SN74BCT8374ADWR

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Mfr.Part #
SN74BCT8374ADWR
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE W/FF 24-SOIC
Stock
33,820
In Stock :
33,820

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Prop. Delay@Nom-Sup :
10 ns
Number of Pins :
24
Family :
BCT/FBT
Propagation Delay (tpd) :
9.5 ns
Terminal Position :
Dual
Pin Count :
24
Additional Feature :
SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Operating Temperature :
0°C~70°C
Power Supply Current-Max (ICC) :
52mA
Mounting Type :
Surface Mount
Terminal Pitch :
1.27mm
Terminal Form :
Gull wing
Output Current :
64mA
Packing Method :
Tape and Reel
Number of Functions :
1
Number of Bits :
8
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Mount :
Surface Mount
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Supply Voltage :
4.5V~5.5V
Logic Type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Output Polarity :
TRUE
Logic Function :
D-Type
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Length :
15.4mm
Output Characteristics :
3-STATE
Number of Terminations :
24
Width :
7.5mm
Frequency :
70MHz
Max I(ol) :
0.064 A
Height Seated (Max) :
2.65mm
Operating Supply Voltage :
5.5V
Power Supplies :
5V
Pbfree Code :
yes
Qualification Status :
Not Qualified
Number of Ports :
2
Base Part Number :
74BCT8374
Series :
74BCT
Packaging :
Tape and Reel (TR)
RoHS Status :
ROHS3 Compliant
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Trigger Type :
POSITIVE EDGE
Datasheets
SN74BCT8374ADWR
Introducing Specialty Logic Texas Instruments SN74BCT8374ADWR from Chip IC,where excellence meets affordability. This product stands out with its Number of Pins:24, Operating Temperature:0°C~70°C, Mounting Type:Surface Mount, Number of Terminations:24, Base Part Number:74BCT8374, Package / Case:24-SOIC (0.295, 7.50mm Width), SN74BCT8374ADWR pinout, SN74BCT8374ADWR datasheet PDF, SN74BCT8374ADWR amp .Beyond Specialty Logic Texas Instruments SN74BCT8374ADWR ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8374ADWR


[Specialty Logic Texas Instruments SN74BCT8374ADWR] Overview

Introducing the cutting-edge IC SCAN TEST DEVICE W/FF 24SOIC, meticulously crafted by Texas Instruments, a name synonymous with excellence in integrated circuits. Designed for optimal performance and reliability, this innovative device stands as a testament to precision engineering and advanced technology.

With its sleek 24SOIC package and robust features, this scan test device with flip-flops caters to the diverse needs of modern industrial applications. Whether you're in the realm of telecommunications, automotive, or aerospace, this versatile solution is tailored to elevate your testing processes to unprecedented levels of efficiency and accuracy.

Unlock unparalleled capabilities and streamline your testing procedures with the [Specialty Logic Texas Instruments SN74BCT8374ADWR], your ultimate partner in achieving unparalleled results.

SN74BCT8374ADWR Features

  • Integrated Circuit Scan Test Device
  • Highly Efficient Flip-Flops
  • 24SOIC Package for Compact Integration
  • Enhanced Testing Accuracy
  • Robust Construction for Long-Term Reliability
  • Designed by Industry-Leading Experts at Texas Instruments

SN74BCT8374ADWR Applications

  • Telecommunications: Implement the SN74BCT8374ADWR in telecommunications equipment for comprehensive testing of signal integrity and performance.
  • Automotive Electronics: Enhance automotive diagnostic systems by integrating this device for efficient testing of electronic components and subsystems.
  • Aerospace Systems: Ensure the reliability of critical aerospace systems by employing this IC scan test device for rigorous testing in harsh environmental conditions.
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