SN74BCT8240ADW
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- Mfr.Part #
- SN74BCT8240ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stock
- 4,162
- In Stock ：
- 4,162
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Mount :
- Surface Mount
- Thickness :
- 2.35mm
- Quiescent Current :
- 35mA
- Terminal Position :
- Dual
- Max Supply Voltage :
- 5.5V
- Translation :
- n/a
- Base Part Number :
- 74BCT8240
- Operating Temperature :
- 0°C~70°C
- Propagation Delay :
- 29 ns
- Weight :
- 624.398247mg
- Number of Outputs :
- 8
- Lifecycle Status :
- ACTIVE (Last Updated: 1 week ago)
- Number of Functions :
- 2
- Pbfree Code :
- yes
- Radiation Hardening :
- No
- Output Characteristics :
- 3-STATE
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Max I(ol) :
- 0.064 A
- Number of Elements :
- 2
- Height :
- 2.65mm
- REACH SVHC :
- No SVHC
- Factory Lead Time :
- 6 Weeks
- Series :
- 74BCT
- Termination :
- SMD/SMT
- Packaging :
- Tube
- ECCN Code :
- EAR99
- Logic Type :
- Scan Test Device with Inverting Buffers
- JESD-609 Code :
- e4
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Polarity :
- Inverting
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Family :
- BCT/FBT
- Lead Free :
- Lead Free
- Turn On Delay Time :
- 29 ns
- Length :
- 15.4mm
- Number of Ports :
- 2
- Count Direction :
- Unidirectional
- Width :
- 7.5mm
- Control Type :
- ENABLE LOW
- Low Level Output Current :
- 64mA
- Power Supplies :
- 5V
- Pin Count :
- 24
- Logic Function :
- Buffer, Inverting
- Peak Reflow Temperature (Cel) :
- 260
- High Level Output Current :
- -15mA
- Number of Terminations :
- 24
- Mounting Type :
- Surface Mount
- Terminal Form :
- Gull wing
- Number of Bits :
- 4
- Min Supply Voltage :
- 4.5V
- Supply Voltage :
- 4.5V~5.5V
- Number of Pins :
- 24
- RoHS Status :
- ROHS3 Compliant
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Datasheets
- SN74BCT8240ADW
Specialty Logic Texas Instruments SN74BCT8240ADW Overview
The SN74BCT8240ADW from Texas Instruments is a high-performance Specialty Logic device designed to meet the needs of advanced digital systems. This IC scan test device with buffers integrates seamlessly into various applications requiring scan test devices with a robust buffering capability. It is housed in a 24-SOIC package, making it ideal for compact yet powerful applications in digital technology. The SN74BCT8240ADW offers superior reliability and functionality, enhancing system performance by providing effective diagnostic and troubleshooting capabilities. Its design is tailored specifically for handling complex logic operations and testing, ensuring efficient performance in critical environments.
SN74BCT8240ADW Features
The SN74BCT8240ADW by Texas Instruments boasts a range of features that make it a preferred component for high-tech applications. Key features include its ability to function as both a scan test device and a buffer, a 24-SOIC packaging that fits perfectly into smaller assemblies, and high compatibility with standard logic level interfaces. This IC is crafted to support rigorous testing protocols and is engineered to contribute significantly to the overall stability and reliability of the system it integrates with.
SN74BCT8240ADW Applications
- Computer Systems: Used in the development and testing of motherboard chipsets, improving diagnostic capabilities and system stability.
- Embedded Systems: Enhances the testing and verification process in embedded system design, leading to robust and reliable product deployments.
- Telecommunications: Integral in testing and maintaining telecommunications infrastructure, ensuring high reliability and performance under varying conditions.
- Automotive Electronics: Applied in automotive diagnostics systems to facilitate advanced testing and error checking, improving safety and performance metrics.
- Industrial Automation: Utilized in automated testing equipment for industrial electronics, aiding in fault diagnosis and system maintenance.
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