ADS4149IRGZT
- Mfr.Part #
- ADS4149IRGZT
- Manufacturer
- Texas Instruments
- Package / Case
- 48-VFQFN Exposed Pad
- Datasheet
- Download
- Description
- IC ADC 14BIT PIPELINED 48VQFN
- Stock
- 155
- In Stock :
- 155
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- Manufacturer :
- Texas Instruments
- Product Category :
- Analog to Digital Converters (ADC)
- Peak Reflow Temperature (Cel) :
- 260
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Sampling Rate (Per Second) :
- 250M
- Number of Analog In Channels :
- 1
- Mounting Type :
- Surface Mount
- Operating Supply Voltage :
- 1.8V
- Number of Converters :
- 1
- REACH SVHC :
- No SVHC
- Converter Type :
- ADC, PROPRIETARY METHOD
- Thickness :
- 900μm
- Linearity Error-Max (EL) :
- 0.0305%
- Configuration :
- S/H-ADC
- Min Supply Voltage :
- 1.7V
- Reference Type :
- Internal
- Supply Type :
- Analog, Digital
- Supply Voltage :
- 1.8V
- Ratio - S/H:ADC :
- 1:1
- Lead Free :
- Lead Free
- Terminal Position :
- QUAD
- Number of Bits :
- 14
- Mount :
- Surface Mount
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Number of Terminations :
- 48
- Analog Input Voltage-Max :
- 2V
- Length :
- 7mm
- Number of Pins :
- 48
- Differential Nonlinearity :
- 0.5 LSB
- Width :
- 7mm
- Voltage - Supply, Analog :
- 1.7V~1.9V
- JESD-609 Code :
- e4
- Height :
- 1mm
- Terminal Form :
- NO LEAD
- Factory Lead Time :
- 6 Weeks
- Terminal Pitch :
- 0.5mm
- Max Supply Voltage :
- 1.9V
- Sampling Rate :
- 250 Msps
- Number of Functions :
- 1
- Nominal Supply Current :
- 113mA
- Pbfree Code :
- yes
- Integral Nonlinearity (INL) :
- 5 LSB
- Output Bit Code :
- OFFSET BINARY, 2'S COMPLEMENT BINARY
- Power Dissipation :
- 179mW
- Voltage - Supply, Digital :
- 1.7V~1.9V
- Qualification Status :
- Not Qualified
- Pin Count :
- 48
- RoHS Status :
- ROHS3 Compliant
- Packaging :
- Tape and Reel (TR)
- Output Format :
- PARALLEL, WORD
- Base Part Number :
- ADS4149
- Resolution :
- 1.75 B
- Package / Case :
- 48-VFQFN Exposed Pad
- Power Consumption :
- 265mW
- Data Interface :
- LVDS - Parallel, Parallel
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Polarity :
- Bipolar
- Interface :
- DDR, LVDS, Parallel
- Architecture :
- Pipelined
- Sample and Hold / Track and Hold :
- SAMPLE
- Contact Plating :
- Gold
- Operating Temperature :
- -40°C~85°C
- Input Type :
- Differential
- Datasheets
- ADS4149IRGZT

Analog to Digital Converters (ADC) Texas Instruments ADS4149IRGZT Overview
The Texas Instruments ADS4149IRGZT is a cutting-edge 14-bit pipelined analog to digital converter (ADC) encapsulated in a compact 48-VQFN package. Designed to offer both high performance and reliability, this ADC ensures excellent dynamic performance with its high-speed signal conversion capability. The ADS4149IRGZT is particularly suitable for demanding applications requiring accurate data acquisition and rapid processing. Its integration into systems aims to facilitate enhanced data throughput and signal quality, making it an ideal choice for high-performance industrial, medical, and communication infrastructure.
ADS4149IRGZT Features
The ADS4149IRGZT by Texas Instruments boasts a range of features that make it stand out in the field of Analog to Digital Converters. This includes a high sampling rate of up to 250 MSPS, low power consumption, and an internal dither function that improves measurement accuracy by minimizing differential non-linearity. Additionally, the device offers a digital output noise filter and supports various output data rates, enhancing its adaptability across different operational environments.
ADS4149IRGZT Applications
- Medical Imaging Systems: In medical imaging systems, the ADS4149IRGZT provides precise data conversion which is crucial for generating high-resolution images used in diagnostics.
- Wireless Communication Infrastructure: The device can be applied to wireless base stations, where its ability to process high-speed signals helps in handling high volumes of data traffic effectively.
- Test and Measurement Equipment: Utilized in high-speed oscilloscopes and spectrum analyzers, the ADS4149IRGZT enhances the accuracy and reliability of measurements in research and development applications.
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