SN74LV573ADW
- Mfr.Part #
- SN74LV573ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 20-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC OCT TRANSP D LATCH 20-SOIC
- Stock
- 5,178
- In Stock :
- 5,178
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- Manufacturer :
- Texas Instruments
- Product Category :
- Latches
- RoHS Status :
- ROHS3 Compliant
- Pbfree Code :
- yes
- Terminal Form :
- Gull wing
- Length :
- 12.8mm
- Mount :
- Surface Mount
- Pin Count :
- 20
- Number of Pins :
- 20
- Family :
- LV/LV-A/LVX/H
- Package / Case :
- 20-SOIC (0.295, 7.50mm Width)
- Independent Circuits :
- 1
- REACH SVHC :
- No SVHC
- Base Part Number :
- 74LV573
- Radiation Hardening :
- No
- Voltage - Supply :
- 2V~5.5V
- Logic Function :
- D-Type, Latch
- Control Type :
- ENABLE LOW
- Number of Functions :
- 1
- Series :
- 74LV
- Additional Feature :
- BROADSIDE VERSION OF 373
- Number of Input Lines :
- 2
- Lifecycle Status :
- ACTIVE (Last Updated: 3 days ago)
- Supply Voltage-Max (Vsup) :
- 5.5V
- Load Capacitance :
- 50pF
- Supply Voltage :
- 2.5V
- Output Type :
- Tri-State
- Circuit :
- 8:8
- Number of Ports :
- 2
- Thickness :
- 2.35mm
- Supply Voltage-Min (Vsup) :
- 2V
- ECCN Code :
- EAR99
- Mounting Type :
- Surface Mount
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Weight :
- 500.709277mg
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Count Direction :
- Unidirectional
- Current - Output High, Low :
- 16mA 16mA
- Lead Free :
- Lead Free
- Terminal Position :
- Dual
- Factory Lead Time :
- 6 Weeks
- Number of Bits :
- 8
- Output Current :
- 16mA
- Logic Type :
- D-Type Transparent Latch
- Propagation Delay :
- 23 ns
- Turn On Delay Time :
- 1 ns
- JESD-609 Code :
- e4
- Power Supplies :
- 3.3V
- Height :
- 2.65mm
- Width :
- 7.5mm
- Peak Reflow Temperature (Cel) :
- 260
- Number of Terminations :
- 20
- Output Characteristics :
- 3-STATE
- Operating Temperature :
- -40°C~85°C
- Polarity :
- Non-Inverting
- Packaging :
- Tube
- Datasheets
- SN74LV573ADW

Latches Texas Instruments SN74LV573ADW Overview
The SN74LV573ADW is an octal transparent D-type latch integrated circuit manufactured by Texas Instruments, designed to provide high-performance latch functionality for various electronic applications. With its innovative design and reliable performance, this IC offers seamless integration and efficient operation in electronic systems.
Featuring advanced technology and precise engineering, the SN74LV573ADW is ideal for applications requiring reliable data storage and transfer. Its versatile design makes it suitable for a wide range of industrial, commercial, and consumer electronics projects, providing engineers and designers with a robust solution for their latch requirements.
SN74LV573ADW Features
- Octal transparent D-type latch
- High-speed operation
- Wide supply voltage range
- Low-power consumption
- Industry-standard 20-pin SOIC package
- Transparent latch enable for easy interfacing
- Direct interface with TTL levels
- Latch-up performance exceeds 250 mA per JESD 17
SN74LV573ADW Applications
- Industrial Automation: The SN74LV573ADW is commonly used in industrial automation systems for data storage and transfer, enabling seamless control and monitoring of machinery and equipment.
- Communication Systems: This IC finds applications in communication systems such as routers, switches, and network appliances, where reliable latch functionality is essential for data transmission and reception.
- Consumer Electronics: In consumer electronics devices like set-top boxes, gaming consoles, and home appliances, the SN74LV573ADW provides efficient latch functionality for user interface control and data processing.
- Automotive Electronics: With its high-speed operation and robust design, this IC is suitable for automotive electronics applications, including automotive control systems, dashboard displays, and infotainment systems.
- Test and Measurement Equipment: The SN74LV573ADW is utilized in test and measurement equipment for signal processing and data acquisition, ensuring accurate and reliable measurement results in various testing scenarios.
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