SN74BCT8244ADWR
- Mfr.Part #
- SN74BCT8244ADWR
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stock
- 4,926
- In Stock :
- 4,926
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Supply Voltage :
- 4.5V~5.5V
- Family :
- BCT/FBT
- Min Supply Voltage :
- 4.5V
- JESD-609 Code :
- e4
- Terminal Position :
- Dual
- Number of Terminations :
- 24
- Number of Bits :
- 4
- Number of Elements :
- 2
- Width :
- 7.5mm
- Control Type :
- ENABLE LOW
- Number of Outputs :
- 8
- Propagation Delay :
- 29 ns
- Number of Functions :
- 2
- Output Characteristics :
- 3-STATE
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- Number of Ports :
- 2
- Mounting Type :
- Surface Mount
- Max I(ol) :
- 0.064 A
- Load Capacitance :
- 50pF
- Max Supply Voltage :
- 5.5V
- Pbfree Code :
- yes
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Quiescent Current :
- 35mA
- Series :
- 74BCT
- Terminal Form :
- Gull wing
- Peak Reflow Temperature (Cel) :
- 260
- Packing Method :
- Tape and Reel
- Operating Temperature :
- 0°C~70°C
- Pin Count :
- 24
- Low Level Output Current :
- 64mA
- Length :
- 15.4mm
- RoHS Status :
- ROHS3 Compliant
- Logic Type :
- Scan Test Device with Buffers
- Weight :
- 624.398247mg
- Radiation Hardening :
- No
- Lead Free :
- Contains Lead
- Polarity :
- Non-Inverting
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Logic Function :
- Buffer
- Mount :
- Surface Mount
- Number of Pins :
- 24
- ECCN Code :
- EAR99
- Packaging :
- Tape and Reel (TR)
- Base Part Number :
- 74BCT8244
- High Level Output Current :
- -15mA
- Datasheets
- SN74BCT8244ADWR

Specialty Logic Texas Instruments SN74BCT8244ADWR Overview
The Specialty Logic Texas Instruments SN74BCT8244ADWR is a highly efficient IC scan test device buffer packaged in a 24SOIC format. Designed with precision and reliability in mind, this product offers unparalleled performance in facilitating scan test procedures.
Featuring advanced technology and engineering, this device ensures seamless integration into various testing setups, providing robust support for comprehensive scan testing across different applications.
With its superior design and quality construction, the SN74BCT8244ADWR from Texas Instruments stands out as a top choice for professionals seeking dependable solutions for scan testing requirements.
SN74BCT8244ADWR Features
- IC scan test device buffer
- 24SOIC package
- High efficiency and reliability
- Advanced technology for seamless integration
- Precision engineering for accurate testing
- Robust construction for durability
SN74BCT8244ADWR Applications
- Automated Test Equipment (ATE): The SN74BCT8244ADWR is ideal for use in ATE setups, facilitating efficient scan testing of integrated circuits and ensuring reliable performance under demanding conditions.
- Embedded Systems Testing: This device finds application in testing embedded systems, enabling thorough analysis and validation of system components for quality assurance purposes.
- Electronic Manufacturing: In electronic manufacturing environments, the SN74BCT8244ADWR plays a crucial role in enhancing testing processes, optimizing production efficiency, and ensuring product quality.
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