SN74BCT8240ADWR

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Mfr.Part #
SN74BCT8240ADWR
Manufacturer
Texas Instruments
Package / Case
24-SOIC (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE BUFF 24-SOIC
Stock
45,733
In Stock :
45,733

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Family :
BCT/FBT
Packing Method :
Tape and Reel
Operating Supply Voltage :
5.5V
Supply Voltage :
4.5V~5.5V
Width :
7.5mm
Number of Functions :
2
Output Polarity :
INVERTED
Package / Case :
24-SOIC (0.295, 7.50mm Width)
Max I(ol) :
0.064 A
Number of Ports :
2
Series :
74BCT
RoHS Status :
ROHS3 Compliant
JESD-30 Code :
R-PDSO-G24
Power Supplies :
5V
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Prop. Delay@Nom-Sup :
9 ns
Logic Function :
Inverting
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Length :
15.4mm
Control Type :
ENABLE LOW
Output Characteristics :
3-STATE
Terminal Pitch :
1.27mm
Qualification Status :
Not Qualified
Mounting Type :
Surface Mount
Power Supply Current-Max (ICC) :
52mA
Operating Temperature :
0°C~70°C
Mount :
Surface Mount
Number of Terminations :
24
Terminal Form :
Gull wing
Number of Bits :
8
Terminal Position :
Dual
Height Seated (Max) :
2.65mm
Logic Type :
Scan Test Device with Inverting Buffers
Packaging :
Tape and Reel (TR)
Base Part Number :
74BCT8240
Additional Feature :
SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Pbfree Code :
yes
Pin Count :
24
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Datasheets
SN74BCT8240ADWR
Introducing Specialty Logic Texas Instruments SN74BCT8240ADWR from Chip IC,where excellence meets affordability. This product stands out with its Package / Case:24-SOIC (0.295, 7.50mm Width), Mounting Type:Surface Mount, Operating Temperature:0°C~70°C, Number of Terminations:24, Base Part Number:74BCT8240, SN74BCT8240ADWR pinout, SN74BCT8240ADWR datasheet PDF, SN74BCT8240ADWR amp .Beyond Specialty Logic Texas Instruments SN74BCT8240ADWR ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74BCT8240ADWR


Specialty Logic Texas Instruments SN74BCT8240ADWR Overview

The SN74BCT8240ADWR, manufactured by Texas Instruments, is an integrated circuit (IC) scan test device buffer designed to optimize the testing process for electronic circuits. This sophisticated device offers a reliable solution for ensuring the accuracy and efficiency of scan testing procedures.

Featuring advanced buffering capabilities, the SN74BCT8240ADWR enhances the performance of scan test devices, enabling seamless integration into diverse testing setups. Its high-quality construction and precision engineering make it a dependable choice for professionals seeking top-tier testing equipment.

Whether you're conducting diagnostic evaluations, production testing, or quality assurance assessments, the SN74BCT8240ADWR delivers exceptional results, making it an indispensable tool for electronics engineers and technicians.

SN74BCT8240ADWR Features

  • Integrated circuit (IC) scan test device buffer
  • Optimizes testing processes for electronic circuits
  • Advanced buffering capabilities for enhanced performance
  • Reliable and precise testing solution
  • Designed for seamless integration into diverse testing setups
  • High-quality construction for durability and longevity

SN74BCT8240ADWR Applications

  • Automated Test Equipment (ATE): The SN74BCT8240ADWR facilitates efficient testing of electronic components and systems in ATE setups, ensuring accurate diagnostics and performance assessments.
  • Embedded Systems Testing: Integrating seamlessly into embedded systems testing environments, this device streamlines the testing process, enabling thorough evaluations of system functionality and reliability.
  • Printed Circuit Board (PCB) Testing: With its precision buffering capabilities, the SN74BCT8240ADWR is ideal for PCB testing applications, enabling precise signal transmission and analysis for comprehensive testing procedures.
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