SN74ABT18640DLR
- Mfr.Part #
- SN74ABT18640DLR
- Manufacturer
- Texas Instruments
- Package / Case
- 56-BSSOP (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN TEST DEVICE 18BIT 56SSOP
- Stock
- 1,800
- In Stock :
- 1,800
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Mounting Type :
- Surface Mount
- Number of Ports :
- 2
- Max I(ol) :
- 0.064 A
- Propagation Delay (tpd) :
- 5.4 ns
- Series :
- 74ABT
- Terminal Pitch :
- 0.635mm
- Count Direction :
- Bidirectional
- Terminal Form :
- Gull wing
- HTS Code :
- 8542.39.00.01
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Pbfree Code :
- yes
- Number of Pins :
- 56
- Packaging :
- Tape and Reel (TR)
- Packing Method :
- Tape and Reel
- Translation :
- n/a
- Output Characteristics :
- 3-STATE
- Operating Temperature :
- -40°C~85°C
- Terminal Position :
- Dual
- Package / Case :
- 56-BSSOP (0.295, 7.50mm Width)
- Pin Count :
- 56
- Supply Voltage :
- 4.5V~5.5V
- Number of Terminations :
- 56
- Logic Type :
- Scan Test Device with Inverting Bus Transceivers
- Width :
- 7.49mm
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Output Polarity :
- INVERTED
- Logic Function :
- Inverting
- Power Supplies :
- 5V
- Operating Supply Voltage :
- 5.5V
- Number of Functions :
- 2
- Power Supply Current-Max (ICC) :
- 38mA
- Base Part Number :
- 74ABT18640
- RoHS Status :
- ROHS3 Compliant
- Height Seated (Max) :
- 2.79mm
- Control Type :
- COMMON CONTROL
- Additional Feature :
- SCANNABLE
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Prop. Delay@Nom-Sup :
- 5.4 ns
- Number of Bits :
- 18
- Mount :
- Surface Mount
- Qualification Status :
- Not Qualified
- Family :
- ABT
- Load Capacitance :
- 50pF
- Datasheets
- SN74ABT18640DLR

Specialty Logic Texas Instruments SN74ABT18640DLR Overview
Introducing the cutting-edge IC Scan Test Device 18-bit 56SSOP from Texas Instruments, your go-to solution for comprehensive scan testing in integrated circuit designs. Engineered with precision and reliability in mind, this advanced device revolutionizes the scan testing process, ensuring optimal performance and efficiency in your semiconductor testing operations.
Designed to meet the rigorous demands of modern electronics manufacturing, the SN74ABT18640DLR delivers unparalleled accuracy and speed, empowering you to streamline your testing procedures and accelerate time-to-market for your innovative semiconductor products.
With its robust construction and intelligent features, this device represents the pinnacle of scan testing technology, setting a new standard for excellence in the industry. Discover the future of semiconductor testing with the SN74ABT18640DLR from Texas Instruments.
SN74ABT18640DLR Features
- High-performance IC scan test device
- 18-bit scan testing capability
- 56SSOP package for compact and efficient integration
- Precision-engineered for reliable operation
- Optimized for speed and accuracy
- Advanced features for comprehensive scan testing
- Designed for seamless integration into semiconductor testing workflows
- Manufactured by Texas Instruments, a trusted leader in semiconductor solutions
SN74ABT18640DLR Applications
- Integrated Circuit Testing: Utilize the SN74ABT18640DLR to perform thorough scan testing on a wide range of integrated circuit designs, ensuring the highest levels of quality and reliability in your semiconductor products.
- Microprocessor Development: Incorporate this advanced scan test device into your microprocessor development process to verify the integrity and functionality of complex chip designs, facilitating seamless integration into electronic devices.
- Automotive Electronics: Enhance the performance and safety of automotive electronics by employing the SN74ABT18640DLR for comprehensive scan testing, guaranteeing robustness and reliability in automotive semiconductor components.
- Telecommunications Infrastructure: Improve the efficiency and reliability of telecommunications infrastructure components by leveraging the advanced scan testing capabilities of the SN74ABT18640DLR, ensuring optimal performance in demanding networking environments.
- Industrial Automation: Streamline the testing process for industrial automation equipment and systems with the SN74ABT18640DLR, enabling precise diagnostics and quality assurance in industrial semiconductor devices.
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