EP4CE115F23I8L

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Mfr.Part #
EP4CE115F23I8L
Manufacturer
Altera (Intel)
Package / Case
484-BGA
Datasheet
Download
Description
IC FPGA 280 I/O 484FBGA
Stock
1
In Stock :
1

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Manufacturer :
Altera (Intel)
Product Category :
FPGAs (Field Programmable Gate Array)
Peak Reflow Temperature (Cel) :
220
Terminal Position :
BOTTOM
HTS Code :
8542.39.00.01
Packaging :
Tray
Factory Lead Time :
8 Weeks
Number of Terminations :
484
Programmable Logic Type :
FIELD PROGRAMMABLE GATE ARRAY
Number of Inputs :
283
Number of Logic Elements/Cells :
114480
JESD-609 Code :
e0
RoHS Status :
Non-RoHS Compliant
ECCN Code :
3A001.A.7.A
Operating Temperature :
-40°C~100°C TJ
Surface Mount :
yes
Series :
Cyclone® IV E
Terminal Finish :
TIN LEAD
Power Supplies :
11.2/3.32.5V
Length :
23mm
Terminal Pitch :
1mm
Height Seated (Max) :
2.4mm
Terminal Form :
Ball
Moisture Sensitivity Level (MSL) :
3 (168 Hours)
Number of I/O :
280
Total RAM Bits :
3981312
Clock Frequency :
362MHz
JESD-30 Code :
S-PBGA-B484
Time@Peak Reflow Temperature-Max (s) :
30
Width :
23mm
Supply Voltage :
1V
Qualification Status :
Not Qualified
Package / Case :
484-BGA
Mounting Type :
Surface Mount
Base Part Number :
EP4CE115
Number of Outputs :
283
Number of LABs/CLBs :
7155
Voltage - Supply :
0.97V~1.03V
Datasheets
EP4CE115F23I8L
Introducing FPGAs (Field Programmable Gate Array) Altera (Intel) EP4CE115F23I8L from Chip IC,where excellence meets affordability. This product stands out with its Number of Terminations:484, Operating Temperature:-40°C~100°C TJ, Package / Case:484-BGA, Mounting Type:Surface Mount, Base Part Number:EP4CE115, EP4CE115F23I8L pinout, EP4CE115F23I8L datasheet PDF, EP4CE115F23I8L amp .Beyond FPGAs (Field Programmable Gate Array) Altera (Intel) EP4CE115F23I8L ,we also offer T35F400C3, T55F324C3, T120F324C3, Our vast inventory has you covered. Contact us now for immediate solutions.

Altera (Intel) EP4CE115F23I8L


FPGAs (Field Programmable Gate Array) Altera (Intel) EP4CE115F23I8L Overview

The Altera (Intel) EP4CE115F23I8L is an advanced FPGA (Field Programmable Gate Array) that brings high-level integration and performance optimization to a variety of complex digital systems. Manufactured by Intel's Altera division, this component features a versatile 484-pin FBGA (Fine-Pitch Ball Grid Array) package and supports 280 I/O pins, making it exceptionally well-suited for scalable digital applications. The EP4CE115F23I8L stands out in the market for its robust configuration options and adaptive logic modules, facilitating rapid development and deployment of custom hardware accelerations. This makes the FPGA an ideal choice for designers aiming to enhance system performance, reliability, and functionality, while significantly reducing time-to-market.

EP4CE115F23I8L Features

This FPGA is designed with several key features that ensure high performance and flexibility across various applications:

  • 280 I/O pins for extensive peripheral interfacing.
  • 484-pin FBGA package ensuring a compact form factor.
  • High-density logic integration facilitates complex circuit designs.
  • Low power consumption enhances efficiency and sustainability of systems.
  • Supported by Intel's sophisticated Quartus II design software for easier programming and implementation.

EP4CE115F23I8L Applications

  • Telecommunications Equipment: The FPGA is utilized to process high-speed digital signals, effectively managing data transfers within network infrastructures.
  • Automotive Driver Assistance Systems: Implements critical functions in safety-focused sensors and control units, enhancing vehicle response times and decision-making accuracy.
  • Industrial Automation: Acts as the control center in automation machinery, improving operational efficiency and precision in high-volume manufacturing processes.
  • Consumer Electronics: Used in smart home devices, enhancing the functionality and interactivity of consumer-focused technology.
  • Medical Devices: Critical for the processing and analysis of complex data in medical diagnostic equipment, contributing to faster and more accurate health assessments.
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