SN74BCT8373ADWRG4
- Mfr.Part #
- SN74BCT8373ADWRG4
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 24SOIC
- Stock
- 46,833
- In Stock :
- 46,833
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Operating Temperature :
- 0°C~70°C
- Base Part Number :
- 74BCT8373
- Supply Voltage :
- 4.5V~5.5V
- Number of Pins :
- 24
- Max Frequency@Nom-Sup :
- 20000000Hz
- Terminal Position :
- Dual
- Terminal Form :
- Gull wing
- Terminal Pitch :
- 1.27mm
- Logic Function :
- D-Type
- Length :
- 15.4mm
- Prop. Delay@Nom-Sup :
- 9.5 ns
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Pin Count :
- 24
- Pbfree Code :
- yes
- Mounting Type :
- Surface Mount
- Power Supplies :
- 5V
- Output Current :
- 64mA
- Qualification Status :
- Not Qualified
- Mount :
- Surface Mount
- Number of Ports :
- 2
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Packaging :
- Tape and Reel (TR)
- Packing Method :
- Tape and Reel
- Number of Terminations :
- 24
- Propagation Delay (tpd) :
- 10 ns
- Height Seated (Max) :
- 2.65mm
- RoHS Status :
- ROHS3 Compliant
- Series :
- 74BCT
- Power Supply Current-Max (ICC) :
- 52mA
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Width :
- 7.5mm
- Output Polarity :
- TRUE
- Number of Functions :
- 1
- Output Characteristics :
- 3-STATE
- Max I(ol) :
- 0.064 A
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Operating Supply Voltage :
- 5.5V
- Logic Type :
- Scan Test Device with D-Type Latches
- Family :
- BCT/FBT
- Number of Bits :
- 8
- Datasheets
- SN74BCT8373ADWRG4

Specialty Logic Texas Instruments SN74BCT8373ADWRG4 Overview
Introducing the innovative SN74BCT8373ADWRG4, a cutting-edge IC scan test device meticulously crafted by Texas Instruments, a renowned leader in electronic components. Designed to revolutionize testing procedures, this device is poised to redefine efficiency and accuracy in the realm of integrated circuit diagnostics.
With its advanced features and robust construction, the SN74BCT8373ADWRG4 offers unparalleled performance and reliability, making it the preferred choice for discerning professionals in the electronics industry.
SN74BCT8373ADWRG4 Features
- Highly efficient IC scan test device
- Precision engineering by Texas Instruments
- Optimized for reliability and accuracy
- 24SOIC package for convenient integration
- Enhanced durability for long-term use
- Industry-leading performance standards
SN74BCT8373ADWRG4 Applications
- Automated Test Equipment (ATE): The SN74BCT8373ADWRG4 excels in ATE systems, facilitating comprehensive testing of integrated circuits with unmatched precision and efficiency. Its advanced features streamline testing processes, ensuring optimal performance and accuracy in demanding industrial environments.
- Data Acquisition Systems: Leveraging its precision engineering and high reliability, the SN74BCT8373ADWRG4 enhances the functionality of data acquisition systems by providing accurate diagnostic capabilities. From monitoring sensors to analyzing signals, this device ensures seamless operation and dependable results.
- Embedded Systems: Integrated seamlessly into embedded systems, the SN74BCT8373ADWRG4 enables thorough testing of circuitry, ensuring robust performance and compliance with stringent quality standards. Its compact design and superior functionality make it indispensable for embedded applications requiring precise diagnostics.
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