ADS5517IRGZ25

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Mfr.Part #
ADS5517IRGZ25
Manufacturer
Texas Instruments
Package / Case
48-VFQFN Exposed Pad
Datasheet
Download
Description
IC ADC 11BIT PIPELINED 48VQFN
Stock
12,772
In Stock :
12,772

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Manufacturer :
Texas Instruments
Product Category :
Analog to Digital Converters (ADC)
Pin Count :
48
Max Supply Voltage :
3.6V
Max Power Dissipation :
1.4W
Number of Pins :
48
Mount :
Surface Mount
Mounting Type :
Surface Mount
Length :
7mm
Supply Type :
Analog, Digital
Number of Bits :
11
Configuration :
S/H-ADC
Peak Reflow Temperature (Cel) :
260
Interface :
Parallel, Serial
Lead Free :
Lead Free
Architecture :
Pipelined
Sampling Rate (Per Second) :
200M
Input Type :
Differential
Sampling Rate :
200 Msps
Number of Functions :
1
Reference Type :
External, Internal
Width :
7mm
Polarity :
Bipolar
Supply Voltage :
3.3V
Base Part Number :
ADS5517
JESD-609 Code :
e4
Analog Input Voltage-Max :
2V
Terminal Finish :
Nickel/Palladium/Gold (Ni/Pd/Au)
Converter Type :
ADC, PROPRIETARY METHOD
Pbfree Code :
yes
Linearity Error-Max (EL) :
0.0732%
Ratio - S/H:ADC :
1:1
Terminal Pitch :
0.5mm
Power Consumption :
1.23W
Output Format :
PARALLEL, WORD
RoHS Status :
ROHS3 Compliant
Resolution :
1.375 B
Radiation Hardening :
No
Voltage - Supply, Analog :
3V~3.6V
Terminal Position :
QUAD
Sample and Hold / Track and Hold :
SAMPLE
ECCN Code :
EAR99
Moisture Sensitivity Level (MSL) :
3 (168 Hours)
Number of Converters :
1
Min Supply Voltage :
3V
Voltage - Supply, Digital :
3V~3.6V
Packaging :
Tape and Reel (TR)
Power Dissipation :
1.4W
Number of Terminations :
48
Integral Nonlinearity (INL) :
1.5 LSB
Output Bit Code :
OFFSET BINARY, 2'S COMPLEMENT BINARY
Operating Supply Voltage :
3.3V
Data Interface :
LVDS - Parallel, Parallel
Operating Temperature :
-40°C~85°C
Number of Analog In Channels :
1
Package / Case :
48-VFQFN Exposed Pad
Datasheets
ADS5517IRGZ25
Introducing Analog to Digital Converters (ADC) Texas Instruments ADS5517IRGZ25 from Chip IC,where excellence meets affordability. This product stands out with its Number of Pins:48, Mounting Type:Surface Mount, Base Part Number:ADS5517, Number of Terminations:48, Operating Temperature:-40°C~85°C, Package / Case:48-VFQFN Exposed Pad, ADS5517IRGZ25 pinout, ADS5517IRGZ25 datasheet PDF, ADS5517IRGZ25 amp .Beyond Analog to Digital Converters (ADC) Texas Instruments ADS5517IRGZ25 ,we also offer ADC104S051CIMM/NOPB, ADS7052IRUGR, ADS7047IRUGR, Our vast inventory has you covered. Contact us now for immediate solutions.

Texas Instruments ADS5517IRGZ25


Analog to Digital Converters (ADC) Texas Instruments ADS5517IRGZ25 Overview

The Analog to Digital Converters (ADC) Texas Instruments ADS5517IRGZ25 is a state-of-the-art 11-bit pipelined ADC, encapsulated in a compact 48VQFN package. Engineered by Texas Instruments, this ADC offers high-speed performance and robust reliability for advanced digital processing applications. With its superior conversion precision and speed, the ADS5517IRGZ25 is ideal for meeting the rigorous demands of high-resolution imaging systems, telecommunications, and data acquisition technologies. Its integration facilitates streamlined operations, boosting system performance while maintaining power efficiency and data integrity.

ADS5517IRGZ25 Features

This ADC boasts several features that make it a powerful choice for developers and engineers looking for high-performance data conversion:

  • 11-bit Resolution: Provides high precision digital outputs, enabling clearer and more accurate readings.
  • Pipelined Architecture: Enhances data processing speed and throughput, ensuring efficient operation in fast-paced environments.
  • Compact 48VQFN Package: Offers a space-saving design, ideal for compact systems with limited PCB space.
  • High-Speed Interface: Facilitates rapid data transfer, which is crucial for real-time processing applications.

ADS5517IRGZ25 Applications

  • Medical Imaging Equipment: Utilized in the development of high-resolution diagnostic tools, where precision and speed are critical for capturing detailed medical images.
  • Wireless Communications: Integral to enhancing the performance of broadband communication systems through fast and accurate signal conversion.
  • Test and Measurement Systems: Ensures accurate data gathering and analysis in various research and development scenarios.
  • High-speed Data Acquisition: Used in scenarios requiring rapid capture and conversion of analog signals to digital form, such as in scientific research and industrial automation.
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