SN74BCT8373ADW

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Mfr.Part #
SN74BCT8373ADW
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE LATCH 24SOIC
Stock
39,519
In Stock :
39,519

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Number of Ports :
2
Frequency :
20MHz
Low Level Output Current :
64mA
Power Supplies :
5V
Turn On Delay Time :
29 ns
Weight :
624.398247mg
Height :
2.65mm
Factory Lead Time :
6 Weeks
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Max Supply Voltage :
5.5V
Peak Reflow Temperature (Cel) :
260
Terminal Form :
Gull wing
Family :
BCT/FBT
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Logic Type :
Scan Test Device with D-Type Latches
Count Direction :
Unidirectional
Series :
74BCT
Base Part Number :
74BCT8373
RoHS Status :
ROHS3 Compliant
Lifecycle Status :
ACTIVE (Last Updated: 3 days ago)
JESD-609 Code :
e4
Logic Function :
D-Type
ECCN Code :
EAR99
Mount :
Surface Mount
Pbfree Code :
yes
Terminal Position :
Dual
Supply Voltage :
4.5V~5.5V
Lead Free :
Lead Free
Packaging :
Tube
Min Supply Voltage :
4.5V
Number of Bits :
8
Termination :
SMD/SMT
Polarity :
Non-Inverting
Mounting Type :
Surface Mount
Radiation Hardening :
No
Number of Pins :
24
Pin Count :
24
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Prop. Delay@Nom-Sup :
9.5 ns
High Level Output Current :
-15mA
Width :
7.5mm
Max I(ol) :
0.064 A
REACH SVHC :
No SVHC
Length :
15.4mm
Output Current :
64mA
Propagation Delay :
29 ns
Thickness :
2.35mm
Operating Temperature :
0°C~70°C
Translation :
n/a
Control Type :
ENABLE LOW/HIGH
Number of Functions :
1
Output Characteristics :
3-STATE
Power Supply Current-Max (ICC) :
52mA
Number of Elements :
1
Number of Terminations :
24
Datasheets
SN74BCT8373ADW
Introducing Specialty Logic Texas Instruments SN74BCT8373ADW from Chip IC,where excellence meets affordability. This product stands out with its Package / Case:24-SOIC (0.295, 7.50mm Width), Base Part Number:74BCT8373, Mounting Type:Surface Mount, Number of Pins:24, Operating Temperature:0°C~70°C, Number of Terminations:24, SN74BCT8373ADW pinout, SN74BCT8373ADW datasheet PDF, SN74BCT8373ADW amp .Beyond Specialty Logic Texas Instruments SN74BCT8373ADW ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8373ADW


Specialty Logic Texas Instruments SN74BCT8373ADW Overview

The SN74BCT8373ADW is an integrated circuit scan test device latch manufactured by Texas Instruments, designed to provide efficient testing solutions for electronic systems. This innovative IC is tailored for B2B customers seeking reliable testing components for their production processes.

Featuring advanced technology and precision engineering, this scan test device latch offers unparalleled performance and durability. It ensures accurate testing results, enhancing the overall quality and efficiency of electronic manufacturing processes.

SN74BCT8373ADW Features

  • Integrated circuit scan test device latch
  • Manufactured by Texas Instruments
  • 24SOIC package
  • Designed for efficient testing of electronic systems
  • Advanced technology for precise testing results
  • Durable construction for long-term reliability
  • Optimized for B2B customers

SN74BCT8373ADW Applications

  • Automated Test Equipment (ATE): The SN74BCT8373ADW is utilized in ATE systems for comprehensive testing of electronic components and systems. Its precise testing capabilities ensure accurate assessment of device functionality, contributing to the quality assurance process.
  • Industrial Control Systems: This IC is integrated into industrial control systems to facilitate efficient testing and diagnosis of equipment and machinery. It enhances the reliability and performance of industrial processes by enabling timely maintenance and troubleshooting.
  • Telecommunication Infrastructure: In telecommunication infrastructure, the SN74BCT8373ADW plays a crucial role in ensuring the integrity and functionality of electronic components. It enables swift and accurate testing of communication devices, optimizing network performance and reliability.
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