SNJ54ABT8245JT
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- Mfr.Part #
- SNJ54ABT8245JT
- Manufacturer
- Texas Instruments
- Package / Case
- CDIP
- Datasheet
- Download
- Description
- 54ABT8245 SCAN TEST DEVICES WITH
- Stock
- 33,935
- In Stock ：
- 33,935
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- Manufacturer :
- Texas Instruments
- Product Category :
- Buffers, Drivers, Receivers, Transceivers
- Number of Channels :
- 8
- Product Status :
- Active
- Mount :
- Through Hole
- Thickness :
- 4.7 mm
- Min Supply Voltage :
- 4.5 V
- Propagation Delay :
- 14.2 ns
- Number of Outputs :
- 8
- Height :
- 5.08 mm
- Min Operating Temperature :
- -55 °C
- Series :
- *
- Width :
- 6.92 mm
- Length :
- 32 mm
- Operating Supply Voltage :
- 5 V
- Polarity :
- Non-Inverting
- Logic Function :
- Transceiver
- Quiescent Current :
- 30 mA
- Lifecycle Status :
- Production (Last Updated: 1 week ago)
- Package / Case :
- CDIP
- Lead Free :
- Contains Lead
- Max Supply Voltage :
- 5.5 V
- Number of Pins :
- 24
- Number of Elements :
- 1
- Package :
- Tube
- Direction :
- Bidirectional
- Number of Bits :
- 8
- RoHS Status :
- RoHS Compliant
- Output Type :
- TTL
- Manufacturer Lifecycle Status :
- ACTIVE (Last Updated: 1 week ago)
- Max Operating Temperature :
- 125 °C
- Packaging :
- Rail/Tube
- Datasheets
- SNJ54ABT8245JT
Buffers, Drivers, Receivers, Transceivers Texas Instruments SNJ54ABT8245JT Overview
The Buffers, Drivers, Receivers, Transceivers Texas Instruments SNJ54ABT8245JT is a pinnacle example of precision engineering in scan test devices. This integrated circuit is designed to facilitate error detection and performance enhancement in complex electronic systems. With its robust capabilities, the SNJ54ABT8245JT ensures high-speed communication and reliable performance under varied conditions. Its integration of advanced scan test technology makes it an essential component for developers looking to optimize system diagnostics and improve throughput in industrial applications.
SNJ54ABT8245JT Features
The SNJ54ABT8245JT from Texas Instruments stands out with its dual-purpose functionality, serving both as a buffer and a scan test device. This product is built to support rigorous testing protocols while maintaining signal integrity and speed. Key features include high noise immunity, low power consumption, and the ability to interface with a wide range of standard and custom digital systems.
SNJ54ABT8245JT Applications
- Telecommunications Equipment: Ensures reliable data transfer and system integrity during high-speed communication and data processing.
- Computing Systems: Utilized in servers and advanced computing systems to manage data flow and signal integrity, enhancing overall system performance and reliability.
- Automotive Electronics: Integral in diagnostics and system checks within automotive control systems, improving safety and efficiency.
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