SN74BCT8374ADWRG4

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Mfr.Part #
SN74BCT8374ADWRG4
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE 24SOIC
Stock
28,761
In Stock :
28,761

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Propagation Delay (tpd) :
9.5 ns
Terminal Form :
Gull wing
Operating Temperature :
0°C~70°C
RoHS Status :
ROHS3 Compliant
Series :
74BCT
Trigger Type :
POSITIVE EDGE
Operating Supply Voltage :
5.5V
Logic Function :
D-Type
Frequency :
70MHz
Max I(ol) :
0.064 A
Power Supplies :
5V
Additional Feature :
SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Pin Count :
24
Packing Method :
Tape and Reel
Height Seated (Max) :
2.65mm
Base Part Number :
74BCT8374
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Terminal Position :
Dual
Mounting Type :
Surface Mount
Number of Pins :
24
Qualification Status :
Not Qualified
Packaging :
Tape and Reel (TR)
Number of Functions :
1
Number of Ports :
2
Family :
BCT/FBT
Number of Bits :
8
Prop. Delay@Nom-Sup :
10 ns
Pbfree Code :
yes
Power Supply Current-Max (ICC) :
52mA
Length :
15.4mm
Output Characteristics :
3-STATE
Logic Type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Output Polarity :
TRUE
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Terminal Pitch :
1.27mm
Width :
7.5mm
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Output Current :
64mA
Mount :
Surface Mount
Number of Terminations :
24
Supply Voltage :
4.5V~5.5V
Datasheets
SN74BCT8374ADWRG4
Introducing Specialty Logic Texas Instruments SN74BCT8374ADWRG4 from Chip IC,where excellence meets affordability. This product stands out with its Operating Temperature:0°C~70°C, Package / Case:24-SOIC (0.295, 7.50mm Width), Base Part Number:74BCT8374, Mounting Type:Surface Mount, Number of Pins:24, Number of Terminations:24, SN74BCT8374ADWRG4 pinout, SN74BCT8374ADWRG4 datasheet PDF, SN74BCT8374ADWRG4 amp .Beyond Specialty Logic Texas Instruments SN74BCT8374ADWRG4 ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8374ADWRG4


Specialty Logic Texas Instruments SN74BCT8374ADWRG4 Overview

Introducing the SN74BCT8374ADWRG4 by Texas Instruments, a pioneering Integrated Circuit (IC) Scan Test Device designed to elevate your testing processes to new heights of efficiency and accuracy. This innovative device, meticulously crafted by industry experts, is tailored to meet the rigorous demands of modern testing environments. With its advanced features and robust design, the SN74BCT8374ADWRG4 redefines excellence in scan test technology.

SN74BCT8374ADWRG4 Features

  • Highly efficient scan test device
  • Precision-engineered for exceptional performance
  • 24-pin Small Outline Integrated Circuit (SOIC) package
  • Reliable and durable construction for long-term use
  • Compatible with a wide range of testing equipment
  • Facilitates comprehensive testing procedures
  • Streamlined integration into existing test setups
  • Enhances productivity and reduces testing time

SN74BCT8374ADWRG4 Applications

  • Automated Test Equipment (ATE): The SN74BCT8374ADWRG4 excels in ATE environments, where precise testing of electronic components is paramount. Its compatibility with various ATE systems ensures seamless integration and optimal performance, making it an indispensable tool for semiconductor manufacturers and testing laboratories.
  • This product is seamlessly integrated into Automated Test Equipment (ATE) setups, where it enables comprehensive testing of electronic components such as integrated circuits (ICs) and semiconductor devices. Its precision-engineered design ensures accurate testing results, making it an indispensable asset for semiconductor manufacturers and testing facilities.

  • Embedded Systems Testing: In the realm of embedded systems testing, accuracy and efficiency are non-negotiable. The SN74BCT8374ADWRG4 offers unparalleled performance, enabling engineers to conduct thorough testing of embedded systems with confidence. Whether used in research and development or production environments, this device delivers consistent and reliable results.
  • This device finds its application in embedded systems testing, where it facilitates comprehensive testing of embedded electronic systems. Its high efficiency and accuracy make it an ideal choice for engineers and technicians involved in the development and production of embedded systems across various industries.

  • Quality Assurance in Electronics Manufacturing: Quality assurance is
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