NB7L111MMNR2

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Mfr.Part #
NB7L111MMNR2
Manufacturer
onsemi
Package / Case
52-VFQFN Exposed Pad
Datasheet
Download
Description
IC CLK BUFFER 2:10 5.5GHZ 52QFN
Stock
42,526
In Stock :
42,526

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Manufacturer :
onsemi
Product Category :
Clock Buffers, Drivers
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Power Supplies :
2.5/3.3V
JESD-609 Code :
e0
Supply Voltage-Max (Vsup) :
2.625V
Package / Case :
52-VFQFN Exposed Pad
Ratio - Input:Output :
2:10
Operating Temperature :
-40°C~85°C
Same Edge Skew-Max (tskwd) :
0.02 ns
Family :
7L
RoHS Status :
Non-RoHS Compliant
Additional Feature :
ALSO OPERATES WITH 3.3V SUPPLY
Number of Functions :
1
Propagation Delay (tpd) :
0.28 ns
Packaging :
Tape and Reel (TR)
Supply Voltage-Min (Vsup) :
2.375V
Supply Voltage :
2.5V
Input :
CML, LVCMOS, LVDS, LVNECL, LVPECL, LVTTL
Radiation Hardening :
No
Prop. Delay@Nom-Sup :
0.28 ns
Lead Free :
Contains Lead
Output :
CML
Number of Terminations :
52
Type :
Fanout Buffer (Distribution), Multiplexer, Data
Base Part Number :
NB7L111M
Number of Circuits :
1
Length :
8mm
Mount :
Surface Mount
Voltage - Supply :
2.375V~3.465V
Terminal Pitch :
0.5mm
Number of Pins :
52
Pin Count :
52
Terminal Position :
QUAD
Width :
8mm
Published :
2007
Mounting Type :
Surface Mount
Data Rate :
6 Gbps
Frequency (Max) :
5.5GHz
Differential - Input:Output :
Yes/Yes
Terminal Finish :
Tin/Lead (Sn/Pb)
Datasheets
NB7L111MMNR2
Introducing Clock Buffers, Drivers onsemi NB7L111MMNR2 from Chip IC,where excellence meets affordability. This product stands out with its Package / Case:52-VFQFN Exposed Pad, Operating Temperature:-40°C~85°C, Output:CML, Number of Terminations:52, Type:Fanout Buffer (Distribution), Multiplexer, Data, Base Part Number:NB7L111M, Number of Pins:52, Mounting Type:Surface Mount, NB7L111MMNR2 pinout, NB7L111MMNR2 datasheet PDF, NB7L111MMNR2 amp .Beyond Clock Buffers, Drivers onsemi NB7L111MMNR2 ,we also offer PI6C49S1510AZDIEX, SY58605UMG-TR, CDCV304PW, Our vast inventory has you covered. Contact us now for immediate solutions.

onsemi NB7L111MMNR2


Clock Buffers, Drivers onsemi NB7L111MMNR2 Overview

The Clock Buffers, Drivers onsemi NB7L111MMNR2 is a high-performance IC clock buffer, engineered to meet the demanding requirements of today's advanced high-frequency electronic systems. This component is designed to distribute a single input clock to multiple outputs with minimal skew and phase jitter, ensuring reliable and consistent performance in critical applications. With its capability to handle frequencies up to 5.5 GHz, the NB7L111MMNR2 stands out as an ideal solution for enhancing system reliability and performance in complex digital environments.

NB7L111MMNR2 Features

The NB7L111MMNR2 clock buffer from onsemi offers a robust feature set that makes it particularly suited for high-speed digital applications. Key features include:

  • 2:10 fanout buffer configuration, efficiently distributing signals across multiple paths.
  • Support for up to 5.5 GHz operation, accommodating high-frequency signal requirements.
  • Compact 52-QFN package, ideal for space-constrained applications.
  • Low additive phase noise and skew, enhancing overall system timing integrity.

NB7L111MMNR2 Applications

  • Data Centers

    In data centers, the NB7L111MMNR2 is used to distribute high-frequency clock signals to various data processing and storage units, facilitating synchronized operations and improving data throughput and reliability.

  • High-Speed Computing

    For high-speed computing applications, this IC ensures precise timing and synchronization across multiple CPU and GPU units, critical for achieving optimal processing speeds and system efficiency.

  • Telecommunications

    In the telecommunications sector, the NB7L111MMNR2 plays a crucial role in managing signal integrity and timing across network infrastructure, supporting high-speed data transmission and reducing latency.

  • Test and Measurement Equipment

    This clock buffer is also integral in test and measurement setups, providing the necessary signal distribution required for accurate data collection and analysis in high-frequency test scenarios.

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