SN74ABT18640DLR

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Mfr.Part #
SN74ABT18640DLR
Manufacturer
Texas Instruments
Package / Case
56-BSSOP (0.295, 7.50mm Width)
Datasheet
Download
Description
IC SCAN TEST DEVICE 18BIT 56SSOP
Stock
1,800
In Stock :
1,800

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Manufacturer :
Texas Instruments
Product Category :
Specialty Logic
Mounting Type :
Surface Mount
Number of Ports :
2
Max I(ol) :
0.064 A
Propagation Delay (tpd) :
5.4 ns
Series :
74ABT
Terminal Pitch :
0.635mm
Count Direction :
Bidirectional
Terminal Form :
Gull wing
HTS Code :
8542.39.00.01
Peak Reflow Temperature (Cel) :
NOT SPECIFIED
Pbfree Code :
yes
Number of Pins :
56
Packaging :
Tape and Reel (TR)
Packing Method :
Tape and Reel
Translation :
n/a
Output Characteristics :
3-STATE
Operating Temperature :
-40°C~85°C
Terminal Position :
Dual
Package / Case :
56-BSSOP (0.295, 7.50mm Width)
Pin Count :
56
Supply Voltage :
4.5V~5.5V
Number of Terminations :
56
Logic Type :
Scan Test Device with Inverting Bus Transceivers
Width :
7.49mm
Moisture Sensitivity Level (MSL) :
1 (Unlimited)
Output Polarity :
INVERTED
Logic Function :
Inverting
Power Supplies :
5V
Operating Supply Voltage :
5.5V
Number of Functions :
2
Power Supply Current-Max (ICC) :
38mA
Base Part Number :
74ABT18640
RoHS Status :
ROHS3 Compliant
Height Seated (Max) :
2.79mm
Control Type :
COMMON CONTROL
Additional Feature :
SCANNABLE
Time@Peak Reflow Temperature-Max (s) :
NOT SPECIFIED
Prop. Delay@Nom-Sup :
5.4 ns
Number of Bits :
18
Mount :
Surface Mount
Qualification Status :
Not Qualified
Family :
ABT
Load Capacitance :
50pF
Datasheets
SN74ABT18640DLR
Introducing Specialty Logic Texas Instruments SN74ABT18640DLR from Chip IC,where excellence meets affordability. This product stands out with its Mounting Type:Surface Mount, Number of Pins:56, Operating Temperature:-40°C~85°C, Package / Case:56-BSSOP (0.295, 7.50mm Width), Number of Terminations:56, Base Part Number:74ABT18640, SN74ABT18640DLR pinout, SN74ABT18640DLR datasheet PDF, SN74ABT18640DLR amp .Beyond Specialty Logic Texas Instruments SN74ABT18640DLR ,we also offer HEF4007UBT,652, MC14007UBDR2G, CD4007UBNSR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments SN74ABT18640DLR


Specialty Logic Texas Instruments SN74ABT18640DLR Overview

Introducing the cutting-edge IC Scan Test Device 18-bit 56SSOP from Texas Instruments, your go-to solution for comprehensive scan testing in integrated circuit designs. Engineered with precision and reliability in mind, this advanced device revolutionizes the scan testing process, ensuring optimal performance and efficiency in your semiconductor testing operations.

Designed to meet the rigorous demands of modern electronics manufacturing, the SN74ABT18640DLR delivers unparalleled accuracy and speed, empowering you to streamline your testing procedures and accelerate time-to-market for your innovative semiconductor products.

With its robust construction and intelligent features, this device represents the pinnacle of scan testing technology, setting a new standard for excellence in the industry. Discover the future of semiconductor testing with the SN74ABT18640DLR from Texas Instruments.

SN74ABT18640DLR Features

  • High-performance IC scan test device
  • 18-bit scan testing capability
  • 56SSOP package for compact and efficient integration
  • Precision-engineered for reliable operation
  • Optimized for speed and accuracy
  • Advanced features for comprehensive scan testing
  • Designed for seamless integration into semiconductor testing workflows
  • Manufactured by Texas Instruments, a trusted leader in semiconductor solutions

SN74ABT18640DLR Applications

  • Integrated Circuit Testing: Utilize the SN74ABT18640DLR to perform thorough scan testing on a wide range of integrated circuit designs, ensuring the highest levels of quality and reliability in your semiconductor products.
  • Microprocessor Development: Incorporate this advanced scan test device into your microprocessor development process to verify the integrity and functionality of complex chip designs, facilitating seamless integration into electronic devices.
  • Automotive Electronics: Enhance the performance and safety of automotive electronics by employing the SN74ABT18640DLR for comprehensive scan testing, guaranteeing robustness and reliability in automotive semiconductor components.
  • Telecommunications Infrastructure: Improve the efficiency and reliability of telecommunications infrastructure components by leveraging the advanced scan testing capabilities of the SN74ABT18640DLR, ensuring optimal performance in demanding networking environments.
  • Industrial Automation: Streamline the testing process for industrial automation equipment and systems with the SN74ABT18640DLR, enabling precise diagnostics and quality assurance in industrial semiconductor devices.
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