ADS4149IRGZT
- Mfr.Part #
- ADS4149IRGZT
- Manufacturer
- Texas Instruments
- Package / Case
- 48-VFQFN Exposed Pad
- Datasheet
- Download
- Description
- IC ADC 14BIT PIPELINED 48VQFN
- Stock
- 155
- In Stock :
- 155
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- Manufacturer :
- Texas Instruments
- Product Category :
- Analog to Digital Converters (ADC)
- Voltage - Supply, Digital :
- 1.7V~1.9V
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Number of Analog In Channels :
- 1
- Height :
- 1mm
- Power Dissipation :
- 179mW
- Operating Supply Voltage :
- 1.8V
- Contact Plating :
- Gold
- Number of Pins :
- 48
- Factory Lead Time :
- 6 Weeks
- Architecture :
- Pipelined
- Packaging :
- Tape and Reel (TR)
- Reference Type :
- Internal
- REACH SVHC :
- No SVHC
- Resolution :
- 1.75 B
- Voltage - Supply, Analog :
- 1.7V~1.9V
- Integral Nonlinearity (INL) :
- 5 LSB
- Power Consumption :
- 265mW
- Pin Count :
- 48
- Number of Terminations :
- 48
- Polarity :
- Bipolar
- Lead Free :
- Lead Free
- Interface :
- DDR, LVDS, Parallel
- Lifecycle Status :
- ACTIVE (Last Updated: 2 days ago)
- Differential Nonlinearity :
- 0.5 LSB
- Mount :
- Surface Mount
- Width :
- 7mm
- Converter Type :
- ADC, PROPRIETARY METHOD
- Moisture Sensitivity Level (MSL) :
- 3 (168 Hours)
- Analog Input Voltage-Max :
- 2V
- Nominal Supply Current :
- 113mA
- Output Bit Code :
- OFFSET BINARY, 2'S COMPLEMENT BINARY
- Number of Converters :
- 1
- Terminal Form :
- NO LEAD
- Configuration :
- S/H-ADC
- Pbfree Code :
- yes
- Mounting Type :
- Surface Mount
- Number of Functions :
- 1
- Thickness :
- 900μm
- Linearity Error-Max (EL) :
- 0.0305%
- Sampling Rate :
- 250 Msps
- Supply Voltage :
- 1.8V
- Output Format :
- PARALLEL, WORD
- Sample and Hold / Track and Hold :
- SAMPLE
- Min Supply Voltage :
- 1.7V
- Base Part Number :
- ADS4149
- Supply Type :
- Analog, Digital
- Length :
- 7mm
- Terminal Pitch :
- 0.5mm
- JESD-609 Code :
- e4
- Qualification Status :
- Not Qualified
- RoHS Status :
- ROHS3 Compliant
- Max Supply Voltage :
- 1.9V
- Peak Reflow Temperature (Cel) :
- 260
- Sampling Rate (Per Second) :
- 250M
- Terminal Position :
- QUAD
- Data Interface :
- LVDS - Parallel, Parallel
- Ratio - S/H:ADC :
- 1:1
- Number of Bits :
- 14
- Operating Temperature :
- -40°C~85°C
- Input Type :
- Differential
- Package / Case :
- 48-VFQFN Exposed Pad
- Datasheets
- ADS4149IRGZT

Analog to Digital Converters (ADC) Texas Instruments ADS4149IRGZT Overview
The Texas Instruments ADS4149IRGZT is a cutting-edge 14-bit pipelined analog to digital converter (ADC) encapsulated in a compact 48-VQFN package. Designed to offer both high performance and reliability, this ADC ensures excellent dynamic performance with its high-speed signal conversion capability. The ADS4149IRGZT is particularly suitable for demanding applications requiring accurate data acquisition and rapid processing. Its integration into systems aims to facilitate enhanced data throughput and signal quality, making it an ideal choice for high-performance industrial, medical, and communication infrastructure.
ADS4149IRGZT Features
The ADS4149IRGZT by Texas Instruments boasts a range of features that make it stand out in the field of Analog to Digital Converters. This includes a high sampling rate of up to 250 MSPS, low power consumption, and an internal dither function that improves measurement accuracy by minimizing differential non-linearity. Additionally, the device offers a digital output noise filter and supports various output data rates, enhancing its adaptability across different operational environments.
ADS4149IRGZT Applications
- Medical Imaging Systems: In medical imaging systems, the ADS4149IRGZT provides precise data conversion which is crucial for generating high-resolution images used in diagnostics.
- Wireless Communication Infrastructure: The device can be applied to wireless base stations, where its ability to process high-speed signals helps in handling high volumes of data traffic effectively.
- Test and Measurement Equipment: Utilized in high-speed oscilloscopes and spectrum analyzers, the ADS4149IRGZT enhances the accuracy and reliability of measurements in research and development applications.
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