SN74BCT8374ADW
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- Mfr.Part #
- SN74BCT8374ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE W/FF 24-SOIC
- Stock
- 20
- In Stock ：
- 20
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Power Supplies :
- 5V
- Logic Function :
- D-Type
- Base Part Number :
- 74BCT8374
- Max I(ol) :
- 0.064 A
- Polarity :
- Non-Inverting
- Translation :
- n/a
- Mounting Type :
- Surface Mount
- Frequency :
- 70MHz
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Propagation Delay :
- 11 ns
- JESD-609 Code :
- e4
- Width :
- 7.5mm
- Terminal Position :
- Dual
- Pbfree Code :
- yes
- Count Direction :
- Unidirectional
- Number of Terminations :
- 24
- Output Current :
- 64mA
- Output Characteristics :
- 3-STATE
- High Level Output Current :
- -15mA
- Termination :
- SMD/SMT
- Power Supply Current-Max (ICC) :
- 52mA
- Operating Temperature :
- 0°C~70°C
- Lifecycle Status :
- ACTIVE (Last Updated: 4 days ago)
- Family :
- BCT/FBT
- Min Supply Voltage :
- 4.5V
- Radiation Hardening :
- No
- Logic Type :
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Lead Free :
- Lead Free
- Packaging :
- Tube
- Number of Pins :
- 24
- Peak Reflow Temperature (Cel) :
- 260
- Thickness :
- 2.35mm
- Terminal Form :
- Gull wing
- Low Level Output Current :
- 64mA
- Pin Count :
- 24
- RoHS Status :
- ROHS3 Compliant
- Mount :
- Surface Mount
- Number of Functions :
- 1
- Clock Edge Trigger Type :
- POSITIVE EDGE
- Number of Ports :
- 2
- Factory Lead Time :
- 6 Weeks
- Control Type :
- INDEPENDENT CONTROL
- Max Supply Voltage :
- 5.5V
- Number of Elements :
- 1
- Number of Bits :
- 8
- Turn On Delay Time :
- 11 ns
- Length :
- 15.4mm
- Weight :
- 624.398247mg
- Height :
- 2.65mm
- Supply Voltage :
- 4.5V~5.5V
- Series :
- 74BCT
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- REACH SVHC :
- No SVHC
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Datasheets
- SN74BCT8374ADW
Specialty Logic Texas Instruments SN74BCT8374ADW Overview
Introducing the cutting-edge IC Scan Test Device with Flip-Flop 24SOIC from Texas Instruments. Designed to meet the rigorous demands of modern integrated circuit testing, the SN74BCT8374ADW is a sophisticated solution that streamlines the testing process, ensuring optimal performance and reliability.
Featuring advanced technology and precision engineering, this device empowers manufacturers to conduct comprehensive scan tests with ease and efficiency. Its 24SOIC package offers versatility and compatibility, making it ideal for a wide range of applications across various industries.
Whether you're in semiconductor manufacturing, telecommunications, or automotive electronics, trust the SN74BCT8374ADW to deliver exceptional results, revolutionizing your testing procedures and driving productivity to new heights.
SN74BCT8374ADW Features
- Integrated Scan Test Device
- Flip-Flop Technology
- 24SOIC Package
- High Precision and Reliability
- Compatible with Various Testing Environments
- Streamlined Testing Process
- Enhanced Performance
- Designed for Industrial Applications
- Manufactured by Texas Instruments
SN74BCT8374ADW Applications
- Semiconductor Manufacturing: The SN74BCT8374ADW plays a crucial role in the testing phase of semiconductor production, ensuring the quality and functionality of integrated circuits. Its advanced scan test capabilities streamline the testing process, allowing manufacturers to identify and address potential issues efficiently.
- Telecommunications: In the telecommunications industry, reliability is paramount. The SN74BCT8374ADW enables telecom equipment manufacturers to conduct thorough testing of their products, guaranteeing optimal performance and minimizing the risk of malfunctions. From network switches to communication modules, this device ensures the integrity of critical telecom infrastructure.
- Automotive Electronics: Automotive electronics demand high levels of reliability and durability. With the SN74BCT8374ADW, automotive manufacturers can ensure the quality of their electronic components, such as engine control units and safety systems. By implementing rigorous scan testing, this device helps uphold the stringent quality standards of the automotive industry, enhancing both performance and safety.
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