SN74ABT8652DW
- Mfr.Part #
- SN74ABT8652DW
- Manufacturer
- Texas Instruments
- Package / Case
- 28-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 28-SOIC
- Stock
- 1
- In Stock :
- 1
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Translation :
- n/a
- Output Characteristics :
- 3-STATE
- Mounting Type :
- Surface Mount
- Trigger Type :
- POSITIVE EDGE
- Thickness :
- 2.35mm
- Load Capacitance :
- 50pF
- JESD-609 Code :
- e4
- RoHS Status :
- ROHS3 Compliant
- Min Supply Voltage :
- 4.5V
- Prop. Delay@Nom-Sup :
- 6 ns
- Factory Lead Time :
- 12 Weeks
- Number of Circuits :
- 1
- Logic Function :
- AND, Transceiver
- Operating Temperature :
- -40°C~85°C
- Weight :
- 730.794007mg
- Direction :
- Bidirectional
- Max Supply Voltage :
- 5.5V
- REACH SVHC :
- No SVHC
- Mount :
- Surface Mount
- Power Supplies :
- 5V
- Additional Feature :
- INDEPENDENT OUTPUT ENABLE FOR EACH DIRECTION; MULTIPLEXED TRANSMISSION OF REGISTERED/REAL TIME DATA
- Polarity :
- Non-Inverting
- Pbfree Code :
- yes
- Propagation Delay :
- 5.3 ns
- Package / Case :
- 28-SOIC (0.295, 7.50mm Width)
- Turn On Delay Time :
- 13.5 ns
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Series :
- 74ABT
- Base Part Number :
- 74ABT8652
- Number of Bits :
- 8
- Number of Functions :
- 1
- Terminal Position :
- Dual
- Height :
- 2.65mm
- Quiescent Current :
- 30mA
- Packaging :
- Tube
- Max I(ol) :
- 0.064 A
- Length :
- 17.9mm
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Family :
- ABT
- Terminal Form :
- Gull wing
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Radiation Hardening :
- No
- Number of Ports :
- 2
- Pin Count :
- 28
- Number of Terminations :
- 28
- Width :
- 7.5mm
- Logic Type :
- Scan Test Device with Bus Transceiver and Registers
- Supply Voltage :
- 4.5V~5.5V
- Number of Pins :
- 28
- Lead Free :
- Lead Free
- Control Type :
- INDEPENDENT CONTROL
- Peak Reflow Temperature (Cel) :
- 260
- Datasheets
- SN74ABT8652DW

Specialty Logic Texas Instruments SN74ABT8652DW Overview
The SN74ABT8652DW from Texas Instruments is an advanced integrated circuit scan test device designed to meet the stringent requirements of modern electronic testing processes. This highly reliable device is housed in a 28SOIC package, ensuring ease of integration into various testing setups and systems.
Featuring cutting-edge technology and meticulous engineering, the SN74ABT8652DW excels in providing accurate and efficient scan testing capabilities, making it an indispensable tool for quality assurance and validation procedures.
SN74ABT8652DW Features
- Highly reliable scan test device
- Designed for modern electronic testing processes
- 28SOIC package for easy integration
- Accurate and efficient testing capabilities
- Advanced technology for precise results
- Manufactured by Texas Instruments, a trusted leader in the industry
SN74ABT8652DW Applications
- Automated Test Equipment (ATE): The SN74ABT8652DW is ideal for use in ATE systems for testing electronic components and assemblies. Its precise testing capabilities ensure thorough validation and quality assurance, enhancing overall manufacturing efficiency.
- Embedded Systems Testing: In embedded systems development, the SN74ABT8652DW plays a crucial role in verifying the functionality and performance of microcontrollers, ASICs, and other embedded devices. Its reliability and accuracy make it a preferred choice for testing in diverse embedded applications.
- Integrated Circuit Manufacturing: Within IC manufacturing facilities, the SN74ABT8652DW facilitates comprehensive scan testing of fabricated integrated circuits. Its advanced features and robust design enable seamless integration into the production process, ensuring the highest standards of quality control and product reliability.
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