ADS4149IRGZT
- Mfr.Part #
- ADS4149IRGZT
- Manufacturer
- Texas Instruments
- Package / Case
- 48-VFQFN Exposed Pad
- Datasheet
- Download
- Description
- IC ADC 14BIT PIPELINED 48VQFN
- Stock
- 155
- In Stock :
- 155
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- Manufacturer :
- Texas Instruments
- Product Category :
- Analog to Digital Converters (ADC)
- Polarity :
- Bipolar
- Sampling Rate (Per Second) :
- 250M
- Number of Functions :
- 1
- Converter Type :
- ADC, PROPRIETARY METHOD
- Length :
- 7mm
- Number of Analog In Channels :
- 1
- Pin Count :
- 48
- Pbfree Code :
- yes
- Power Dissipation :
- 179mW
- Number of Terminations :
- 48
- Mount :
- Surface Mount
- Operating Supply Voltage :
- 1.8V
- Base Part Number :
- ADS4149
- Sample and Hold / Track and Hold :
- SAMPLE
- Max Supply Voltage :
- 1.9V
- Terminal Form :
- NO LEAD
- Reference Type :
- Internal
- JESD-609 Code :
- e4
- Integral Nonlinearity (INL) :
- 5 LSB
- RoHS Status :
- ROHS3 Compliant
- Differential Nonlinearity :
- 0.5 LSB
- Number of Pins :
- 48
- Configuration :
- S/H-ADC
- Supply Type :
- Analog, Digital
- Terminal Pitch :
- 0.5mm
- Packaging :
- Tape and Reel (TR)
- Lead Free :
- Lead Free
- Package / Case :
- 48-VFQFN Exposed Pad
- Thickness :
- 900μm
- Number of Converters :
- 1
- Architecture :
- Pipelined
- Interface :
- DDR, LVDS, Parallel
- Data Interface :
- LVDS - Parallel, Parallel
- Min Supply Voltage :
- 1.7V
- Width :
- 7mm
- Factory Lead Time :
- 6 Weeks
- Resolution :
- 1.75 B
- Sampling Rate :
- 250 Msps
- Terminal Position :
- QUAD
- Contact Plating :
- Gold
- Power Consumption :
- 265mW
- Voltage - Supply, Digital :
- 1.7V~1.9V
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Output Format :
- PARALLEL, WORD
- Ratio - S/H:ADC :
- 1:1
- Analog Input Voltage-Max :
- 2V
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Voltage - Supply, Analog :
- 1.7V~1.9V
- Linearity Error-Max (EL) :
- 0.0305%
- Input Type :
- Differential
- Height :
- 1mm
- Supply Voltage :
- 1.8V
- Mounting Type :
- Surface Mount
- REACH SVHC :
- No SVHC
- Nominal Supply Current :
- 113mA
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Number of Bits :
- 14
- Peak Reflow Temperature (Cel) :
- 260
- Output Bit Code :
- OFFSET BINARY, 2'S COMPLEMENT BINARY
- Operating Temperature :
- -40°C~85°C
- Qualification Status :
- Not Qualified
- Datasheets
- ADS4149IRGZT

Analog to Digital Converters (ADC) Texas Instruments ADS4149IRGZT Overview
The Texas Instruments ADS4149IRGZT is a cutting-edge 14-bit pipelined analog to digital converter (ADC) encapsulated in a compact 48-VQFN package. Designed to offer both high performance and reliability, this ADC ensures excellent dynamic performance with its high-speed signal conversion capability. The ADS4149IRGZT is particularly suitable for demanding applications requiring accurate data acquisition and rapid processing. Its integration into systems aims to facilitate enhanced data throughput and signal quality, making it an ideal choice for high-performance industrial, medical, and communication infrastructure.
ADS4149IRGZT Features
The ADS4149IRGZT by Texas Instruments boasts a range of features that make it stand out in the field of Analog to Digital Converters. This includes a high sampling rate of up to 250 MSPS, low power consumption, and an internal dither function that improves measurement accuracy by minimizing differential non-linearity. Additionally, the device offers a digital output noise filter and supports various output data rates, enhancing its adaptability across different operational environments.
ADS4149IRGZT Applications
- Medical Imaging Systems: In medical imaging systems, the ADS4149IRGZT provides precise data conversion which is crucial for generating high-resolution images used in diagnostics.
- Wireless Communication Infrastructure: The device can be applied to wireless base stations, where its ability to process high-speed signals helps in handling high volumes of data traffic effectively.
- Test and Measurement Equipment: Utilized in high-speed oscilloscopes and spectrum analyzers, the ADS4149IRGZT enhances the accuracy and reliability of measurements in research and development applications.
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