SN74BCT8373ADWR
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- Mfr.Part #
- SN74BCT8373ADWR
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE LATCH 24SOIC
- Stock
- 5,571
- In Stock ：
- 5,571
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Pin Count :
- 24
- Family :
- BCT/FBT
- Supply Voltage :
- 4.5V~5.5V
- Power Supply Current-Max (ICC) :
- 52mA
- Mount :
- Surface Mount
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Mounting Type :
- Surface Mount
- Length :
- 15.4mm
- Output Characteristics :
- 3-STATE
- Operating Temperature :
- 0°C~70°C
- Pbfree Code :
- yes
- Terminal Position :
- Dual
- Max I(ol) :
- 0.064 A
- Width :
- 7.5mm
- Base Part Number :
- 74BCT8373
- Terminal Form :
- Gull wing
- Number of Pins :
- 24
- RoHS Status :
- ROHS3 Compliant
- Power Supplies :
- 5V
- Packaging :
- Tape and Reel (TR)
- Number of Terminations :
- 24
- Series :
- 74BCT
- Logic Type :
- Scan Test Device with D-Type Latches
- Output Current :
- 64mA
- Logic Function :
- D-Type
- Number of Ports :
- 2
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Output Polarity :
- TRUE
- Prop. Delay@Nom-Sup :
- 9.5 ns
- Qualification Status :
- Not Qualified
- Packing Method :
- Tape and Reel
- Terminal Pitch :
- 1.27mm
- Number of Functions :
- 1
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Operating Supply Voltage :
- 5.5V
- Max Frequency@Nom-Sup :
- 20000000Hz
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Propagation Delay (tpd) :
- 10 ns
- Height Seated (Max) :
- 2.65mm
- Number of Bits :
- 8
- Datasheets
- SN74BCT8373ADWR
Specialty Logic Texas Instruments SN74BCT8373ADWR Overview
The Specialty Logic Texas Instruments SN74BCT8373ADWR is an advanced integrated circuit designed to streamline the process of scan test device latch operations. Manufactured by Texas Instruments, a leading name in semiconductor technology, this IC offers unparalleled performance and reliability for scan test applications.
Featuring a compact 24SOIC package, this device is optimized for efficiency and compatibility with modern electronic systems. Whether used in production testing or debugging environments, the SN74BCT8373ADWR delivers exceptional results, making it the preferred choice for engineers and technicians worldwide.
SN74BCT8373ADWR Features
- Scan test device latch for efficient testing processes
- 24SOIC package for compact and versatile integration
- High performance and reliability from Texas Instruments
- Designed for compatibility with modern electronic systems
- Streamlines production testing and debugging operations
SN74BCT8373ADWR Applications
- Automated Test Equipment (ATE): The SN74BCT8373ADWR is ideal for integration into ATE systems, where it facilitates efficient scan test device latch operations. Its compact form factor and reliable performance ensure seamless testing processes, enhancing overall productivity.
- Boundary Scan Testing: In boundary scan testing applications, this IC plays a crucial role in ensuring accurate and reliable testing of electronic assemblies. By providing robust scan test device latch functionality, it enables thorough testing of complex PCBs and components.
- Embedded Systems Debugging: For engineers working on embedded systems, the SN74BCT8373ADWR offers valuable support during debugging phases. Its high-performance capabilities and compatibility with modern electronic systems make it an essential tool for identifying and resolving issues efficiently.
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