SN74ABTH182504APM

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Mfr.Part #
SN74ABTH182504APM
Manufacturer
Texas Instruments
Package / Case
64-LQFP
Datasheet
Download
Description
IC SCAN TEST UNIV TXRX 64LQFP
Stock
8,679
In Stock :
8,679

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Manufacturer :
Texas Instruments
Product Category :
Universal Bus Functions
Terminal Pitch :
0.5mm
Control Type :
INDEPENDENT CONTROL
Radiation Hardening :
No
Power Supply Current-Max (ICC) :
30mA
Current - Output High, Low :
32mA 64mA
JESD-609 Code :
e4
Supply Voltage :
5V
Propagation Delay :
6.2 ns
Direction :
Bidirectional
Width :
10mm
ECCN Code :
EAR99
Logic Function :
Transceiver
Pbfree Code :
yes
Number of Ports :
2
Number of Bits :
20
Family :
ABT
Additional Feature :
SCANNABLE
Series :
74ABTH
Moisture Sensitivity Level (MSL) :
3 (168 Hours)
Lead Free :
Lead Free
Terminal Form :
Gull wing
Operating Temperature :
-40°C~85°C
Weight :
342.689036mg
Mounting Type :
Surface Mount
Factory Lead Time :
6 Weeks
Voltage - Supply :
4.5V~5.5V
Output Characteristics :
3-STATE WITH SERIES RESISTOR
Output Polarity :
TRUE
Thickness :
1.4mm
Number of Circuits :
20-Bit
RoHS Status :
ROHS3 Compliant
Packaging :
Tray
Logic Type :
Scan Test Universal Bus Transceiver
Height :
1.6mm
Number of Pins :
64
Peak Reflow Temperature (Cel) :
260
Load Capacitance :
50pF
Lifecycle Status :
ACTIVE (Last Updated: 1 day ago)
Length :
10mm
Power Supplies :
5V
Pin Count :
64
Base Part Number :
74ABTH182504
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Operating Supply Voltage :
5V
Mount :
Surface Mount
Terminal Position :
QUAD
Number of Terminations :
64
Number of Functions :
1
HTS Code :
8542.39.00.01
Translation :
n/a
Package / Case :
64-LQFP
Datasheets
SN74ABTH182504APM
Introducing Universal Bus Functions Texas Instruments SN74ABTH182504APM from Chip IC,where excellence meets affordability. This product stands out with its Operating Temperature:-40°C~85°C, Mounting Type:Surface Mount, Number of Pins:64, Base Part Number:74ABTH182504, Number of Terminations:64, Package / Case:64-LQFP, SN74ABTH182504APM pinout, SN74ABTH182504APM datasheet PDF, SN74ABTH182504APM amp .Beyond Universal Bus Functions Texas Instruments SN74ABTH182504APM ,we also offer SN74ALVC162334DGG, SCAN16512ASM, NTE74HC299, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74ABTH182504APM


Universal Bus Functions Texas Instruments SN74ABTH182504APM Overview

The Texas Instruments SN74ABTH182504APM is an advanced integrated circuit designed for universal scan test applications. With its cutting-edge technology and reliable performance, this IC offers unparalleled versatility and efficiency for testing and diagnosis in a variety of electronic systems.

Featuring a robust construction and innovative design, the SN74ABTH182504APM enables seamless integration into diverse testing environments, making it an ideal choice for manufacturers and engineers seeking high-quality solutions for their scan test needs.

SN74ABTH182504APM Features

  • High-performance universal scan test functionality
  • Advanced TXRX (Transmit/Receive) capability
  • 64-pin LQFP (Low-Profile Quad Flat Package) for easy installation
  • Reliable operation in a wide range of temperature and voltage conditions
  • Enhanced diagnostic features for efficient troubleshooting
  • Optimized design for compatibility with various electronic systems

SN74ABTH182504APM Applications

  • Automotive diagnostics: The SN74ABTH182504APM is utilized in automotive testing equipment to perform comprehensive scan tests on electronic control units (ECUs) and onboard systems, ensuring vehicle safety and performance.
  • Telecommunication infrastructure: This IC plays a crucial role in telecom test platforms, enabling efficient testing of communication modules and network components for reliability and functionality.
  • Industrial automation: Manufacturers rely on the SN74ABTH182504APM for scan testing of industrial automation equipment, facilitating quick and accurate diagnosis of faults in complex machinery and control systems.
  • Aerospace and defense systems: In aerospace and defense applications, this IC is employed for scan testing of avionics systems and mission-critical electronics, ensuring mission success and operational readiness.
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