ISL28470FAZ-T7
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- Mfr.Part #
- ISL28470FAZ-T7
- Manufacturer
- Intersil (Renesas Electronics Corporation)
- Package / Case
- 28-SSOP (0.154, 3.90mm Width)
- Datasheet
- Download
- Description
- IC INST AMP 4 CIRCUIT 28QSOP
- Stock
- 34,164
- In Stock ：
- 34,164
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- Manufacturer :
- Intersil (Renesas Electronics Corporation)
- Product Category :
- Instrumentation, OP Amps, Buffer Amps
- Supply Voltage Limit-Max :
- 5.5V
- Amplifier Type :
- Instrumentation
- Mounting Type :
- Surface Mount
- Voltage - Input Offset :
- 35μV
- Voltage - Supply, Single/Dual (±) :
- 2.4V~5.5V ±1.2V~2.75V
- Surface Mount :
- yes
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Operating Temperature :
- -40°C~125°C
- Number of Functions :
- 4
- Terminal Pitch :
- 0.635mm
- Supply Voltage :
- 5V
- Number of Circuits :
- 4
- Pin Count :
- 28
- Base Part Number :
- ISL28470
- Average Bias Current-Max (IIB) :
- 0.003μA
- Length :
- 9.9mm
- Common-mode Reject Ratio-Min :
- 85 dB
- Terminal Finish :
- Matte Tin (Sn)
- Slew Rate :
- 0.5V/μs
- Peak Reflow Temperature (Cel) :
- NOT SPECIFIED
- Packing Method :
- TR
- Input Offset Current-Max (IIO) :
- 0.0015μA
- Terminal Form :
- Gull wing
- Packaging :
- Cut Tape (CT)
- Terminal Position :
- Dual
- Current - Supply :
- 260μA
- Number of Terminations :
- 28
- Package / Case :
- 28-SSOP (0.154, 3.90mm Width)
- JESD-609 Code :
- e3
- RoHS Status :
- ROHS3 Compliant
- Current - Input Bias :
- 250pA
- Output Type :
- Rail-to-Rail
- Current - Output / Channel :
- 29mA
- JESD-30 Code :
- R-PDSO-G28
- Height Seated (Max) :
- 1.72mm
- -3db Bandwidth :
- 240kHz
- Datasheets
- ISL28470FAZ-T7
[Instrumentation, OP Amps, Buffer Amps] Overview
Introducing the ISL28470FAZ-T7 from Intersil (Renesas Electronics Corporation), a cutting-edge integrated circuit designed to revolutionize your instrumentation, operational amplifier, and buffer amplifier applications. This high-performance IC combines precision with versatility, offering unparalleled functionality for a wide range of industrial and commercial uses.
Whether you're seeking superior signal conditioning, precise measurement accuracy, or robust buffer amplification, this innovative solution delivers exceptional performance and reliability. With its compact design and advanced features, the ISL28470FAZ-T7 empowers engineers to achieve optimal results in their designs, ensuring enhanced efficiency and productivity.
ISL28470FAZ-T7 Features
- Quad operational amplifier configuration for versatile functionality
- Precision performance with low offset voltage and low noise
- Wide supply voltage range for enhanced flexibility
- High slew rate and bandwidth for rapid signal processing
- Robust overvoltage protection for increased reliability
- Temperature range suitability for diverse operating environments
- Compact 28QSOP package for space-saving integration
- RoHS compliant for environmentally conscious applications
ISL28470FAZ-T7 Applications
- Industrial Automation Systems: The ISL28470FAZ-T7 excels in industrial automation applications, providing precise signal conditioning and amplification for sensors, transducers, and control systems. Its robust design and wide operating temperature range make it ideal for harsh industrial environments, ensuring reliable performance in demanding conditions.
- Medical Instrumentation: In medical instrumentation, accuracy and reliability are paramount. The ISL28470FAZ-T7 delivers exceptional performance for medical devices such as patient monitors, ECG machines, and diagnostic equipment. Its low noise and low offset voltage ensure accurate signal processing, enabling healthcare professionals to make informed decisions with confidence.
- Test and Measurement Equipment: For test and measurement applications, the ISL28470FAZ-T7 offers unparalleled precision and versatility. From data acquisition systems to waveform generators, this IC provides the high bandwidth and low distortion necessary for accurate measurements. Its quad operational amplifier configuration allows for simultaneous processing of multiple signals, enhancing the efficiency of test setups.
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