SN74ABT8952DLR

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Mfr.Part #
SN74ABT8952DLR
Manufacturer
Texas Instruments
Package / Case
28-BSSOP (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TESST DEVICE 28-SSOP
Stock
42,245
In Stock :
42,245

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Base Part Number :
74ABT8652
Packing Method :
Tape and Reel
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Mounting Type :
Surface Mount
Logic Type :
Scan Test Device with Registered Bus Transceiver
Number of Functions :
1
Number of Pins :
28
Additional Feature :
WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
Supply Voltage :
4.5V~5.5V
Qualification Status :
Not Qualified
Series :
74ABT
Length :
9.525mm
Operating Supply Voltage :
5.5V
Family :
ABT
Propagation Delay (tpd) :
5.3 ns
Trigger Type :
POSITIVE EDGE
Number of Bits :
8
Package / Case :
28-BSSOP (0.295, 7.50mm Width)
Translation :
n/a
Number of Terminations :
28
Operating Temperature :
-40°C~85°C
Pbfree Code :
yes
Terminal Form :
Gull wing
Logic Function :
Transceiver
Packaging :
Tape and Reel (TR)
Height Seated (Max) :
2.79mm
Mount :
Surface Mount
RoHS Status :
ROHS3 Compliant
Max I(ol) :
0.064 A
Terminal Position :
Dual
Load Capacitance :
50pF
Pin Count :
28
Output Characteristics :
3-STATE
Width :
7.5mm
Prop. Delay@Nom-Sup :
6.3 ns
Output Polarity :
TRUE
Control Type :
INDEPENDENT CONTROL
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Power Supplies :
5V
Count Direction :
Bidirectional
Number of Ports :
2
Terminal Pitch :
0.635mm
Datasheets
SN74ABT8952DLR
Introducing Specialty Logic Texas Instruments SN74ABT8952DLR from Chip IC,where excellence meets affordability. This product stands out with its Base Part Number:74ABT8652, Mounting Type:Surface Mount, Number of Pins:28, Package / Case:28-BSSOP (0.295, 7.50mm Width), Number of Terminations:28, Operating Temperature:-40°C~85°C, SN74ABT8952DLR pinout, SN74ABT8952DLR datasheet PDF, SN74ABT8952DLR amp .Beyond Specialty Logic Texas Instruments SN74ABT8952DLR ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74ABT8952DLR


Specialty Logic Texas Instruments SN74ABT8952DLR Overview

Introducing the SN74ABT8952DLR from Texas Instruments, a high-performance IC Scan Test Device specifically designed for advanced diagnostic and testing applications. This product, belonging to the Specialty Logic Texas Instruments SN74ABT8952DLR category, offers a robust solution for engineers needing a reliable and precise tool for their digital system testing. The device is packaged in a compact 28-SSOP format, making it ideal for applications requiring minimal footprint without compromising functionality. With its versatile design and Texas Instruments' proven technology, the SN74ABT8952DLR is perfect for integration into a wide range of electronic equipment where system verification and troubleshooting are critical.

SN74ABT8952DLR Features

The SN74ABT8952DLR is equipped with multiple features that enhance its utility and efficiency in system testing environments. Key features include its ability to support high-speed signal processing, which is critical for real-time testing scenarios. The device also offers low power consumption, reducing the overall energy requirements of the systems in which it is integrated. Additionally, the robust design ensures reliability and longevity, even under extended operational periods.

SN74ABT8952DLR Applications

  • Computing Systems: Used in server motherboards and workstations to verify system integrity and debug during post-production and maintenance phases.
  • Telecommunications: Integral in testing communication hardware such as routers, switches, and base stations to ensure reliable operation and conformance to industry standards.
  • Consumer Electronics: Applied in the development and testing of consumer electronics like smart devices and home entertainment systems, ensuring product reliability and user satisfaction.
  • Automotive Electronics: Utilized in the testing of automotive control systems to simulate and diagnose potential failures in safety-critical components.
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