SN74BCT8373ADW
- Mfr.Part #
- SN74BCT8373ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE LATCH 24SOIC
- Stock
- 39,519
- In Stock :
- 39,519
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- JESD-609 Code :
- e4
- Number of Terminations :
- 24
- Mounting Type :
- Surface Mount
- Number of Elements :
- 1
- Number of Bits :
- 8
- Termination :
- SMD/SMT
- Max I(ol) :
- 0.064 A
- Mount :
- Surface Mount
- Height :
- 2.65mm
- REACH SVHC :
- No SVHC
- Output Characteristics :
- 3-STATE
- Family :
- BCT/FBT
- Packaging :
- Tube
- Length :
- 15.4mm
- Logic Function :
- D-Type
- Base Part Number :
- 74BCT8373
- Peak Reflow Temperature (Cel) :
- 260
- Max Supply Voltage :
- 5.5V
- Frequency :
- 20MHz
- Logic Type :
- Scan Test Device with D-Type Latches
- Weight :
- 624.398247mg
- High Level Output Current :
- -15mA
- Thickness :
- 2.35mm
- Prop. Delay@Nom-Sup :
- 9.5 ns
- Operating Temperature :
- 0°C~70°C
- Power Supply Current-Max (ICC) :
- 52mA
- Series :
- 74BCT
- Lifecycle Status :
- ACTIVE (Last Updated: 3 days ago)
- RoHS Status :
- ROHS3 Compliant
- Factory Lead Time :
- 6 Weeks
- Count Direction :
- Unidirectional
- Width :
- 7.5mm
- Number of Functions :
- 1
- Lead Free :
- Lead Free
- Control Type :
- ENABLE LOW/HIGH
- Radiation Hardening :
- No
- Power Supplies :
- 5V
- Polarity :
- Non-Inverting
- ECCN Code :
- EAR99
- Low Level Output Current :
- 64mA
- Min Supply Voltage :
- 4.5V
- Number of Pins :
- 24
- Turn On Delay Time :
- 29 ns
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Terminal Position :
- Dual
- Pbfree Code :
- yes
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Propagation Delay :
- 29 ns
- Terminal Form :
- Gull wing
- Supply Voltage :
- 4.5V~5.5V
- Number of Ports :
- 2
- Translation :
- n/a
- Pin Count :
- 24
- Output Current :
- 64mA
- Datasheets
- SN74BCT8373ADW

Specialty Logic Texas Instruments SN74BCT8373ADW Overview
The SN74BCT8373ADW is an integrated circuit scan test device latch manufactured by Texas Instruments, designed to provide efficient testing solutions for electronic systems. This innovative IC is tailored for B2B customers seeking reliable testing components for their production processes.
Featuring advanced technology and precision engineering, this scan test device latch offers unparalleled performance and durability. It ensures accurate testing results, enhancing the overall quality and efficiency of electronic manufacturing processes.
SN74BCT8373ADW Features
- Integrated circuit scan test device latch
- Manufactured by Texas Instruments
- 24SOIC package
- Designed for efficient testing of electronic systems
- Advanced technology for precise testing results
- Durable construction for long-term reliability
- Optimized for B2B customers
SN74BCT8373ADW Applications
- Automated Test Equipment (ATE): The SN74BCT8373ADW is utilized in ATE systems for comprehensive testing of electronic components and systems. Its precise testing capabilities ensure accurate assessment of device functionality, contributing to the quality assurance process.
- Industrial Control Systems: This IC is integrated into industrial control systems to facilitate efficient testing and diagnosis of equipment and machinery. It enhances the reliability and performance of industrial processes by enabling timely maintenance and troubleshooting.
- Telecommunication Infrastructure: In telecommunication infrastructure, the SN74BCT8373ADW plays a crucial role in ensuring the integrity and functionality of electronic components. It enables swift and accurate testing of communication devices, optimizing network performance and reliability.
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