ADS5560IRGZ25
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- Mfr.Part #
- ADS5560IRGZ25
- Manufacturer
- Texas Instruments
- Package / Case
- 48-VFQFN Exposed Pad
- Datasheet
- Download
- Description
- IC ADC 16BIT PIPELINED 48VQFN
- Stock
- 30,415
- In Stock ：
- 30,415
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- Manufacturer :
- Texas Instruments
- Product Category :
- Analog to Digital Converters (ADC)
- Architecture :
- Pipelined
- Input Type :
- Differential
- Converter Type :
- ADC, PROPRIETARY METHOD
- Supply Voltage :
- 3.3V
- Output Format :
- SERIAL, PARALLEL, WORD
- Number of Pins :
- 48
- Power Consumption :
- 674mW
- Sample and Hold / Track and Hold :
- SAMPLE
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Data Interface :
- LVDS - Parallel, Parallel
- Analog Input Voltage-Max :
- 3.56V
- Supply Type :
- Analog, Digital
- Sampling Rate :
- 40 Msps
- Min Supply Voltage :
- 3V
- Sampling Rate (Per Second) :
- 40m
- RoHS Status :
- ROHS3 Compliant
- Pin Count :
- 48
- Base Part Number :
- ADS5560
- Integral Nonlinearity (INL) :
- 8.5 LSB
- Package / Case :
- 48-VFQFN Exposed Pad
- Length :
- 7mm
- Number of Converters :
- 1
- Pbfree Code :
- No
- Number of Terminations :
- 48
- Number of Bits :
- 16
- Number of Analog In Channels :
- 1
- Max Power Dissipation :
- 810mW
- Packaging :
- Tape and Reel (TR)
- Terminal Position :
- QUAD
- Voltage - Supply, Digital :
- 3V~3.6V
- Contact Plating :
- Gold
- Reference Type :
- Internal
- Ratio - S/H:ADC :
- 1:1
- Max Supply Voltage :
- 3.6V
- Lead Free :
- Contains Lead
- Resolution :
- 2 B
- Output Bit Code :
- OFFSET BINARY, 2'S COMPLEMENT BINARY
- Power Dissipation :
- 810mW
- JESD-609 Code :
- e4
- Polarity :
- Bipolar
- Width :
- 7mm
- Mounting Type :
- Surface Mount
- Voltage - Supply, Analog :
- 3V~3.6V
- Interface :
- Parallel, Serial
- Peak Reflow Temperature (Cel) :
- 260
- Operating Supply Voltage :
- 3.3V
- Configuration :
- S/H-ADC
- Terminal Pitch :
- 0.5mm
- Operating Temperature :
- -40°C~85°C
- Number of Functions :
- 1
- Mount :
- Surface Mount
- Radiation Hardening :
- No
- Datasheets
- ADS5560IRGZ25
ADS5560IRGZ25 Documents
Analog to Digital Converters (ADC) Texas Instruments ADS5560IRGZ25 Overview
The Analog to Digital Converter (ADC) Texas Instruments ADS5560IRGZ25 is a state-of-the-art, high-performance 16-bit pipelined ADC designed to deliver unparalleled accuracy and speed in digital data conversion. Manufactured by Texas Instruments, a leader in semiconductor innovation, this ADC utilizes advanced technology to achieve a high-speed sampling rate, making it ideal for high-frequency signal processing. The ADS5560IRGZ25's compact 48-VQFN package ensures that it can be integrated into space-constrained applications while maintaining its robust functionality.
ADS5560IRGZ25 Features
This ADC features a high 16-bit resolution that provides precise digital outputs, ensuring detailed and accurate representation of the analog input signal. Its pipelined architecture enhances throughput without compromising data integrity, allowing for real-time data acquisition and processing. Additionally, the ADS5560IRGZ25 supports a wide input bandwidth, making it suitable for a broad range of high-speed applications. The low power consumption and operational stability under varying conditions make it an excellent choice for demanding environments.
ADS5560IRGZ25 Applications
- Medical Imaging Systems: In medical imaging, the ADS5560IRGZ25 enhances image quality by accurately converting the analog signals from medical sensors into high-fidelity digital data, aiding in precise diagnostics.
- High-Speed Data Acquisition: Ideal for use in environments where large volumes of data are processed, such as scientific research and industrial automation, where accurate and timely data conversion is critical.
- Wireless Communications: Helps in the development of communication equipment that requires fast and accurate ADC to handle wide bandwidth signals and dynamic environments.
- Instrumentation and Testing Equipment: Utilized in electronic test equipment to ensure high precision and reliability in signal processing, essential for accurate measurements and testing.
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