SN74BCT8373ADW
- Mfr.Part #
- SN74BCT8373ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE LATCH 24SOIC
- Stock
- 39,519
- In Stock :
- 39,519
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Number of Ports :
- 2
- Frequency :
- 20MHz
- Low Level Output Current :
- 64mA
- Power Supplies :
- 5V
- Turn On Delay Time :
- 29 ns
- Weight :
- 624.398247mg
- Height :
- 2.65mm
- Factory Lead Time :
- 6 Weeks
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Max Supply Voltage :
- 5.5V
- Peak Reflow Temperature (Cel) :
- 260
- Terminal Form :
- Gull wing
- Family :
- BCT/FBT
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Logic Type :
- Scan Test Device with D-Type Latches
- Count Direction :
- Unidirectional
- Series :
- 74BCT
- Base Part Number :
- 74BCT8373
- RoHS Status :
- ROHS3 Compliant
- Lifecycle Status :
- ACTIVE (Last Updated: 3 days ago)
- JESD-609 Code :
- e4
- Logic Function :
- D-Type
- ECCN Code :
- EAR99
- Mount :
- Surface Mount
- Pbfree Code :
- yes
- Terminal Position :
- Dual
- Supply Voltage :
- 4.5V~5.5V
- Lead Free :
- Lead Free
- Packaging :
- Tube
- Min Supply Voltage :
- 4.5V
- Number of Bits :
- 8
- Termination :
- SMD/SMT
- Polarity :
- Non-Inverting
- Mounting Type :
- Surface Mount
- Radiation Hardening :
- No
- Number of Pins :
- 24
- Pin Count :
- 24
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Prop. Delay@Nom-Sup :
- 9.5 ns
- High Level Output Current :
- -15mA
- Width :
- 7.5mm
- Max I(ol) :
- 0.064 A
- REACH SVHC :
- No SVHC
- Length :
- 15.4mm
- Output Current :
- 64mA
- Propagation Delay :
- 29 ns
- Thickness :
- 2.35mm
- Operating Temperature :
- 0°C~70°C
- Translation :
- n/a
- Control Type :
- ENABLE LOW/HIGH
- Number of Functions :
- 1
- Output Characteristics :
- 3-STATE
- Power Supply Current-Max (ICC) :
- 52mA
- Number of Elements :
- 1
- Number of Terminations :
- 24
- Datasheets
- SN74BCT8373ADW

Specialty Logic Texas Instruments SN74BCT8373ADW Overview
The SN74BCT8373ADW is an integrated circuit scan test device latch manufactured by Texas Instruments, designed to provide efficient testing solutions for electronic systems. This innovative IC is tailored for B2B customers seeking reliable testing components for their production processes.
Featuring advanced technology and precision engineering, this scan test device latch offers unparalleled performance and durability. It ensures accurate testing results, enhancing the overall quality and efficiency of electronic manufacturing processes.
SN74BCT8373ADW Features
- Integrated circuit scan test device latch
- Manufactured by Texas Instruments
- 24SOIC package
- Designed for efficient testing of electronic systems
- Advanced technology for precise testing results
- Durable construction for long-term reliability
- Optimized for B2B customers
SN74BCT8373ADW Applications
- Automated Test Equipment (ATE): The SN74BCT8373ADW is utilized in ATE systems for comprehensive testing of electronic components and systems. Its precise testing capabilities ensure accurate assessment of device functionality, contributing to the quality assurance process.
- Industrial Control Systems: This IC is integrated into industrial control systems to facilitate efficient testing and diagnosis of equipment and machinery. It enhances the reliability and performance of industrial processes by enabling timely maintenance and troubleshooting.
- Telecommunication Infrastructure: In telecommunication infrastructure, the SN74BCT8373ADW plays a crucial role in ensuring the integrity and functionality of electronic components. It enables swift and accurate testing of communication devices, optimizing network performance and reliability.
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