SN74BCT8374ADWRG4
- Mfr.Part #
- SN74BCT8374ADWRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 24SOIC
- Stock
- 28,761
- In Stock :
- 28,761
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Output Current :
- 64mA
- Operating Supply Voltage :
- 5.5V
- Height Seated (Max) :
- 2.65mm
- Terminal Form :
- Gull wing
- Mounting Type :
- Surface Mount
- Power Supply Current-Max (ICC) :
- 52mA
- Frequency :
- 70MHz
- Family :
- BCT/FBT
- Max I(ol) :
- 0.064 A
- Supply Voltage :
- 4.5V~5.5V
- Pbfree Code :
- yes
- Pin Count :
- 24
- Output Polarity :
- TRUE
- Number of Bits :
- 8
- Terminal Pitch :
- 1.27mm
- Number of Ports :
- 2
- RoHS Status :
- ROHS3 Compliant
- Width :
- 7.5mm
- Prop. Delay@Nom-Sup :
- 10 ns
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Logic Function :
- D-Type
- Mount :
- Surface Mount
- Operating Temperature :
- 0°C~70°C
- Packaging :
- Tape and Reel (TR)
- Base Part Number :
- 74BCT8374
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Number of Terminations :
- 24
- Trigger Type :
- POSITIVE EDGE
- Output Characteristics :
- 3-STATE
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Power Supplies :
- 5V
- Number of Pins :
- 24
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Number of Functions :
- 1
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Series :
- 74BCT
- Length :
- 15.4mm
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Packing Method :
- Tape and Reel
- Qualification Status :
- Not Qualified
- Terminal Position :
- Dual
- Propagation Delay (tpd) :
- 9.5 ns
- Datasheets
- SN74BCT8374ADWRG4

Specialty Logic Texas Instruments SN74BCT8374ADWRG4 Overview
Introducing the SN74BCT8374ADWRG4 by Texas Instruments, a pioneering Integrated Circuit (IC) Scan Test Device designed to elevate your testing processes to new heights of efficiency and accuracy. This innovative device, meticulously crafted by industry experts, is tailored to meet the rigorous demands of modern testing environments. With its advanced features and robust design, the SN74BCT8374ADWRG4 redefines excellence in scan test technology.
SN74BCT8374ADWRG4 Features
- Highly efficient scan test device
- Precision-engineered for exceptional performance
- 24-pin Small Outline Integrated Circuit (SOIC) package
- Reliable and durable construction for long-term use
- Compatible with a wide range of testing equipment
- Facilitates comprehensive testing procedures
- Streamlined integration into existing test setups
- Enhances productivity and reduces testing time
SN74BCT8374ADWRG4 Applications
- Automated Test Equipment (ATE): The SN74BCT8374ADWRG4 excels in ATE environments, where precise testing of electronic components is paramount. Its compatibility with various ATE systems ensures seamless integration and optimal performance, making it an indispensable tool for semiconductor manufacturers and testing laboratories.
- Embedded Systems Testing: In the realm of embedded systems testing, accuracy and efficiency are non-negotiable. The SN74BCT8374ADWRG4 offers unparalleled performance, enabling engineers to conduct thorough testing of embedded systems with confidence. Whether used in research and development or production environments, this device delivers consistent and reliable results.
- Quality Assurance in Electronics Manufacturing: Quality assurance is
This product is seamlessly integrated into Automated Test Equipment (ATE) setups, where it enables comprehensive testing of electronic components such as integrated circuits (ICs) and semiconductor devices. Its precision-engineered design ensures accurate testing results, making it an indispensable asset for semiconductor manufacturers and testing facilities.
This device finds its application in embedded systems testing, where it facilitates comprehensive testing of embedded electronic systems. Its high efficiency and accuracy make it an ideal choice for engineers and technicians involved in the development and production of embedded systems across various industries.
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