SN74BCT8240ANT
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- Mfr.Part #
- SN74BCT8240ANT
- Manufacturer
- Texas Instruments
- Package / Case
- 24-DIP (0.300, 7.62mm)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE BUFF 24-DIP
- Stock
- 46,243
- In Stock ：
- 46,243
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Series :
- 74BCT
- Packaging :
- Tube
- Logic Type :
- Scan Test Device with Inverting Buffers
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Base Part Number :
- 74BCT8240
- Operating Temperature :
- 0°C~70°C
- Number of Bits :
- 8
- Package / Case :
- 24-DIP (0.300, 7.62mm)
- RoHS Status :
- ROHS3 Compliant
- Supply Voltage :
- 4.5V~5.5V
- Mounting Type :
- Through Hole
- Datasheets
- SN74BCT8240ANT
Specialty Logic Texas Instruments SN74BCT8240ANT Overview
The Specialty Logic Texas Instruments SN74BCT8240ANT is an advanced integrated circuit designed to facilitate efficient scan test device buffering. Manufactured by Texas Instruments, a leading name in the electronics industry, this IC offers unparalleled performance and reliability for your testing needs. With its innovative design and robust construction, it serves as an essential component for ensuring the accuracy and effectiveness of scan testing processes.
SN74BCT8240ANT Features
- High-performance scan test device buffering
- 24-pin DIP package for easy integration
- Advanced IC technology for enhanced reliability
- Optimized design for efficient signal transmission
- Compatible with a wide range of testing equipment
- Manufactured to rigorous quality standards
SN74BCT8240ANT Applications
- Automated Test Equipment (ATE): The SN74BCT8240ANT is utilized in ATE systems to buffer signals during scan testing, ensuring accurate and reliable test results. Its high-performance capabilities make it ideal for use in demanding testing environments.
- Printed Circuit Board (PCB) Testing: In PCB testing applications, this IC plays a crucial role in facilitating efficient signal transmission and buffering, enabling thorough testing of circuitry for defects and errors.
- Integrated Circuit (IC) Manufacturing: Within IC manufacturing facilities, the SN74BCT8240ANT is employed to enhance the efficiency and accuracy of scan testing processes, contributing to the production of high-quality integrated circuits.
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