SN74LVTH182652APM
- Mfr.Part #
- SN74LVTH182652APM
- Manufacturer
- Texas Instruments
- Package / Case
- 64-LQFP
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE ABT 64-LQFP
- Stock
- 1
- In Stock :
- 1
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Power Supplies :
- 3.3V
- Number of Pins :
- 64
- Logic Type :
- ABT Scan Test Device With Transceivers and Registers
- Additional Feature :
- SCANNABLE
- Quiescent Current :
- 18.5mA
- Output Characteristics :
- 3-STATE WITH SERIES RESISTOR
- Width :
- 10mm
- RoHS Status :
- ROHS3 Compliant
- Number of Elements :
- 2
- Package / Case :
- 64-LQFP
- JESD-609 Code :
- e4
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Load Capacitance :
- 50pF
- Lifecycle Status :
- ACTIVE (Last Updated: 1 day ago)
- Weight :
- 342.689036mg
- Operating Temperature :
- -40°C~85°C
- Supply Voltage :
- 2.7V~3.6V
- Number of Ports :
- 2
- Direction :
- Bidirectional
- Family :
- LVT
- Min Supply Voltage :
- 2.7V
- Number of Functions :
- 2
- Terminal Form :
- Gull wing
- Terminal Pitch :
- 0.5mm
- Length :
- 10mm
- Base Part Number :
- 74LVTH182652
- Prop. Delay@Nom-Sup :
- 4.7 ns
- Pbfree Code :
- yes
- Terminal Position :
- QUAD
- Number of Bits :
- 18
- Mounting Type :
- Surface Mount
- Peak Reflow Temperature (Cel) :
- 260
- Number of Terminations :
- 64
- Pin Count :
- 64
- Mount :
- Surface Mount
- Polarity :
- Non-Inverting
- Factory Lead Time :
- 6 Weeks
- Trigger Type :
- POSITIVE EDGE
- Translation :
- n/a
- Packaging :
- Tray
- Logic Function :
- AND, Transceiver
- Radiation Hardening :
- No
- Lead Free :
- Lead Free
- Propagation Delay :
- 20 ns
- Max Supply Voltage :
- 3.6V
- Control Type :
- INDEPENDENT CONTROL
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Height :
- 1.6mm
- Series :
- 74LVTH
- Thickness :
- 1.4mm
- ECCN Code :
- EAR99
- Datasheets
- SN74LVTH182652APM

[Specialty Logic] Texas Instruments SN74LVTH182652APM Overview
Introducing the cutting-edge IC scan test device, the SN74LVTH182652APM from Texas Instruments. This innovative product is designed to revolutionize the testing process with its advanced features and exceptional performance. Built to meet the rigorous demands of modern electronic testing, this device offers unparalleled reliability and accuracy, making it the ideal choice for professionals seeking superior quality and efficiency.
Featuring a compact and durable design, the SN74LVTH182652APM delivers reliable results in even the most challenging environments. With its high-speed scanning capabilities and comprehensive test coverage, this device ensures fast and accurate testing, minimizing downtime and maximizing productivity. Whether you're conducting routine maintenance or diagnosing complex issues, this versatile device offers the precision and flexibility you need to get the job done right.
Take your testing capabilities to the next level with the SN74LVTH182652APM from Texas Instruments. Discover the difference today and experience unmatched performance and reliability like never before.
SN74LVTH182652APM Features
- Advanced IC scan test device designed for superior testing performance
- High-speed scanning capabilities for fast and efficient testing
- Comprehensive test coverage for accurate diagnostics
- Compact and durable design for reliable operation in any environment
- Easy to use interface for intuitive operation
- Exceptional reliability and accuracy for consistent results
SN74LVTH182652APM Applications
- Automotive Electronics: The SN74LVTH182652APM is used for testing and diagnosing electronic components in automotive systems, ensuring optimal performance and reliability on the road.
- Telecommunications Equipment: This device is utilized in telecommunications equipment to conduct thorough testing and maintenance, guaranteeing seamless communication networks and uninterrupted service.
- Industrial Control Systems: The SN74LVTH182652APM plays a crucial role in industrial control systems by enabling precise testing and monitoring of critical components, enhancing efficiency and productivity in manufacturing processes.
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