SN74BCT8240ADW
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- Mfr.Part #
- SN74BCT8240ADW
- Manufacturer
- Texas Instruments
- Package / Case
- 24-SOIC (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE BUFF 24-SOIC
- Stock
- 4,162
- In Stock ：
- 4,162
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Operating Temperature :
- 0°C~70°C
- Length :
- 15.4mm
- Propagation Delay :
- 29 ns
- Logic Function :
- Buffer, Inverting
- Mounting Type :
- Surface Mount
- Turn On Delay Time :
- 29 ns
- Power Supplies :
- 5V
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Number of Pins :
- 24
- Number of Outputs :
- 8
- Number of Bits :
- 4
- Quiescent Current :
- 35mA
- Logic Type :
- Scan Test Device with Inverting Buffers
- Max I(ol) :
- 0.064 A
- Pbfree Code :
- yes
- Min Supply Voltage :
- 4.5V
- Polarity :
- Inverting
- Thickness :
- 2.35mm
- Supply Voltage :
- 4.5V~5.5V
- Number of Terminations :
- 24
- Weight :
- 624.398247mg
- REACH SVHC :
- No SVHC
- Terminal Position :
- Dual
- Lifecycle Status :
- ACTIVE (Last Updated: 1 week ago)
- Terminal Form :
- Gull wing
- Termination :
- SMD/SMT
- Packaging :
- Tube
- Height :
- 2.65mm
- JESD-609 Code :
- e4
- Translation :
- n/a
- Number of Elements :
- 2
- High Level Output Current :
- -15mA
- Lead Free :
- Lead Free
- Output Characteristics :
- 3-STATE
- Peak Reflow Temperature (Cel) :
- 260
- Factory Lead Time :
- 6 Weeks
- Series :
- 74BCT
- Count Direction :
- Unidirectional
- Pin Count :
- 24
- Radiation Hardening :
- No
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Number of Functions :
- 2
- RoHS Status :
- ROHS3 Compliant
- Package / Case :
- 24-SOIC (0.295, 7.50mm Width)
- ECCN Code :
- EAR99
- Mount :
- Surface Mount
- Base Part Number :
- 74BCT8240
- Control Type :
- ENABLE LOW
- Low Level Output Current :
- 64mA
- Family :
- BCT/FBT
- Max Supply Voltage :
- 5.5V
- Width :
- 7.5mm
- Additional Feature :
- SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
- Number of Ports :
- 2
- Datasheets
- SN74BCT8240ADW
Specialty Logic Texas Instruments SN74BCT8240ADW Overview
The SN74BCT8240ADW from Texas Instruments is a high-performance Specialty Logic device designed to meet the needs of advanced digital systems. This IC scan test device with buffers integrates seamlessly into various applications requiring scan test devices with a robust buffering capability. It is housed in a 24-SOIC package, making it ideal for compact yet powerful applications in digital technology. The SN74BCT8240ADW offers superior reliability and functionality, enhancing system performance by providing effective diagnostic and troubleshooting capabilities. Its design is tailored specifically for handling complex logic operations and testing, ensuring efficient performance in critical environments.
SN74BCT8240ADW Features
The SN74BCT8240ADW by Texas Instruments boasts a range of features that make it a preferred component for high-tech applications. Key features include its ability to function as both a scan test device and a buffer, a 24-SOIC packaging that fits perfectly into smaller assemblies, and high compatibility with standard logic level interfaces. This IC is crafted to support rigorous testing protocols and is engineered to contribute significantly to the overall stability and reliability of the system it integrates with.
SN74BCT8240ADW Applications
- Computer Systems: Used in the development and testing of motherboard chipsets, improving diagnostic capabilities and system stability.
- Embedded Systems: Enhances the testing and verification process in embedded system design, leading to robust and reliable product deployments.
- Telecommunications: Integral in testing and maintaining telecommunications infrastructure, ensuring high reliability and performance under varying conditions.
- Automotive Electronics: Applied in automotive diagnostics systems to facilitate advanced testing and error checking, improving safety and performance metrics.
- Industrial Automation: Utilized in automated testing equipment for industrial electronics, aiding in fault diagnosis and system maintenance.
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