SN74ABT8952DWR
- Mfr.Part #
- SN74ABT8952DWR
- Manufacturer
- Texas Instruments
- Package / Case
- 28-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 28SOIC
- Stock
- 22,790
- In Stock :
- 22,790
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- JESD-609 Code :
- e4
- Weight :
- 730.794007mg
- Terminal Pitch :
- 1.27mm
- Number of Terminations :
- 28
- Power Supplies :
- 5V
- Pin Count :
- 28
- Number of Bits :
- 8
- Operating Temperature :
- -40°C~85°C
- Max I(ol) :
- 0.064 A
- Additional Feature :
- WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
- Translation :
- n/a
- Qualification Status :
- Not Qualified
- Output Characteristics :
- 3-STATE
- Operating Supply Voltage :
- 5.5V
- Peak Reflow Temperature (Cel) :
- 260
- Terminal Position :
- Dual
- Supply Voltage :
- 4.5V~5.5V
- Logic Function :
- Transceiver
- Load Capacitance :
- 50pF
- Number of Functions :
- 1
- Number of Ports :
- 2
- Logic Type :
- Scan Test Device with Registered Bus Transceiver
- Package / Case :
- 28-SOIC (0.295, 7.50mm Width)
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Base Part Number :
- 74ABT8652
- Pbfree Code :
- yes
- Packaging :
- Tape and Reel (TR)
- Terminal Form :
- Gull wing
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- RoHS Status :
- ROHS3 Compliant
- Propagation Delay :
- 6.3 ns
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Series :
- 74ABT
- Lead Free :
- Lead Free
- Number of Pins :
- 28
- Direction :
- Bidirectional
- Packing Method :
- Tape and Reel
- Family :
- ABT
- Mount :
- Surface Mount
- Length :
- 17.9mm
- Height Seated (Max) :
- 2.65mm
- Mounting Type :
- Surface Mount
- Width :
- 7.5mm
- Output Polarity :
- TRUE
- Trigger Type :
- POSITIVE EDGE
- Control Type :
- INDEPENDENT CONTROL
- Datasheets
- SN74ABT8952DWR

[Specialty Logic Texas Instruments SN74ABT8952DWR] Overview
Introducing the cutting-edge IC SCAN TEST DEVICE 28SOIC from Texas Instruments, a pioneering solution designed to revolutionize the realm of integrated circuit testing. Crafted with precision and innovation, this device offers unparalleled performance and reliability, making it the top choice for professionals in the electronics industry.
Engineered with state-of-the-art technology, the SN74ABT8952DWR empowers users with comprehensive scan test capabilities, ensuring thorough and accurate assessment of integrated circuits. Its 28SOIC form factor enhances versatility and compatibility, enabling seamless integration into a wide range of applications.
Experience the future of integrated circuit testing with the SN74ABT8952DWR, where reliability meets innovation to redefine industry standards.
SN74ABT8952DWR Features
- Advanced scan test device engineered by Texas Instruments
- 28SOIC package for enhanced compatibility
- Precision testing capabilities for integrated circuits
- Highly reliable performance for professional applications
- State-of-the-art technology for accurate assessment
SN74ABT8952DWR Applications
- Automotive Electronics: The SN74ABT8952DWR facilitates efficient testing of integrated circuits in automotive electronic systems, ensuring optimal performance and safety on the road.
- Industrial Automation: With its precision testing capabilities, this device is indispensable for assessing integrated circuits in industrial automation equipment, guaranteeing reliability and efficiency in manufacturing processes.
- Telecommunications: Ensure seamless communication networks with the SN74ABT8952DWR, which offers accurate testing of integrated circuits in telecommunications infrastructure, enhancing network performance and reliability.
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