SN74ABT8245DW
- Mfr.Part #
- SN74ABT8245DW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEV/TXRX 24-SOIC
- Stock
- 520
- In Stock :
- 520
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Propagation Delay :
- 4.3 ns
- Height :
- 2.65mm
- Mounting Type :
- Surface Mount
- Max I(ol) :
- 0.064 A
- Number of Functions :
- 1
- Series :
- 74ABT
- Turn On Delay Time :
- 13.5 ns
- Radiation Hardening :
- No
- Quiescent Current :
- 30mA
- Load Capacitance :
- 50pF
- ECCN Code :
- EAR99
- Lead Free :
- Lead Free
- RoHS Status :
- ROHS3 Compliant
- Additional Feature :
- WITH DIRECTION CONTROL
- JESD-609 Code :
- e4
- Terminal Position :
- Dual
- Number of Terminations :
- 24
- Weight :
- 624.398247mg
- Terminal Form :
- Gull wing
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Width :
- 7.5mm
- Operating Temperature :
- -40°C~85°C
- Polarity :
- Non-Inverting
- Family :
- ABT
- High Level Output Current :
- -32mA
- Number of Ports :
- 2
- Number of Circuits :
- 1
- Contact Plating :
- Gold
- Control Type :
- COMMON CONTROL
- Packaging :
- Tube
- Factory Lead Time :
- 6 Weeks
- REACH SVHC :
- No SVHC
- Power Supplies :
- 5V
- Termination :
- SMD/SMT
- Logic Function :
- Transceiver
- Pin Count :
- 24
- Direction :
- Bidirectional
- Low Level Output Current :
- 64mA
- Pbfree Code :
- yes
- Base Part Number :
- 74ABT8245
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Min Supply Voltage :
- 4.5V
- Operating Supply Voltage :
- 5V
- Number of Pins :
- 24
- Thickness :
- 2.35mm
- Peak Reflow Temperature (Cel) :
- 260
- Mount :
- Surface Mount
- Translation :
- n/a
- Evaluation Kit :
- yes
- Length :
- 15.4mm
- Output Characteristics :
- 3-STATE
- Number of Bits :
- 8
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Supply Voltage :
- 4.5V~5.5V
- Max Supply Voltage :
- 5.5V
- Logic Type :
- Scan Test Device with Bus Transceivers
- Datasheets
- SN74ABT8245DW

Specialty Logic Texas Instruments SN74ABT8245DW Overview
Introducing the SN74ABT8245DW, a cutting-edge integrated circuit meticulously crafted by Texas Instruments, a renowned leader in electronic components. This high-performance IC scan test device with transceiver capabilities comes in a compact 24SOIC package, embodying the pinnacle of reliability and innovation.
Designed to meet the rigorous demands of modern electronics testing and data transmission, the SN74ABT8245DW offers unparalleled precision and efficiency. Its versatile functionality makes it an indispensable tool for a wide range of applications, ensuring seamless operations and optimized performance.
SN74ABT8245DW Features
- Advanced IC scan test device with transceiver capabilities
- Manufactured by Texas Instruments, a trusted name in electronic components
- Compact 24SOIC package for easy integration
- High-performance design for precision testing and data transmission
- Reliable and durable construction for long-term use
- Efficient operation to streamline testing processes
SN74ABT8245DW Applications
- Automated Test Equipment (ATE): The SN74ABT8245DW is essential for ATE systems, facilitating accurate testing and diagnosis of electronic components. Its transceiver capabilities enable seamless communication between test equipment and devices under test, ensuring efficient and reliable testing procedures.
- Data Communication Systems: In data communication applications, the SN74ABT8245DW serves as a vital link for transmitting data between different systems. Whether in industrial automation, telecommunications, or networking equipment, this integrated circuit delivers high-speed and reliable data transmission, ensuring smooth operations and minimal downtime.
- Embedded Systems: Embedded systems require robust components for optimal performance and longevity. The SN74ABT8245DW excels in embedded applications, providing reliable scan test and transceiver functionality for various devices such as microcontrollers, sensors, and control systems. Its compact form factor and high-performance design make it ideal for space-constrained applications without compromising on functionality or reliability.
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