SN74BCT8245ADW
- Mfr.Part #
- SN74BCT8245ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE TXRX 24-SOIC
- Stock
- 2,152
- In Stock :
- 2,152
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Mounting Type :
- Surface Mount
- Lead Free :
- Lead Free
- Operating Temperature :
- 0°C~70°C
- Power Supplies :
- 5V
- Direction :
- Bidirectional
- Number of Bits :
- 8
- Weight :
- 624.398247mg
- Output Characteristics :
- 3-STATE
- ECCN Code :
- EAR99
- Additional Feature :
- WITH DIRECTION CONTROL
- Min Supply Voltage :
- 4.5V
- Packaging :
- Tape and Reel (TR)
- Number of Terminations :
- 24
- Packing Method :
- TR
- Height :
- 2.65mm
- Quiescent Current :
- 35mA
- Translation :
- n/a
- Number of Elements :
- 1
- Number of Pins :
- 24
- Number of Functions :
- 1
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- RoHS Status :
- ROHS3 Compliant
- Factory Lead Time :
- 6 Weeks
- Max Supply Voltage :
- 5.5V
- Logic Type :
- Scan Test Device with Bus Transceivers
- Thickness :
- 2.35mm
- Terminal Position :
- Dual
- Power Supply Current-Max (ICC) :
- 52mA
- JESD-609 Code :
- e4
- Propagation Delay :
- 29 ns
- Lifecycle Status :
- ACTIVE (Last Updated: 3 days ago)
- Mount :
- Surface Mount
- Length :
- 15.4mm
- Base Part Number :
- 74BCT8245
- Supply Voltage :
- 4.5V~5.5V
- Pbfree Code :
- yes
- Series :
- 74BCT
- Peak Reflow Temperature (Cel) :
- 260
- Turn On Delay Time :
- 29 ns
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Terminal Form :
- Gull wing
- Family :
- BCT/FBT
- Max I(ol) :
- 0.064 A
- Radiation Hardening :
- No
- Width :
- 7.5mm
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Logic Function :
- Transceiver
- Number of Ports :
- 2
- Pin Count :
- 24
- Polarity :
- Non-Inverting
- Control Type :
- COMMON CONTROL
- Datasheets
- SN74BCT8245ADW

Specialty Logic Texas Instruments SN74BCT8245ADW Overview
The SN74BCT8245ADW, manufactured by Texas Instruments, is an advanced integrated circuit designed for scan test device applications. This high-quality IC offers robust performance and reliability, making it an ideal choice for various industrial and commercial applications.
With its state-of-the-art technology and innovative design, the SN74BCT8245ADW provides unparalleled functionality and flexibility, allowing for efficient testing and diagnosis of electronic systems. Its compact size and durable construction make it suitable for use in diverse environments, ensuring consistent and accurate results.
Whether used in production testing or troubleshooting scenarios, this versatile device delivers exceptional performance, helping businesses streamline their operations and enhance productivity. Trust Texas Instruments' expertise and reliability with the SN74BCT8245ADW for all your scan test device needs.
SN74BCT8245ADW Features
- High-performance scan test device
- Robust and reliable design
- Compact and durable construction
- Flexible functionality for various applications
- Efficient testing and diagnosis capabilities
- Compatible with diverse electronic systems
SN74BCT8245ADW Applications
- Automated Test Equipment (ATE): The SN74BCT8245ADW is utilized in ATE systems for testing electronic components and circuits. Its high-performance capabilities enable rapid and accurate testing, enhancing production efficiency and product quality.
- Embedded Systems: Integrated into embedded systems, this IC facilitates diagnostic procedures and ensures the reliability of critical electronic devices. Its compact size and compatibility make it an essential component in various embedded applications.
- Data Communication: In data communication equipment, the SN74BCT8245ADW plays a vital role in diagnosing and troubleshooting network issues. Its robust design and flexible functionality enable seamless integration into communication systems, ensuring optimal performance and reliability.
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