SN74ABT18245ADL
- Mfr.Part #
- SN74ABT18245ADL
- Manufacturer
- Texas Instruments
- Package / Case
- 56-BSSOP (0.295, 7.50mm Width)
- Datasheet
- Download
- Description
- IC SCAN-TEST-DEV/TXRX 56-SSOP
- Stock
- 10,341
- In Stock :
- 10,341
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Number of Ports :
- 2
- JESD-609 Code :
- e4
- Length :
- 18.41mm
- Thickness :
- 2.59mm
- Load Capacitance :
- 50pF
- Turn On Delay Time :
- 13.6 ns
- Quiescent Current :
- 33mA
- Mount :
- Surface Mount
- REACH SVHC :
- No SVHC
- RoHS Status :
- ROHS3 Compliant
- Direction :
- Bidirectional
- Supply Voltage :
- 4.5V~5.5V
- Evaluation Kit :
- yes
- Translation :
- n/a
- Operating Temperature :
- -40°C~85°C
- Factory Lead Time :
- 6 Weeks
- Number of Circuits :
- 2
- Base Part Number :
- 74ABT18245
- Weight :
- 694.790113mg
- Number of Functions :
- 2
- Lead Free :
- Lead Free
- Logic Function :
- Transceiver
- Termination :
- SMD/SMT
- Power Supplies :
- 5V
- Height :
- 2.79mm
- Number of Pins :
- 56
- Terminal Finish :
- Nickel/Palladium/Gold (Ni/Pd/Au)
- Pin Count :
- 56
- Terminal Pitch :
- 0.635mm
- Number of Bits :
- 18
- Terminal Form :
- Gull wing
- Width :
- 7.49mm
- Series :
- 74ABT
- Lifecycle Status :
- ACTIVE (Last Updated: 1 day ago)
- Power Supply Current-Max (ICC) :
- 38mA
- Terminal Position :
- Dual
- Peak Reflow Temperature (Cel) :
- 260
- Min Supply Voltage :
- 4.5V
- Radiation Hardening :
- No
- ECCN Code :
- EAR99
- Output Characteristics :
- 3-STATE
- Number of Terminations :
- 56
- Polarity :
- Non-Inverting
- Additional Feature :
- WITH DIRECTION CONTROL
- Propagation Delay :
- 13.6 ns
- Pbfree Code :
- yes
- Mounting Type :
- Surface Mount
- Family :
- ABT
- Package / Case :
- 56-BSSOP (0.295, 7.50mm Width)
- Logic Type :
- Scan Test Device with Bus Transceivers
- Control Type :
- COMMON CONTROL
- Packaging :
- Tube
- Max Supply Voltage :
- 5.5V
- Prop. Delay@Nom-Sup :
- 5.4 ns
- Max I(ol) :
- 0.064 A
- Datasheets
- SN74ABT18245ADL

Specialty Logic Texas Instruments SN74ABT18245ADL Overview
The SN74ABT18245ADL, manufactured by Texas Instruments, is an advanced integrated circuit designed for scan test development and transmission/reception applications. With its innovative design and robust construction, this IC offers unparalleled performance and reliability, making it an ideal choice for a wide range of industrial and commercial applications.
Featuring state-of-the-art technology, the SN74ABT18245ADL excels in providing efficient scan test development capabilities, allowing for comprehensive testing of electronic devices and systems. Its versatile design also enables seamless integration into transmission and reception circuits, facilitating smooth data transmission and reception in various communication systems.
SN74ABT18245ADL Features
- Advanced integrated circuit for scan test development and transmission/reception applications
- Manufactured by Texas Instruments, ensuring high quality and reliability
- Efficient scan test development capabilities for comprehensive testing of electronic devices and systems
- Versatile design for seamless integration into transmission and reception circuits
- Optimized performance for smooth data transmission and reception in communication systems
SN74ABT18245ADL Applications
- Embedded systems: The SN74ABT18245ADL is widely used in embedded systems for scan test development, enabling thorough testing of microcontrollers, processors, and other electronic components.
- Networking equipment: In networking equipment such as routers and switches, this IC facilitates efficient data transmission and reception, ensuring reliable communication in diverse network environments.
- Industrial automation: Within industrial automation systems, the SN74ABT18245ADL plays a crucial role in scan test development and data transmission, enhancing the performance and reliability of automated processes.
- Telecommunication systems: Integrated into telecommunication systems, this IC enables seamless transmission and reception of data, supporting the smooth operation of telecommunications networks.
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