SN74BCT8240ADW
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- Mfr.Part #
- SN74BCT8240ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stock
- 4,162
- In Stock ：
- 4,162
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Number of Elements :
- 2
- Mount :
- Surface Mount
- High Level Output Current :
- -15mA
- Low Level Output Current :
- 64mA
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Control Type :
- ENABLE LOW
- Lead Free :
- Lead Free
- Packaging :
- Tube
- Max I(ol) :
- 0.064 A
- ECCN Code :
- EAR99
- RoHS Status :
- ROHS3 Compliant
- JESD-609 Code :
- e4
- Pbfree Code :
- yes
- Terminal Position :
- Dual
- Series :
- 74BCT
- Thickness :
- 2.35mm
- Lifecycle Status :
- ACTIVE (Last Updated: 1 week ago)
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Operating Temperature :
- 0°C~70°C
- Output Characteristics :
- 3-STATE
- Radiation Hardening :
- No
- Supply Voltage :
- 4.5V~5.5V
- Max Supply Voltage :
- 5.5V
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Power Supplies :
- 5V
- Number of Outputs :
- 8
- Length :
- 15.4mm
- Number of Bits :
- 4
- Logic Function :
- Buffer, Inverting
- Mounting Type :
- Surface Mount
- Peak Reflow Temperature (Cel) :
- 260
- Translation :
- n/a
- Quiescent Current :
- 35mA
- Number of Functions :
- 2
- Number of Pins :
- 24
- Factory Lead Time :
- 6 Weeks
- Number of Ports :
- 2
- Family :
- BCT/FBT
- Count Direction :
- Unidirectional
- Polarity :
- Inverting
- Terminal Form :
- Gull wing
- Logic Type :
- Scan Test Device with Inverting Buffers
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Min Supply Voltage :
- 4.5V
- Pin Count :
- 24
- Termination :
- SMD/SMT
- Propagation Delay :
- 29 ns
- Height :
- 2.65mm
- Turn On Delay Time :
- 29 ns
- Base Part Number :
- 74BCT8240
- Width :
- 7.5mm
- Number of Terminations :
- 24
- Weight :
- 624.398247mg
- REACH SVHC :
- No SVHC
- Datasheets
- SN74BCT8240ADW
Specialty Logic Texas Instruments SN74BCT8240ADW Overview
The SN74BCT8240ADW from Texas Instruments is a high-performance Specialty Logic device designed to meet the needs of advanced digital systems. This IC scan test device with buffers integrates seamlessly into various applications requiring scan test devices with a robust buffering capability. It is housed in a 24-SOIC package, making it ideal for compact yet powerful applications in digital technology. The SN74BCT8240ADW offers superior reliability and functionality, enhancing system performance by providing effective diagnostic and troubleshooting capabilities. Its design is tailored specifically for handling complex logic operations and testing, ensuring efficient performance in critical environments.
SN74BCT8240ADW Features
The SN74BCT8240ADW by Texas Instruments boasts a range of features that make it a preferred component for high-tech applications. Key features include its ability to function as both a scan test device and a buffer, a 24-SOIC packaging that fits perfectly into smaller assemblies, and high compatibility with standard logic level interfaces. This IC is crafted to support rigorous testing protocols and is engineered to contribute significantly to the overall stability and reliability of the system it integrates with.
SN74BCT8240ADW Applications
- Computer Systems: Used in the development and testing of motherboard chipsets, improving diagnostic capabilities and system stability.
- Embedded Systems: Enhances the testing and verification process in embedded system design, leading to robust and reliable product deployments.
- Telecommunications: Integral in testing and maintaining telecommunications infrastructure, ensuring high reliability and performance under varying conditions.
- Automotive Electronics: Applied in automotive diagnostics systems to facilitate advanced testing and error checking, improving safety and performance metrics.
- Industrial Automation: Utilized in automated testing equipment for industrial electronics, aiding in fault diagnosis and system maintenance.
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