SN74BCT8374ANT
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- Mfr.Part #
- SN74BCT8374ANT
- Manufacturer
- Texas Instruments
- Package / Case
- 24-DIP (0.300, 7.62mm)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE W/FF 24-DIP
- Stock
- 4,109
- In Stock ：
- 4,109
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Mount :
- Through Hole
- Propagation Delay :
- 8.5 ns
- Terminal Pitch :
- 2.54mm
- Turn On Delay Time :
- 11 ns
- Pin Count :
- 24
- Base Part Number :
- 74BCT8374
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Low Level Output Current :
- 64mA
- Frequency :
- 70MHz
- Output Current :
- 64mA
- Polarity :
- Non-Inverting
- Number of Functions :
- 1
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Number of Terminations :
- 24
- Number of Bits :
- 8
- Weight :
- 1.753503g
- Number of Circuits :
- 1
- RoHS Status :
- ROHS3 Compliant
- Clock Edge Trigger Type :
- POSITIVE EDGE
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Min Supply Voltage :
- 4.5V
- Operating Temperature :
- 0°C~70°C
- Qualification Status :
- Not Qualified
- Number of Pins :
- 24
- Number of Ports :
- 2
- Logic Function :
- D-Type
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Mounting Type :
- Through Hole
- High Level Output Current :
- -15mA
- Lead Free :
- Lead Free
- Max I(ol) :
- 0.064 A
- Power Supply Current-Max (ICC) :
- 52mA
- Supply Voltage :
- 4.5V~5.5V
- Family :
- BCT/FBT
- Package / Case :
- 24-DIP (0.300, 7.62mm)
- Number of Output Lines :
- 8
- Packaging :
- Tube
- Power Supplies :
- 5V
- Terminal Position :
- Dual
- Width :
- 7.62mm
- Output Characteristics :
- 3-STATE
- Max Supply Voltage :
- 5.5V
- Series :
- 74BCT
- Datasheets
- SN74BCT8374ANT
[Specialty Logic Texas Instruments SN74BCT8374ANT] Overview
Introducing the cutting-edge IC SCAN TEST DEVICE W/FF 24DIP from Texas Instruments, a revolutionary solution designed to streamline testing processes with unparalleled efficiency and precision. Engineered with state-of-the-art technology, this integrated circuit device redefines the standards of quality assurance in electronic manufacturing.
With a relentless focus on performance and reliability, Texas Instruments presents a game-changing tool that empowers businesses to optimize their testing procedures, ensuring seamless operations and maximum productivity.
[SN74BCT8374ANT] Features
- Integrated circuit scan test device
- Equipped with flip-flops for enhanced functionality
- 24-pin dual in-line package (DIP) for easy integration
- Precision-engineered by Texas Instruments for utmost reliability
- Designed to streamline testing processes and improve efficiency
- Highly durable construction for long-term usage
- Compatible with a wide range of electronic systems
[SN74BCT8374ANT] Applications
- Automated Test Equipment (ATE): The SN74BCT8374ANT facilitates seamless integration into ATE systems, enabling rapid and accurate testing of electronic components in manufacturing environments. Its advanced features enhance the efficiency of test procedures, ensuring reliable results and minimizing downtime.
- Industrial Control Systems: With its robust design and versatile functionality, this device is ideally suited for integration into industrial control systems. From monitoring and regulating processes to ensuring equipment reliability, the SN74BCT8374ANT plays a crucial role in optimizing industrial operations.
- Communication Networks: In the realm of communication networks, reliability is paramount. The SN74BCT8374ANT offers unparalleled performance and precision, making it an essential component for ensuring the seamless operation of communication infrastructure. From routers to switches, this device enhances the reliability and efficiency of network equipment.
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