ADCMP581BCPZ-RL7
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- Mfr.Part #
- ADCMP581BCPZ-RL7
- Manufacturer
- Analog Devices, Inc.
- Package / Case
- 16-WFQFN Exposed Pad, CSP
- Datasheet
- Download
- Description
- IC COMPARATOR ECL UFAST 16-LFCSP
- Stock
- 2,981
- In Stock ：
- 2,981
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- Manufacturer :
- Analog Devices, Inc.
- Product Category :
- Comparators
- Peak Reflow Temperature (Cel) :
- 260
- RoHS Status :
- ROHS3 Compliant
- Mounting Type :
- Surface Mount
- JESD-609 Code :
- e3
- Input Bias Current :
- 30µA
- Nominal Supply Current :
- 34mA
- Voltage - Input Offset (Max) :
- 10mV @ ±5V
- Voltage - Supply, Single/Dual (±) :
- ±4.5V~5.5V
- Operating Temperature :
- -40°C~125°C
- Number of Pins :
- 16
- Number of Terminations :
- 16
- Pbfree Code :
- No
- Current - Output (Typ) :
- 44mA @ 5V
- Lifecycle Status :
- Production (Last Updated: 4 weeks ago)
- Surface Mount :
- yes
- Voltage Gain :
- 70dB
- Supply Voltage :
- 5V
- Propagation Delay :
- 180 ps
- Factory Lead Time :
- 8 Weeks
- Common Mode Rejection Ratio :
- 60 dB
- Operating Supply Current :
- 34mA
- Length :
- 3mm
- Power Supply Rejection Ratio (PSRR) :
- 75dB
- Output Type :
- Complementary, ECL
- Output Current :
- 44mA
- Supply Voltage Limit-Max :
- 6V
- Width :
- 3mm
- Max Input Current :
- 30µA
- Hysteresis :
- 1mV
- Pin Count :
- 16
- Number of Elements :
- 1
- Dual Supply Voltage :
- 5V
- Quiescent Current :
- 8mA
- Contact Plating :
- Tin
- Response Time :
- 0.18 ns
- Terminal Pitch :
- 0.5mm
- Current - Input Bias (Max) :
- 30μA @ ±5V
- Package / Case :
- 16-WFQFN Exposed Pad, CSP
- Terminal Form :
- NO LEAD
- Propagation Delay (Max) :
- 0.18ns
- Terminal Position :
- QUAD
- Lead Free :
- Contains Lead
- Neg Supply Voltage-Max (Vsup) :
- -6V
- Neg Supply Voltage-Nom (Vsup) :
- -5V
- CMRR, PSRR (Typ) :
- 60dB CMRR, 75dB PSRR
- Qualification Status :
- Not Qualified
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Base Part Number :
- ADCMP581
- Height Seated (Max) :
- 0.9mm
- Time@Peak Reflow Temperature-Max (s) :
- 40
- Number of Functions :
- 1
- Input Offset Voltage (Vos) :
- 10mV
- Power Supplies :
- +-53.3V
- Packaging :
- Tape and Reel (TR)
- Type :
- with Latch
- Max Power Dissipation :
- 240mW
- Power Dissipation :
- 240mW
- ECCN Code :
- EAR99
- Datasheets
- ADCMP581BCPZ-RL7
Comparators Analog Devices, Inc. ADCMP581BCPZ-RL7 Overview
Unlock the full potential of your high-speed applications with the ADCMP581BCPZ-RL7, a leading-edge comparator from Analog Devices, Inc. This device is designed for ultra-fast signal processing, ensuring minimal propagation delays and high accuracy in critical applications. Its exceptional performance is housed in a compact 16-lead LFCSP package, making it ideal for space-constrained environments. The Comparators Analog Devices, Inc. ADCMP581BCPZ-RL7 integrates seamlessly into various applications, promoting reliability and precision in systems where fast response times are paramount.
ADCMP581BCPZ-RL7 Features
The ADCMP581BCPZ-RL7 stands out with its ultra-fast ECL outputs, which provide rapid signal propagation and minimal delay. This IC comparator is capable of handling GHz signal rates with ECL compatibility, making it perfect for high-speed digital data systems. Features include a low input offset voltage and a PECL mode option, offering versatility in various operating environments. Its robust design ensures stable operation under extreme conditions, enhancing system reliability.
ADCMP581BCPZ-RL7 Applications
- High-Speed Data Transmission: Utilized in data communication equipment to ensure fast and accurate signal comparison, which is crucial for maintaining data integrity in high-speed networks.
- Telecommunications: Essential in telecom infrastructures for signal timing and processing, where rapid data flow and accurate timing are required to manage large volumes of calls and data transfer.
- Precision Measurement Systems: Applied in equipment requiring high precision and fast response times, such as oscilloscopes and spectrum analyzers, to enhance measurement accuracy and reliability.
- Automatic Test Equipment (ATE): Used to compare digital signals at high speeds, improving efficiency and effectiveness in testing semiconductor devices.
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