SN74BCT8373ADW

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Mfr.Part #
SN74BCT8373ADW
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE LATCH 24SOIC
Stock
39,519
In Stock :
39,519

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
JESD-609 Code :
e4
Number of Terminations :
24
Mounting Type :
Surface Mount
Number of Elements :
1
Number of Bits :
8
Termination :
SMD/SMT
Max I(ol) :
0.064 A
Mount :
Surface Mount
Height :
2.65mm
REACH SVHC :
No SVHC
Output Characteristics :
3-STATE
Family :
BCT/FBT
Packaging :
Tube
Length :
15.4mm
Logic Function :
D-Type
Base Part Number :
74BCT8373
Peak Reflow Temperature (Cel) :
260
Max Supply Voltage :
5.5V
Frequency :
20MHz
Logic Type :
Scan Test Device with D-Type Latches
Weight :
624.398247mg
High Level Output Current :
-15mA
Thickness :
2.35mm
Prop. Delay@Nom-Sup :
9.5 ns
Operating Temperature :
0°C~70°C
Power Supply Current-Max (ICC) :
52mA
Series :
74BCT
Lifecycle Status :
ACTIVE (Last Updated: 3 days ago)
RoHS Status :
ROHS3 Compliant
Factory Lead Time :
6 Weeks
Count Direction :
Unidirectional
Width :
7.5mm
Number of Functions :
1
Lead Free :
Lead Free
Control Type :
ENABLE LOW/HIGH
Radiation Hardening :
No
Power Supplies :
5V
Polarity :
Non-Inverting
ECCN Code :
EAR99
Low Level Output Current :
64mA
Min Supply Voltage :
4.5V
Number of Pins :
24
Turn On Delay Time :
29 ns
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Terminal Position :
Dual
Pbfree Code :
yes
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Propagation Delay :
29 ns
Terminal Form :
Gull wing
Supply Voltage :
4.5V~5.5V
Number of Ports :
2
Translation :
n/a
Pin Count :
24
Output Current :
64mA
Datasheets
SN74BCT8373ADW
Introducing Specialty Logic Texas Instruments SN74BCT8373ADW from Chip IC,where excellence meets affordability. This product stands out with its Number of Terminations:24, Mounting Type:Surface Mount, Base Part Number:74BCT8373, Operating Temperature:0°C~70°C, Number of Pins:24, Package / Case:24-SOIC (0.295, 7.50mm Width), SN74BCT8373ADW pinout, SN74BCT8373ADW datasheet PDF, SN74BCT8373ADW amp .Beyond Specialty Logic Texas Instruments SN74BCT8373ADW ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8373ADW


Specialty Logic Texas Instruments SN74BCT8373ADW Overview

The SN74BCT8373ADW is an integrated circuit scan test device latch manufactured by Texas Instruments, designed to provide efficient testing solutions for electronic systems. This innovative IC is tailored for B2B customers seeking reliable testing components for their production processes.

Featuring advanced technology and precision engineering, this scan test device latch offers unparalleled performance and durability. It ensures accurate testing results, enhancing the overall quality and efficiency of electronic manufacturing processes.

SN74BCT8373ADW Features

  • Integrated circuit scan test device latch
  • Manufactured by Texas Instruments
  • 24SOIC package
  • Designed for efficient testing of electronic systems
  • Advanced technology for precise testing results
  • Durable construction for long-term reliability
  • Optimized for B2B customers

SN74BCT8373ADW Applications

  • Automated Test Equipment (ATE): The SN74BCT8373ADW is utilized in ATE systems for comprehensive testing of electronic components and systems. Its precise testing capabilities ensure accurate assessment of device functionality, contributing to the quality assurance process.
  • Industrial Control Systems: This IC is integrated into industrial control systems to facilitate efficient testing and diagnosis of equipment and machinery. It enhances the reliability and performance of industrial processes by enabling timely maintenance and troubleshooting.
  • Telecommunication Infrastructure: In telecommunication infrastructure, the SN74BCT8373ADW plays a crucial role in ensuring the integrity and functionality of electronic components. It enables swift and accurate testing of communication devices, optimizing network performance and reliability.
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