LT1012CJ8
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- Mfr.Part #
- LT1012CJ8
- Manufacturer
- Analog Devices, Inc.
- Package / Case
- 8-CDIP (0.300, 7.62mm)
- Datasheet
- Download
- Description
- IC OPAMP GP 1 CIRCUIT 8CERDIP
- Stock
- 44,922
- In Stock ：
- 44,922
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- Manufacturer :
- Analog Devices, Inc.
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Amplifier Type :
- GENERAL PURPOSE
- Number of Circuits :
- 1
- JESD-30 Code :
- R-XDIP-T8
- Terminal Position :
- Dual
- Supply Voltage :
- 15V
- Bias Current-Max (IIB) @25C :
- 0.0002μA
- Surface Mount :
- No
- Voltage - Input Offset :
- 10μV
- Qualification Status :
- Not Qualified
- Neg Supply Voltage-Nom (Vsup) :
- -15V
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Terminal Finish :
- Tin/Lead (Sn/Pb)
- Lead Free :
- Contains Lead
- Base Part Number :
- LT1012
- JESD-609 Code :
- e0
- Micropower :
- yes
- Frequency Compensation :
- yes
- Number of Functions :
- 1
- Mounting Type :
- Through Hole
- Operating Temperature :
- 0°C~70°C
- RoHS Status :
- Non-RoHS Compliant
- Packaging :
- Tube
- Supply Voltage Limit-Max :
- 20V
- Number of Terminations :
- 8
- Current - Input Bias :
- 30pA
- Low-Offset :
- yes
- Current - Supply :
- 380μA
- Terminal Pitch :
- 2.54mm
- Slew Rate :
- 0.2V/µs
- Pin Count :
- 8
- Low-Bias :
- yes
- Package / Case :
- 8-CDIP (0.300, 7.62mm)
- Architecture :
- VOLTAGE-FEEDBACK
- Voltage - Supply, Single/Dual (±) :
- 2.4V~40V ±1.2V~20V
- Datasheets
- LT1012CJ8
Instrumentation OP Amps Buffer Amps Analog Devices, Inc. LT1012CJ8 Overview
欢迎来到Analog Devices, Inc.的LT1012CJ8产品概览。LT1012CJ8是一款高性能的通用运放集成电路，设计用于在各种工业和电子设备中提供稳定、可靠的信号放大功能。其精密的电路设计和可靠性使其成为工程师们在设计电子系统时的首选。
无论您是开发工业控制系统、医疗设备、测试仪器还是其他电子产品，LT1012CJ8都能为您提供卓越的性能和可靠性。作为Analog Devices, Inc.的产品，LT1012CJ8承载着公司数十年来在集成电路领域的卓越声誉，为您的项目提供了强大的技术支持和品质保证。
LT1012CJ8 Features
- 高性能通用运放集成电路
- 稳定、可靠的信号放大功能
- 精密的电路设计
- Analog Devices, Inc.品牌认可
- 适用于工业控制、医疗设备、测试仪器等领域
LT1012CJ8 Applications
- 工业控制系统：LT1012CJ8可应用于工业控制系统中的信号放大和处理模块，提高系统稳定性和精度。
- 医疗设备：在医疗成像设备和生命体征监测器件中，LT1012CJ8可用于信号放大和滤波，确保数据准确性和可靠性。
- 测试仪器：用于仪器测量和测试过程中的信号放大和处理，提高测试精度和可靠性。
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