TLC082AIDRG4
- Mfr.Part #
- TLC082AIDRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 8-SOIC (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC OPAMP GP 2 CIRCUIT 8SOIC
- Stock
- 881
- In Stock :
- 881
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- Manufacturer :
- Texas Instruments
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Number of Pins :
- 8
- Operating Supply Voltage :
- 8V
- Number of Elements :
- 2
- Length :
- 4.9mm
- Lifecycle Status :
- ACTIVE (Last Updated: 5 days ago)
- Bias Current-Max (IIB) @25C :
- 0.00005μA
- Number of Functions :
- 2
- Operating Temperature :
- -40°C~125°C
- Bandwidth :
- 10MHz
- Supply Voltage :
- 5V
- Frequency Compensation :
- yes
- Power Dissipation :
- 710mW
- Nominal Gain Bandwidth Product :
- 10MHz
- Packaging :
- Tape and Reel (TR)
- Low-Offset :
- No
- Micropower :
- No
- Input Offset Current-Max (IIO) :
- 0.00005μA
- Programmable Power :
- No
- Lead Free :
- Lead Free
- Height :
- 1.75mm
- Base Part Number :
- TLC082
- Nominal Supply Current :
- 5.8mA
- Low-Bias :
- yes
- Amplifier Type :
- GENERAL PURPOSE
- Supply Voltage Limit-Max :
- 17V
- Operating Supply Current :
- 1.9mA
- Thickness :
- 1.58mm
- Terminal Position :
- Dual
- Number of Terminations :
- 8
- Voltage - Input Offset :
- 390μV
- Output Current per Channel :
- 57mA
- Voltage Gain :
- 120dB
- Terminal Form :
- Gull wing
- Width :
- 3.91mm
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Average Bias Current-Max (IIB) :
- 0.0007μA
- Radiation Hardening :
- No
- Surface Mount :
- yes
- Output Current :
- 57mA
- Common Mode Rejection Ratio :
- 80 dB
- Slew Rate :
- 19V/μs
- Pbfree Code :
- yes
- Max I/O Voltage :
- 1.4mV
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- JESD-609 Code :
- e4
- Mounting Type :
- Surface Mount
- Input Offset Voltage (Vos) :
- 1.4mV
- Current - Input Bias :
- 2pA
- Architecture :
- VOLTAGE-FEEDBACK
- Packing Method :
- TR
- Peak Reflow Temperature (Cel) :
- 260
- Factory Lead Time :
- 6 Weeks
- Voltage - Supply, Single/Dual (±) :
- 4.5V~16V ±2.25V~8V
- Pin Count :
- 8
- ECCN Code :
- EAR99
- Unity Gain BW-Nom :
- 10000 kHz
- RoHS Status :
- ROHS3 Compliant
- Package / Case :
- 8-SOIC (0.154, 3.90mm Width)
- Datasheets
- TLC082AIDRG4

Instrumentation OP Amps Buffer Amps Texas Instruments TLC082AIDRG4 Overview
This Texas Instruments TLC082AIDRG4 integrated circuit is a versatile operational amplifier (op-amp) designed for general-purpose applications in instrumentation, OP amps, and buffer amps circuits. With its robust design and high-performance capabilities, this IC is ideal for a wide range of industrial and commercial electronics applications.
Featuring a compact 8SOIC package, the TLC082AIDRG4 offers ease of integration into various circuit designs, making it suitable for both prototyping and mass production.
TLC082AIDRG4 Features
- General-purpose operational amplifier
- 2 circuit
- Low input offset voltage: ±150μV max
- Low noise: 18nV/√Hz typ at f = 1kHz
- Low input bias current: ±20pA typ
- High slew rate: 3.6V/μs typ
- Wide bandwidth: 4MHz typ
- Low input offset current: ±2pA typ
- Single or dual-supply operation
TLC082AIDRG4 Applications
- Medical Devices: The TLC082AIDRG4 is utilized in medical equipment such as patient monitoring systems and diagnostic devices for its precision and reliability. Its low noise and low input offset voltage ensure accurate signal amplification, making it essential in critical healthcare applications.
- Industrial Automation: In industrial automation systems, the TLC082AIDRG4 serves as a key component in sensor interfaces, control circuits, and signal conditioning modules. Its wide bandwidth and high slew rate enable fast and precise data acquisition and processing, enhancing overall system performance and efficiency.
- Test and Measurement Instruments: For test and measurement instruments like multimeters, oscilloscopes, and signal generators, the TLC082AIDRG4 provides high-quality signal amplification and conditioning. Its low input bias current and low input offset current contribute to accurate measurement results, ensuring reliable performance in various testing environments.
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