SN74ABT8646DL

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Mfr.Part #
SN74ABT8646DL
Manufacturer
Texas Instruments
Package / Case
28-BSSOP (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN-TEST-DEV/XCVR 28-SSOP
Stock
80
In Stock :
80

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Terminal Position :
Dual
RoHS Status :
ROHS3 Compliant
Number of Ports :
2
Min Supply Voltage :
4.5V
Max Supply Voltage :
5.5V
Number of Functions :
1
Package / Case :
28-BSSOP (0.295, 7.50mm Width)
Height :
2.79mm
Max I(ol) :
0.064 A
Power Supplies :
5V
Pin Count :
28
Lead Free :
Lead Free
Lifecycle Status :
ACTIVE (Last Updated: 2 days ago)
Direction :
Bidirectional
Operating Temperature :
-40°C~85°C
Thickness :
2.59mm
Family :
ABT
JESD-609 Code :
e4
Number of Pins :
28
Width :
7.49mm
Load Capacitance :
50pF
Terminal Pitch :
0.635mm
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Number of Elements :
1
Output Characteristics :
3-STATE
Peak Reflow Temperature (Cel) :
260
Number of Circuits :
8
Propagation Delay :
13.5 ns
Control Type :
INDEPENDENT CONTROL
Factory Lead Time :
6 Weeks
Quiescent Current :
30mA
Mounting Type :
Surface Mount
ECCN Code :
EAR99
Additional Feature :
WITH DIRECTION CONTROL; MULTIPLEXED TRANSMISSION OF REGISTERED/REAL TIME DATA
Logic Function :
AND, Transceiver
Number of Bits :
8
Mount :
Surface Mount
Logic Type :
Scan Test Device with Bus Transceiver and Registers
Terminal Form :
Gull wing
Turn On Delay Time :
13.5 ns
Translation :
n/a
Base Part Number :
74ABT8646
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Number of Terminations :
28
Radiation Hardening :
No
Pbfree Code :
yes
Length :
9.53mm
Polarity :
Non-Inverting
Trigger Type :
POSITIVE EDGE
Series :
74ABT
Supply Voltage :
4.5V~5.5V
Packaging :
Tube
Datasheets
SN74ABT8646DL
Introducing Specialty Logic Texas Instruments SN74ABT8646DL from Chip IC,where excellence meets affordability. This product stands out with its Package / Case:28-BSSOP (0.295, 7.50mm Width), Operating Temperature:-40°C~85°C, Number of Pins:28, Mounting Type:Surface Mount, Base Part Number:74ABT8646, Number of Terminations:28, SN74ABT8646DL pinout, SN74ABT8646DL datasheet PDF, SN74ABT8646DL amp .Beyond Specialty Logic Texas Instruments SN74ABT8646DL ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74ABT8646DL


Specialty Logic Texas Instruments SN74ABT8646DL Overview

The Texas Instruments SN74ABT8646DL is an integral component in the realm of Specialty Logic devices, tailored for complex digital systems. This device serves as a SCANTEST device and transceiver, encapsulated in a 28-SSOP package, ensuring both functionality and reliability for high-performance applications. The SN74ABT8646DL is designed to facilitate testing and maintenance of digital systems, providing both scan test and bus transceiver capabilities in a single package. This dual-function integration makes it an indispensable tool for developers looking to streamline production and testing processes, ensuring device integrity through rigorous diagnostics.

SN74ABT8646DL Features

The SN74ABT8646DL boasts a range of features that enhance its utility and performance in testing and communication roles. Key features include high-speed data transmission capabilities, robust ESD protection, and low-power consumption. The device's compatibility with TTL levels, along with its bidirectional interface, ensures versatile integration into various digital environments, supporting both 5V and 3.3V applications seamlessly.

SN74ABT8646DL Applications

  • Embedded Systems: Utilized in the testing and debugging phase to simulate and analyze communication protocols, ensuring system reliability before final deployment.
  • Communication Equipment: Acts as a vital component for protocol conversion in communication interfaces, bridging different digital logic levels and systems effectively.
  • Computer Peripherals: Used to ensure integrity and proper function of data transfer channels in peripherals like printers and scanners, enhancing device interoperability and performance.
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