OPA2187IDGKT

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Mfr.Part #
OPA2187IDGKT
Manufacturer
Texas Instruments
Package / Case
8-TSSOP, 8-MSOP (0.118, 3.00mm Width)
Datasheet
Download
Description
IC OPAMP ZERO-DRIFT 2CIRC 8VSSOP
Stock
18,993
In Stock :
18,993

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Manufacturer :
Texas Instruments
Product Category :
Instrumentation, OP Amps, Buffer Amps
Current - Input Bias :
100pA
Current - Output / Channel :
30mA
Thickness :
970μm
Base Part Number :
OPA2187
Voltage - Input Offset :
1μV
Number of Terminations :
8
Factory Lead Time :
6 Weeks
Amplifier Type :
Zero-Drift
Voltage - Supply, Single/Dual (±) :
4.5V~36V ±2.25V~18V
Average Bias Current-Max (IIB) :
0.005μA
Slew Rate :
0.2V/µs
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Current - Supply :
100μA
RoHS Status :
ROHS3 Compliant
Packaging :
Tape and Reel (TR)
Width :
3mm
Surface Mount :
yes
Moisture Sensitivity Level (MSL) :
2 (1 Year)
Common Mode Rejection Ratio :
145 dB
Terminal Form :
Gull wing
Package / Case :
8-TSSOP, 8-MSOP (0.118, 3.00mm Width)
Common-mode Reject Ratio-Min :
130 dB
Number of Functions :
2
Lifecycle Status :
ACTIVE (Last Updated: 3 days ago)
Number of Pins :
8
Pbfree Code :
yes
Unity Gain BW-Nom :
550 kHz
Output Type :
Rail-to-Rail
Length :
3mm
Operating Temperature :
-40°C~125°C
Gain Bandwidth Product :
550kHz
JESD-609 Code :
e4
Terminal Position :
Dual
Mounting Type :
Surface Mount
Height :
1.07mm
Terminal Pitch :
0.65mm
Number of Circuits :
2
Datasheets
OPA2187IDGKT
Introducing Instrumentation, OP Amps, Buffer Amps Texas Instruments OPA2187IDGKT from Chip IC,where excellence meets affordability. This product stands out with its Base Part Number:OPA2187, Number of Terminations:8, Package / Case:8-TSSOP, 8-MSOP (0.118, 3.00mm Width), Number of Pins:8, Operating Temperature:-40°C~125°C, Mounting Type:Surface Mount, OPA2187IDGKT pinout, OPA2187IDGKT datasheet PDF, OPA2187IDGKT amp .Beyond Instrumentation, OP Amps, Buffer Amps Texas Instruments OPA2187IDGKT ,we also offer OP07CDR, TS321CX5 RFG, NE5532ADR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments OPA2187IDGKT


[Instrumentation, OP Amps, Buffer Amps - Texas Instruments OPA2187IDGKT] Overview

Introducing the cutting-edge OPA2187IDGKT from Texas Instruments, a leading innovator in integrated circuits. This zero-drift operational amplifier redefines precision in signal conditioning, setting new benchmarks in performance and reliability for instrumentation, OP amps, and buffer amps.

Designed to excel in demanding industrial applications, the OPA2187IDGKT boasts exceptional accuracy and stability, ensuring precise signal amplification even in the harshest environments. Its innovative architecture minimizes offset voltage and temperature drift, guaranteeing consistent operation over a wide temperature range.

Engineered with the latest advancements in semiconductor technology, this IC delivers unparalleled performance, making it the ideal choice for critical measurement and control systems. Trust in Texas Instruments' legacy of excellence and elevate your designs with the OPA2187IDGKT.

[OPA2187IDGKT] Features

  • Zero-drift operational amplifier
  • Two circulating capacitors
  • 8-VSSOP package
  • High accuracy and stability
  • Low offset voltage and temperature drift
  • Wide temperature range operation
  • Exceptional linearity and noise performance
  • Robust industrial-grade design

[OPA2187IDGKT] Applications

  • Industrial Automation: The OPA2187IDGKT ensures precise signal conditioning in automated control systems, guaranteeing accurate measurements and reliable operation in manufacturing processes and machinery control.
  • Medical Devices: From patient monitoring equipment to diagnostic instruments, this operational amplifier provides the accuracy and stability required for critical medical applications, enabling precise data acquisition and signal processing.
  • Test and Measurement: Whether in laboratory test equipment or field instrumentation, the OPA2187IDGKT delivers high-performance signal amplification, ensuring precise measurements and consistent results across diverse testing environments.
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