SN74ABT8646DLR
- Mfr.Part #
- SN74ABT8646DLR
- Manufacturer
- Texas Instruments
- Package / Case
- 28-BSSOP (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 28-SSOP
- Stock
- 15,804
- In Stock :
- 15,804
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Logic Type :
- Scan Test Device with Bus Transceiver and Registers
- Number of Functions :
- 1
- Pin Count :
- 28
- Number of Terminations :
- 28
- Mount :
- Surface Mount
- Control Type :
- INDEPENDENT CONTROL
- Operating Temperature :
- -40°C~85°C
- Quiescent Current :
- 30mA
- Base Part Number :
- 74ABT8646
- Output Characteristics :
- 3-STATE
- Logic Function :
- AND, Transceiver
- Pbfree Code :
- yes
- Series :
- 74ABT
- Power Supplies :
- 5V
- Family :
- ABT
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- RoHS Status :
- ROHS3 Compliant
- Number of Pins :
- 28
- Terminal Pitch :
- 0.635mm
- Translation :
- n/a
- Number of Elements :
- 1
- Lifecycle Status :
- ACTIVE (Last Updated: 6 days ago)
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Polarity :
- Non-Inverting
- Load Capacitance :
- 50pF
- Height :
- 2.79mm
- Peak Reflow Temperature (Cel) :
- 260
- Factory Lead Time :
- 6 Weeks
- Supply Voltage :
- 4.5V~5.5V
- Packaging :
- Tape and Reel (TR)
- Additional Feature :
- WITH DIRECTION CONTROL; MULTIPLEXED TRANSMISSION OF REGISTERED/REAL TIME DATA
- Max I(ol) :
- 0.064 A
- Length :
- 9.53mm
- Trigger Type :
- POSITIVE EDGE
- Min Supply Voltage :
- 4.5V
- Propagation Delay :
- 13.5 ns
- Thickness :
- 2.59mm
- JESD-609 Code :
- e4
- Max Supply Voltage :
- 5.5V
- Terminal Form :
- Gull wing
- Number of Ports :
- 2
- Radiation Hardening :
- No
- Direction :
- Bidirectional
- Width :
- 7.49mm
- Packing Method :
- TR
- Mounting Type :
- Surface Mount
- Lead Free :
- Lead Free
- Terminal Position :
- Dual
- Number of Bits :
- 8
- Package / Case :
- 28-BSSOP (0.295, 7.50mm Width)
- Datasheets
- SN74ABT8646DLR

Specialty Logic Texas Instruments SN74ABT8646DLR Overview
Introducing the cutting-edge IC SCAN TEST DEVICE 28SSOP from Texas Instruments, designed to revolutionize diagnostic processes in integrated circuits. This innovative device, coded SN74ABT8646DLR, embodies the pinnacle of modern engineering, offering unparalleled precision and efficiency in scan testing applications.
With its robust construction and advanced functionality, the SN74ABT8646DLR empowers engineers and technicians to streamline testing procedures, enhance productivity, and ensure the reliability of intricate electronic systems. Whether utilized in research laboratories or manufacturing facilities, this high-performance scan test device delivers exceptional results, making it the preferred choice for discerning professionals.
Experience the future of diagnostic technology with the Specialty Logic Texas Instruments SN74ABT8646DLR.
SN74ABT8646DLR Features
- Advanced scan test device engineered for integrated circuits
- 28SSOP package for compact and convenient integration
- Precision testing capabilities for comprehensive diagnostics
- High-speed performance optimizes testing efficiency
- Robust design ensures durability and longevity
- Compatible with various electronic systems and applications
SN74ABT8646DLR Applications
- Automotive Electronics: Implement the SN74ABT8646DLR in automotive electronic control units (ECUs) to perform thorough scan testing, ensuring the reliability and safety of critical vehicle systems.
- Telecommunications Infrastructure: Integrate the device into telecommunications equipment to facilitate rapid and accurate diagnostic procedures, minimizing downtime and optimizing network performance.
- Industrial Automation: Utilize the SN74ABT8646DLR in industrial automation systems for efficient testing of complex electronic components, enhancing overall productivity and reliability.
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