SN74BCT8374ADWR
- Mfr.Part #
- SN74BCT8374ADWR
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Stock
- 33,820
- In Stock :
- 33,820
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Prop. Delay@Nom-Sup :
- 10 ns
- Number of Pins :
- 24
- Family :
- BCT/FBT
- Propagation Delay (tpd) :
- 9.5 ns
- Terminal Position :
- Dual
- Pin Count :
- 24
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Operating Temperature :
- 0°C~70°C
- Power Supply Current-Max (ICC) :
- 52mA
- Mounting Type :
- Surface Mount
- Terminal Pitch :
- 1.27mm
- Terminal Form :
- Gull wing
- Output Current :
- 64mA
- Packing Method :
- Tape and Reel
- Number of Functions :
- 1
- Number of Bits :
- 8
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Mount :
- Surface Mount
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Supply Voltage :
- 4.5V~5.5V
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Output Polarity :
- TRUE
- Logic Function :
- D-Type
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Length :
- 15.4mm
- Output Characteristics :
- 3-STATE
- Number of Terminations :
- 24
- Width :
- 7.5mm
- Frequency :
- 70MHz
- Max I(ol) :
- 0.064 A
- Height Seated (Max) :
- 2.65mm
- Operating Supply Voltage :
- 5.5V
- Power Supplies :
- 5V
- Pbfree Code :
- yes
- Qualification Status :
- Not Qualified
- Number of Ports :
- 2
- Base Part Number :
- 74BCT8374
- Series :
- 74BCT
- Packaging :
- Tape and Reel (TR)
- RoHS Status :
- ROHS3 Compliant
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Trigger Type :
- POSITIVE EDGE
- Datasheets
- SN74BCT8374ADWR

[Specialty Logic Texas Instruments SN74BCT8374ADWR] Overview
Introducing the cutting-edge IC SCAN TEST DEVICE W/FF 24SOIC, meticulously crafted by Texas Instruments, a name synonymous with excellence in integrated circuits. Designed for optimal performance and reliability, this innovative device stands as a testament to precision engineering and advanced technology.
With its sleek 24SOIC package and robust features, this scan test device with flip-flops caters to the diverse needs of modern industrial applications. Whether you're in the realm of telecommunications, automotive, or aerospace, this versatile solution is tailored to elevate your testing processes to unprecedented levels of efficiency and accuracy.
Unlock unparalleled capabilities and streamline your testing procedures with the [Specialty Logic Texas Instruments SN74BCT8374ADWR], your ultimate partner in achieving unparalleled results.
SN74BCT8374ADWR Features
- Integrated Circuit Scan Test Device
- Highly Efficient Flip-Flops
- 24SOIC Package for Compact Integration
- Enhanced Testing Accuracy
- Robust Construction for Long-Term Reliability
- Designed by Industry-Leading Experts at Texas Instruments
SN74BCT8374ADWR Applications
- Telecommunications: Implement the SN74BCT8374ADWR in telecommunications equipment for comprehensive testing of signal integrity and performance.
- Automotive Electronics: Enhance automotive diagnostic systems by integrating this device for efficient testing of electronic components and subsystems.
- Aerospace Systems: Ensure the reliability of critical aerospace systems by employing this IC scan test device for rigorous testing in harsh environmental conditions.
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