LM6152ACM
- Mfr.Part #
- LM6152ACM
- Manufacturer
- Texas Instruments
- Package / Case
- 8-SOIC (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC OPAMP GP 2 CIRCUIT 8SOIC
- Stock
- 4,037
- In Stock :
- 4,037
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- Manufacturer :
- Texas Instruments
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Output Current :
- 40mA
- Frequency Compensation :
- yes
- Packaging :
- Tube
- Micropower :
- No
- Architecture :
- VOLTAGE-FEEDBACK
- Base Part Number :
- LM6152
- Terminal Form :
- Gull wing
- Terminal Finish :
- Tin/Lead (Sn/Pb)
- Terminal Position :
- Dual
- Low-Bias :
- No
- Voltage Gain :
- 106.61dB
- Peak Reflow Temperature (Cel) :
- 235
- Input Offset Voltage (Vos) :
- 300µV
- RoHS Status :
- Non-RoHS Compliant
- Mount :
- Surface Mount
- Low-Offset :
- No
- Unity Gain BW-Nom :
- 75000 kHz
- Radiation Hardening :
- No
- Operating Supply Current :
- 1.6mA
- Number of Elements :
- 2
- Input Offset Current-Max (IIO) :
- 0.16μA
- Number of Pins :
- 8
- Number of Terminations :
- 8
- Power Supply Rejection Ratio (PSRR) :
- 80dB
- JESD-609 Code :
- e0
- Width :
- 3.91mm
- Number of Functions :
- 2
- Programmable Power :
- No
- Output Current per Channel :
- 16.9mA
- Current - Input Bias :
- 500nA
- Pin Count :
- 8
- Mounting Type :
- Surface Mount
- Supply Voltage :
- 5V
- Nominal Supply Current :
- 1.4mA
- Height :
- 1.75mm
- Package / Case :
- 8-SOIC (0.154, 3.90mm Width)
- Lead Free :
- Contains Lead
- Gain Bandwidth Product :
- 80MHz
- Length :
- 4.9mm
- Common Mode Rejection Ratio :
- 70 dB
- Thickness :
- 1.58mm
- ECCN Code :
- EAR99
- Slew Rate :
- 30V/µs
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Operating Temperature :
- 0°C~70°C
- Output Type :
- Rail-to-Rail
- Supply Voltage Limit-Max :
- 35V
- Lifecycle Status :
- NRND (Last Updated: 1 week ago)
- Wideband :
- yes
- Voltage - Supply, Single/Dual (±) :
- 2.7V~24V ±1.35V~12V
- Amplifier Type :
- GENERAL PURPOSE
- Datasheets
- LM6152ACM
LM6152ACM Documents

Instrumentation, OP Amps, Buffer Amps Texas Instruments LM6152ACM Overview
Introducing the LM6152ACM, an exceptional Integrated Circuit Operational Amplifier (IC OPAMP) engineered by Texas Instruments, renowned for its commitment to precision and reliability. This dual-channel amplifier, housed in an 8SOIC package, is tailored to meet the demands of modern electronic circuits with its versatile performance and robust design.
Featuring advanced circuitry and high-quality components, the LM6152ACM excels in various applications, delivering unparalleled functionality and stability. Its dual operational amplifier configuration empowers engineers to achieve optimal signal amplification and processing, making it an indispensable component in numerous industrial and commercial projects.
Designed to uphold the esteemed reputation of Texas Instruments, the LM6152ACM sets a new standard for operational amplifiers, offering unparalleled performance and versatility for a diverse range of applications.
LM6152ACM Features
- Dual-channel operational amplifier
- High precision and reliability
- 8SOIC package for easy integration
- Wide voltage range operation
- Low offset voltage and low quiescent current
- High slew rate for fast signal processing
- Robust design for industrial applications
- Temperature stability for consistent performance
LM6152ACM Applications
- Industrial Automation: The LM6152ACM is ideal for use in industrial automation systems, providing precise signal amplification and conditioning for sensors, actuators, and control circuits.
- Medical Devices: In medical equipment such as patient monitoring systems and diagnostic devices, the LM6152ACM ensures accurate signal processing, contributing to reliable and precise measurements.
- Audio Equipment: Audio amplifiers and mixers benefit from the LM6152ACM's high slew rate and low distortion, delivering clear and faithful sound reproduction in professional audio systems.
- Instrumentation: For test and measurement instruments requiring high-performance amplification, the LM6152ACM offers exceptional accuracy and stability, enhancing the reliability of measurement data.
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