SN74HCT257DG4
- Mfr.Part #
- SN74HCT257DG4
- Manufacturer
- Texas Instruments
- Package / Case
- SOIC
- Datasheet
- Download
- Description
- IC DATA SELECTOR/MUX SGL 16SOIC
- Stock
- 10,458
- In Stock :
- 10,458
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- Manufacturer :
- Texas Instruments
- Product Category :
- Signal Switches, Multiplexers, Decoders
- Number of Inputs :
- 8
- Number of Output Lines :
- 1
- Mounting Type :
- Surface Mount
- Low Level Output Current :
- 6mA
- Radiation Hardening :
- No
- Package / Case :
- SOIC
- RoHS Status :
- RoHS Compliant
- Operating Supply Voltage :
- 5V
- Power Supplies :
- 5V
- Max I(ol) :
- 0.006 A
- Number of Terminations :
- 16
- Series :
- 74HCT
- Base Part Number :
- 74HCT257
- Min Supply Voltage :
- 4.5V
- Circuit :
- 4 x 2:1
- Terminal Position :
- Dual
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Pin Count :
- 16
- Packaging :
- Tube
- JESD-609 Code :
- e4
- Number of Input Lines :
- 2
- Propagation Delay :
- 35 ns
- Type :
- Multiplexer
- Lead Free :
- Lead Free
- Number of Pins :
- 16
- Independent Circuits :
- 1
- Max Supply Voltage :
- 5.5V
- Output Characteristics :
- 3-STATE
- Output Polarity :
- TRUE
- Peak Reflow Temperature (Cel) :
- 260
- Temperature Grade :
- Industrial
- Height :
- 1.58mm
- Length :
- 9.9mm
- Number of Channels :
- 4
- Logic Function :
- Multiplexer
- Max Operating Temperature :
- 85°C
- Supplier Device Package :
- 16-SOIC
- Operating Temperature :
- -40°C ~ 85°C
- Mount :
- Surface Mount
- Number of Functions :
- 4
- Family :
- HCT
- Bandwidth :
- 28MHz
- Packing Method :
- Tube
- Voltage - Supply :
- 4.5 V ~ 5.5 V
- Min Operating Temperature :
- -40°C
- Terminal Form :
- Gull wing
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Current - Output High, Low :
- 6mA, 6mA
- Width :
- 3.91mm
- Voltage Supply Source :
- Single Supply
- High Level Output Current :
- 6mA
- Supply Voltage :
- 5V
- Load Capacitance :
- 50pF
- Weight :
- 141.690917mg
- Supply Type :
- Single
- Datasheets
- SN74HCT257DG4

[Signal Switches, Multiplexers, Decoders - Texas Instruments SN74HCT257DG4] Overview
Introducing the cutting-edge SN74HCT257DG4 from Texas Instruments, a pinnacle of innovation in the realm of signal switches, multiplexers, and decoders. Designed to deliver unparalleled performance and reliability, this integrated circuit (IC) excels in data selection and multiplexing tasks, elevating your electronic projects to new heights of efficiency and functionality.
With its state-of-the-art technology and meticulous craftsmanship, the SN74HCT257DG4 empowers engineers and designers to optimize their systems with ease, offering seamless integration and exceptional versatility. Whether you're tackling complex automation projects or refining communication networks, this powerhouse component is your ultimate solution for precision control and data management.
SN74HCT257DG4 Features
- High-speed operation for rapid data processing
- Quad 2-line to 1-line data selector/multiplexer functionality
- Low power consumption for energy-efficient performance
- Wide operating voltage range for enhanced compatibility
- Robust construction for reliable operation in demanding environments
- Compact 16-pin SOIC package for space-saving integration
- Comprehensive datasheet and application notes for easy implementation
SN74HCT257DG4 Applications
- Data Multiplexing in Communication Systems: Utilize the SN74HCT257DG4 to seamlessly multiplex data streams in communication systems, enhancing bandwidth utilization and ensuring smooth transmission of information in telecommunications networks and data centers.
- Address Decoding in Microcontroller Systems: Employ the SN74HCT257DG4 for efficient address decoding in microcontroller-based systems, enabling precise control and management of memory and peripheral devices in industrial automation and embedded applications.
- Signal Routing in Test and Measurement Equipment: Integrate the SN74HCT257DG4 into test and measurement equipment to facilitate signal routing and selection, enabling accurate measurement and analysis in research laboratories, manufacturing facilities, and electronic testing environments.
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