ADCMP582BCPZ-RL7
- Mfr.Part #
- ADCMP582BCPZ-RL7
- Manufacturer
- Analog Devices, Inc.
- Package / Case
- 16-WFQFN Exposed Pad, CSP
- Datasheet
- Download
- Description
- IC COMPARATOR PECL UFAST 16LFCSP
- Stock
- 1,286
- In Stock :
- 1,286
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- Manufacturer :
- Analog Devices, Inc.
- Product Category :
- Comparators
- Base Part Number :
- ADCMP582
- Nominal Supply Current :
- 75mA
- CMRR, PSRR (Typ) :
- 60dB CMRR, 75dB PSRR
- Number of Terminations :
- 16
- RoHS Status :
- ROHS3 Compliant
- Number of Pins :
- 16
- JESD-609 Code :
- e3
- Output Type :
- Complementary, PECL
- ECCN Code :
- EAR99
- Surface Mount :
- yes
- Neg Supply Voltage-Nom (Vsup) :
- -5V
- Time@Peak Reflow Temperature-Max (s) :
- 40
- Dual Supply Voltage :
- 5V
- Package / Case :
- 16-WFQFN Exposed Pad, CSP
- Neg Supply Voltage-Max (Vsup) :
- -6V
- Supply Voltage Limit-Max :
- 6V
- Input Offset Voltage (Vos) :
- 10mV
- Number of Elements :
- 1
- Max Power Dissipation :
- 240mW
- Mounting Type :
- Surface Mount
- Propagation Delay :
- 180 ps
- Factory Lead Time :
- 8 Weeks
- Power Supply Rejection Ratio (PSRR) :
- 75dB
- Max Input Current :
- 30µA
- Output Current :
- 44mA
- Current - Input Bias (Max) :
- 30μA @ ±5V
- Supply Voltage :
- 5V
- Input Bias Current :
- 30µA
- Pin Count :
- 16
- Common Mode Rejection Ratio :
- 60 dB
- Lead Free :
- Contains Lead
- Terminal Pitch :
- 0.5mm
- Voltage Gain :
- 48dB
- Propagation Delay (Max) :
- 0.18ns
- Current - Output (Typ) :
- 44mA @ 5V
- Voltage - Supply, Single/Dual (±) :
- ±4.5V~5.5V
- Quiescent Current :
- 8mA
- Operating Temperature :
- -40°C~125°C
- Type :
- with Latch
- Turn On Delay Time :
- 150 ps
- Height Seated (Max) :
- 0.9mm
- Power Supplies :
- +-53.3V
- Length :
- 3mm
- Peak Reflow Temperature (Cel) :
- 260
- Number of Functions :
- 1
- Pbfree Code :
- No
- Packaging :
- Tape and Reel (TR)
- Width :
- 3mm
- Lifecycle Status :
- Production (Last Updated: 3 months ago)
- Operating Supply Current :
- 75mA
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Power Dissipation :
- 240mW
- Qualification Status :
- Not Qualified
- Terminal Position :
- QUAD
- Response Time :
- 0.18 ns
- Hysteresis :
- 1mV
- Contact Plating :
- Tin
- Terminal Form :
- NO LEAD
- Voltage - Input Offset (Max) :
- 10mV @ ±5V
- Datasheets
- ADCMP582BCPZ-RL7

Comparators Analog Devices, Inc. ADCMP582BCPZ-RL7 Overview
The ADCMP582BCPZ-RL7 by Analog Devices, Inc. stands out in the field of high-performance Comparators, delivering unmatched speed and precision for critical applications. Designed with a PECL (Positive Emitter Coupled Logic) interface, this ultra-fast comparator is housed in a 16-lead LFCSP (Lead Frame Chip Scale Package), ensuring minimal footprint and excellent durability. As a leading solution in high-speed signal processing, the ADCMP582BCPZ-RL7 excels in environments requiring rapid response times and high reliability, making it an ideal choice for businesses looking to enhance their technological capabilities.
ADCMP582BCPZ-RL7 Features
The ADCMP582BCPZ-RL7 offers a variety of features tailored for advanced electronics applications. Its high-speed performance is complemented by a PECL output which ensures fast signal propagation with minimal delay, critical for timing-sensitive tasks. Additionally, the robust design encapsulated in a compact 16LFCSP package makes it suitable for space-constrained applications while providing high integration and reliability.
ADCMP582BCPZ-RL7 Applications
- Data Communication Equipment: Enhances data integrity and speed by providing rapid comparison of voltage levels, ensuring high-speed data transmission remains error-free.
- High-Speed Instrumentation: Used to monitor signals that require quick response and precise thresholds, ideal for oscilloscopes and other measurement tools.
- Aerospace and Defense Systems: Relied upon for its fast response and reliability in systems where performance and durability under extreme conditions are crucial.
- Automated Test Equipment (ATE): Improves test accuracy and speed by quickly distinguishing signal levels, thereby enhancing the throughput and reliability of test systems.
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