SN74ABT8245DW
- Mfr.Part #
- SN74ABT8245DW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEV/TXRX 24-SOIC
- Stock
- 520
- In Stock :
- 520
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Control Type :
- COMMON CONTROL
- Termination :
- SMD/SMT
- Mount :
- Surface Mount
- Max Supply Voltage :
- 5.5V
- Min Supply Voltage :
- 4.5V
- Polarity :
- Non-Inverting
- REACH SVHC :
- No SVHC
- Additional Feature :
- WITH DIRECTION CONTROL
- Output Characteristics :
- 3-STATE
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Weight :
- 624.398247mg
- Evaluation Kit :
- yes
- Number of Terminations :
- 24
- Width :
- 7.5mm
- Pbfree Code :
- yes
- Number of Circuits :
- 1
- Terminal Form :
- Gull wing
- Thickness :
- 2.35mm
- RoHS Status :
- ROHS3 Compliant
- Power Supplies :
- 5V
- Length :
- 15.4mm
- Supply Voltage :
- 4.5V~5.5V
- Contact Plating :
- Gold
- JESD-609 Code :
- e4
- Peak Reflow Temperature (Cel) :
- 260
- Series :
- 74ABT
- Translation :
- n/a
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Logic Function :
- Transceiver
- Operating Supply Voltage :
- 5V
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Turn On Delay Time :
- 13.5 ns
- Number of Pins :
- 24
- Quiescent Current :
- 30mA
- Low Level Output Current :
- 64mA
- High Level Output Current :
- -32mA
- ECCN Code :
- EAR99
- Max I(ol) :
- 0.064 A
- Mounting Type :
- Surface Mount
- Lead Free :
- Lead Free
- Number of Bits :
- 8
- Number of Functions :
- 1
- Factory Lead Time :
- 6 Weeks
- Base Part Number :
- 74ABT8245
- Number of Ports :
- 2
- Pin Count :
- 24
- Family :
- ABT
- Operating Temperature :
- -40°C~85°C
- Radiation Hardening :
- No
- Packaging :
- Tube
- Logic Type :
- Scan Test Device with Bus Transceivers
- Height :
- 2.65mm
- Terminal Position :
- Dual
- Propagation Delay :
- 4.3 ns
- Direction :
- Bidirectional
- Load Capacitance :
- 50pF
- Datasheets
- SN74ABT8245DW

Specialty Logic Texas Instruments SN74ABT8245DW Overview
Introducing the SN74ABT8245DW, a cutting-edge integrated circuit meticulously crafted by Texas Instruments, a renowned leader in electronic components. This high-performance IC scan test device with transceiver capabilities comes in a compact 24SOIC package, embodying the pinnacle of reliability and innovation.
Designed to meet the rigorous demands of modern electronics testing and data transmission, the SN74ABT8245DW offers unparalleled precision and efficiency. Its versatile functionality makes it an indispensable tool for a wide range of applications, ensuring seamless operations and optimized performance.
SN74ABT8245DW Features
- Advanced IC scan test device with transceiver capabilities
- Manufactured by Texas Instruments, a trusted name in electronic components
- Compact 24SOIC package for easy integration
- High-performance design for precision testing and data transmission
- Reliable and durable construction for long-term use
- Efficient operation to streamline testing processes
SN74ABT8245DW Applications
- Automated Test Equipment (ATE): The SN74ABT8245DW is essential for ATE systems, facilitating accurate testing and diagnosis of electronic components. Its transceiver capabilities enable seamless communication between test equipment and devices under test, ensuring efficient and reliable testing procedures.
- Data Communication Systems: In data communication applications, the SN74ABT8245DW serves as a vital link for transmitting data between different systems. Whether in industrial automation, telecommunications, or networking equipment, this integrated circuit delivers high-speed and reliable data transmission, ensuring smooth operations and minimal downtime.
- Embedded Systems: Embedded systems require robust components for optimal performance and longevity. The SN74ABT8245DW excels in embedded applications, providing reliable scan test and transceiver functionality for various devices such as microcontrollers, sensors, and control systems. Its compact form factor and high-performance design make it ideal for space-constrained applications without compromising on functionality or reliability.
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