SN74LVTH182502APMR
- Mfr.Part #
- SN74LVTH182502APMR
- Manufacturer
- Texas Instruments
- Package / Case
- 64-LQFP
- Datasheet
- Download
- Description
- IC SCAN-TEST-DEV/TRANSCVR 64LQFP
- Stock
- 32
- In Stock :
- 32
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Number of Functions :
- 2
- Pin Count :
- 64
- Translation :
- n/a
- Mounting Type :
- Surface Mount
- Quiescent Current :
- 18mA
- Number of Elements :
- 2
- Mount :
- Surface Mount
- Pbfree Code :
- yes
- Qualification Status :
- Not Qualified
- Height :
- 1.6mm
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Series :
- 74LVTH
- Packing Method :
- TR
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Trigger Type :
- POSITIVE EDGE
- Lifecycle Status :
- ACTIVE (Last Updated: 3 days ago)
- JESD-609 Code :
- e4
- Logic Function :
- Transceiver
- Factory Lead Time :
- 6 Weeks
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Min Supply Voltage :
- 2.7V
- Package / Case :
- 64-LQFP
- Turn On Delay Time :
- 20 ns
- Weight :
- 342.689036mg
- Family :
- LVT
- Output Characteristics :
- 3-STATE WITH SERIES RESISTOR
- Number of Terminations :
- 64
- Prop. Delay@Nom-Sup :
- 5.7 ns
- Direction :
- Bidirectional
- Width :
- 10mm
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Operating Temperature :
- -40°C~85°C
- Load Capacitance :
- 50pF
- Number of Pins :
- 64
- Max Supply Voltage :
- 3.6V
- Terminal Pitch :
- 0.5mm
- Thickness :
- 1.4mm
- Control Type :
- INDEPENDENT CONTROL
- Length :
- 10mm
- Propagation Delay :
- 20 ns
- Supply Voltage :
- 2.7V~3.6V
- Logic Type :
- ABT Scan Test Device With Universal Bus Transceivers
- ECCN Code :
- EAR99
- RoHS Status :
- ROHS3 Compliant
- Number of Ports :
- 2
- Peak Reflow Temperature (Cel) :
- 260
- Number of Bits :
- 18
- Packaging :
- Tape and Reel (TR)
- Terminal Position :
- QUAD
- Lead Free :
- Lead Free
- Polarity :
- Non-Inverting
- Operating Supply Voltage :
- 3.3V
- Terminal Form :
- Gull wing
- Base Part Number :
- 74LVTH182502
- Datasheets
- SN74LVTH182502APMR

Specialty Logic Texas Instruments SN74LVTH182502APMR Overview
The SN74LVTH182502APMR by Texas Instruments is an advanced integrated circuit designed for scan test development and bidirectional data transmission applications. With its high-performance features and reliable construction, this IC offers exceptional functionality and versatility for various industrial and commercial settings.
SN74LVTH182502APMR Features
- Scan Test Development: Facilitates efficient testing procedures for electronic devices, ensuring optimal performance and reliability.
- Transceiver Functionality: Enables seamless bidirectional data transmission between devices, enhancing communication efficiency.
- High-Quality Construction: Manufactured with precision engineering and quality materials, ensuring durability and long-term performance.
- 64-LQFP Package: Compact and space-saving design, ideal for applications with limited board space.
- Low Voltage Operation: Compatible with low-voltage systems, offering flexibility and energy efficiency.
SN74LVTH182502APMR Applications
- Industrial Automation Systems: The SN74LVTH182502APMR is utilized in industrial automation systems for scan test development, ensuring accurate testing and diagnosis of electronic components and systems.
- Data Communication Networks: In data communication networks, this IC serves as a reliable transceiver, facilitating smooth data transmission between devices, such as routers, switches, and servers.
- Automotive Electronics: Automotive electronic control units (ECUs) benefit from the SN74LVTH182502APMR's scan test development capabilities, ensuring the reliability and safety of vehicle electronic systems.
- Medical Equipment: Medical devices and equipment rely on the SN74LVTH182502APMR for efficient scan test development, ensuring compliance with regulatory standards and reliable operation in critical healthcare environments.
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