities
- Compact 64LQFP package for space-efficient integration
- Highly reliable performance for industrial and consumer electronics
- Precision engineering for enhanced functionality
- Seamless operation in diverse environments
- Robust design for long-term durability
- Compatibility with a wide range of electronic devices
SN74LVTH18502APM Applications
- Automotive Electronics: The SN74LVTH18502APM is utilized in automotive electronic control units (ECUs) for scan test development and transmission, ensuring optimal performance and diagnostic capabilities in vehicles.
- Industrial Automation: In industrial automation systems, this integrated circuit plays a crucial role in facilitating efficient scan test procedures, enhancing the reliability and productivity of manufacturing processes.
- Telecommunication Systems: Deployed in telecommunication equipment, the SN74LVTH18502APM enables seamless scan test development and transmission, ensuring uninterrupted communication networks and superior performance.
- Consumer Electronics: From smartphones to gaming consoles, this IC enhances the scan test capabilities of consumer electronic devices, delivering unmatched reliability and performance for end-users.
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