SN74BCT8373ADWRG4

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Mfr.Part #
SN74BCT8373ADWRG4
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE 24SOIC
Stock
46,833
In Stock :
46,833

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Operating Temperature :
0°C~70°C
Base Part Number :
74BCT8373
Supply Voltage :
4.5V~5.5V
Number of Pins :
24
Max Frequency@Nom-Sup :
20000000Hz
Terminal Position :
Dual
Terminal Form :
Gull wing
Terminal Pitch :
1.27mm
Logic Function :
D-Type
Length :
15.4mm
Prop. Delay@Nom-Sup :
9.5 ns
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Pin Count :
24
Pbfree Code :
yes
Mounting Type :
Surface Mount
Power Supplies :
5V
Output Current :
64mA
Qualification Status :
Not Qualified
Mount :
Surface Mount
Number of Ports :
2
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Packaging :
Tape and Reel (TR)
Packing Method :
Tape and Reel
Number of Terminations :
24
Propagation Delay (tpd) :
10 ns
Height Seated (Max) :
2.65mm
RoHS Status :
ROHS3 Compliant
Series :
74BCT
Power Supply Current-Max (ICC) :
52mA
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Width :
7.5mm
Output Polarity :
TRUE
Number of Functions :
1
Output Characteristics :
3-STATE
Max I(ol) :
0.064 A
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Operating Supply Voltage :
5.5V
Logic Type :
Scan Test Device with D-Type Latches
Family :
BCT/FBT
Number of Bits :
8
Datasheets
SN74BCT8373ADWRG4
Introducing Specialty Logic Texas Instruments SN74BCT8373ADWRG4 from Chip IC,where excellence meets affordability. This product stands out with its Operating Temperature:0°C~70°C, Base Part Number:74BCT8373, Number of Pins:24, Mounting Type:Surface Mount, Number of Terminations:24, Package / Case:24-SOIC (0.295, 7.50mm Width), SN74BCT8373ADWRG4 pinout, SN74BCT8373ADWRG4 datasheet PDF, SN74BCT8373ADWRG4 amp .Beyond Specialty Logic Texas Instruments SN74BCT8373ADWRG4 ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8373ADWRG4


Specialty Logic Texas Instruments SN74BCT8373ADWRG4 Overview

Introducing the innovative SN74BCT8373ADWRG4, a cutting-edge IC scan test device meticulously crafted by Texas Instruments, a renowned leader in electronic components. Designed to revolutionize testing procedures, this device is poised to redefine efficiency and accuracy in the realm of integrated circuit diagnostics.

With its advanced features and robust construction, the SN74BCT8373ADWRG4 offers unparalleled performance and reliability, making it the preferred choice for discerning professionals in the electronics industry.

SN74BCT8373ADWRG4 Features

  • Highly efficient IC scan test device
  • Precision engineering by Texas Instruments
  • Optimized for reliability and accuracy
  • 24SOIC package for convenient integration
  • Enhanced durability for long-term use
  • Industry-leading performance standards

SN74BCT8373ADWRG4 Applications

  • Automated Test Equipment (ATE): The SN74BCT8373ADWRG4 excels in ATE systems, facilitating comprehensive testing of integrated circuits with unmatched precision and efficiency. Its advanced features streamline testing processes, ensuring optimal performance and accuracy in demanding industrial environments.
  • Data Acquisition Systems: Leveraging its precision engineering and high reliability, the SN74BCT8373ADWRG4 enhances the functionality of data acquisition systems by providing accurate diagnostic capabilities. From monitoring sensors to analyzing signals, this device ensures seamless operation and dependable results.
  • Embedded Systems: Integrated seamlessly into embedded systems, the SN74BCT8373ADWRG4 enables thorough testing of circuitry, ensuring robust performance and compliance with stringent quality standards. Its compact design and superior functionality make it indispensable for embedded applications requiring precise diagnostics.
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