SN74ABT8952DLR

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Mfr.Part #
SN74ABT8952DLR
Manufacturer
Texas Instruments
Package / Case
28-BSSOP (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TESST DEVICE 28-SSOP
Stock
42,245
In Stock :
42,245

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Operating Temperature :
-40°C~85°C
Package / Case :
28-BSSOP (0.295, 7.50mm Width)
Prop. Delay@Nom-Sup :
6.3 ns
Propagation Delay (tpd) :
5.3 ns
Number of Functions :
1
Logic Function :
Transceiver
Packing Method :
Tape and Reel
Additional Feature :
WITH INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; WITH CLOCK ENABLE
Height Seated (Max) :
2.79mm
Number of Pins :
28
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Base Part Number :
74ABT8652
Qualification Status :
Not Qualified
RoHS Status :
ROHS3 Compliant
Terminal Form :
Gull wing
Pin Count :
28
Power Supplies :
5V
Logic Type :
Scan Test Device with Registered Bus Transceiver
Trigger Type :
POSITIVE EDGE
Packaging :
Tape and Reel (TR)
Control Type :
INDEPENDENT CONTROL
Count Direction :
Bidirectional
Terminal Pitch :
0.635mm
Mounting Type :
Surface Mount
Load Capacitance :
50pF
Family :
ABT
Output Characteristics :
3-STATE
Operating Supply Voltage :
5.5V
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Pbfree Code :
yes
Series :
74ABT
Number of Terminations :
28
Number of Ports :
2
Max I(ol) :
0.064 A
Length :
9.525mm
Supply Voltage :
4.5V~5.5V
Mount :
Surface Mount
Width :
7.5mm
Terminal Position :
Dual
Translation :
n/a
Output Polarity :
TRUE
Number of Bits :
8
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Datasheets
SN74ABT8952DLR
Introducing Specialty Logic Texas Instruments SN74ABT8952DLR from Chip IC,where excellence meets affordability. This product stands out with its Operating Temperature:-40°C~85°C, Package / Case:28-BSSOP (0.295, 7.50mm Width), Number of Pins:28, Base Part Number:74ABT8652, Mounting Type:Surface Mount, Number of Terminations:28, SN74ABT8952DLR pinout, SN74ABT8952DLR datasheet PDF, SN74ABT8952DLR amp .Beyond Specialty Logic Texas Instruments SN74ABT8952DLR ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74ABT8952DLR


Specialty Logic Texas Instruments SN74ABT8952DLR Overview

Introducing the SN74ABT8952DLR from Texas Instruments, a high-performance IC Scan Test Device specifically designed for advanced diagnostic and testing applications. This product, belonging to the Specialty Logic Texas Instruments SN74ABT8952DLR category, offers a robust solution for engineers needing a reliable and precise tool for their digital system testing. The device is packaged in a compact 28-SSOP format, making it ideal for applications requiring minimal footprint without compromising functionality. With its versatile design and Texas Instruments' proven technology, the SN74ABT8952DLR is perfect for integration into a wide range of electronic equipment where system verification and troubleshooting are critical.

SN74ABT8952DLR Features

The SN74ABT8952DLR is equipped with multiple features that enhance its utility and efficiency in system testing environments. Key features include its ability to support high-speed signal processing, which is critical for real-time testing scenarios. The device also offers low power consumption, reducing the overall energy requirements of the systems in which it is integrated. Additionally, the robust design ensures reliability and longevity, even under extended operational periods.

SN74ABT8952DLR Applications

  • Computing Systems: Used in server motherboards and workstations to verify system integrity and debug during post-production and maintenance phases.
  • Telecommunications: Integral in testing communication hardware such as routers, switches, and base stations to ensure reliable operation and conformance to industry standards.
  • Consumer Electronics: Applied in the development and testing of consumer electronics like smart devices and home entertainment systems, ensuring product reliability and user satisfaction.
  • Automotive Electronics: Utilized in the testing of automotive control systems to simulate and diagnose potential failures in safety-critical components.
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