8V182512IDGGREP
- Mfr.Part #
- 8V182512IDGGREP
- Manufacturer
- Texas Instruments
- Package / Case
- 64-TFSOP (0.240, 6.10mm Width)
- Datasheet
- Download
- Description
- IC ABT SCAN TEST DEV3.3V 64TSSOP
- Stock
- 27,334
- In Stock :
- 27,334
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- Manufacturer :
- Texas Instruments
- Product Category :
- Specialty Logic
- Pbfree Code :
- yes
- Qualification Status :
- Not Qualified
- Number of Ports :
- 2
- RoHS Status :
- ROHS3 Compliant
- Time@Peak Reflow Temperature-Max (s) :
- NOT SPECIFIED
- Packaging :
- Tape and Reel (TR)
- Packing Method :
- TR
- Quiescent Current :
- 24mA
- Operating Supply Voltage :
- 3.3V
- Base Part Number :
- 8V182512
- Peak Reflow Temperature (Cel) :
- 260
- Translation :
- n/a
- Max Supply Voltage :
- 3.6V
- Output Type :
- TTL
- Terminal Position :
- Dual
- Mounting Type :
- Surface Mount
- Operating Temperature :
- -40°C~85°C
- Pin Count :
- 64
- Lead Free :
- Lead Free
- Number of Terminations :
- 64
- Lifecycle Status :
- ACTIVE (Last Updated: 5 days ago)
- Control Type :
- INDEPENDENT CONTROL
- Weight :
- 262.601633mg
- Polarity :
- Non-Inverting
- Direction :
- Bidirectional
- Low Level Output Current :
- 64mA
- ECCN Code :
- EAR99
- Output Characteristics :
- 3-STATE WITH SERIES RESISTOR
- Family :
- LVT
- Thickness :
- 1.15mm
- Length :
- 17mm
- Terminal Pitch :
- 0.5mm
- Contact Plating :
- Gold
- Number of Pins :
- 64
- Mount :
- Surface Mount
- Width :
- 6.1mm
- Logic Function :
- Transceiver
- Moisture Sensitivity Level (MSL) :
- 1 (Unlimited)
- Supply Voltage :
- 2.7V~3.6V
- Prop. Delay@Nom-Sup :
- 5.7 ns
- Number of Bits :
- 18
- Factory Lead Time :
- 16 Weeks
- Logic Type :
- ABT Scan Test Device With Universal Bus Transceivers
- Package / Case :
- 64-TFSOP (0.240, 6.10mm Width)
- Min Supply Voltage :
- 2.7V
- Propagation Delay :
- 20 ns
- JESD-609 Code :
- e4
- High Level Output Current :
- -32mA
- Height :
- 1.2mm
- Number of Elements :
- 2
- Number of Functions :
- 2
- Terminal Form :
- Gull wing
- Trigger Type :
- POSITIVE EDGE
- Datasheets
- 8V182512IDGGREP

Specialty Logic Texas Instruments 8V182512IDGGREP Overview
Introducing the cutting-edge Specialty Logic Texas Instruments 8V182512IDGGREP, a premier integrated circuit meticulously crafted by Texas Instruments, a pioneer in semiconductor innovation. This sophisticated IC ABT SCAN TEST DEV3.3V 64TSSOP embodies the epitome of reliability, precision, and efficiency, tailored to meet the diverse needs of modern electronic systems.
Engineered with utmost precision and care, this IC offers unparalleled performance in scan test development, boasting a voltage rating of 3.3V and housed in a compact 64-TSSOP package. Its Advanced BiCMOS Technology (ABT) ensures seamless integration and compatibility across a wide range of applications, making it the preferred choice for discerning professionals in the electronics industry.
Designed to exceed industry standards, the Specialty Logic Texas Instruments 8V182512IDGGREP sets a new benchmark for excellence in integrated circuitry, empowering businesses with the tools they need to thrive in today's dynamic market landscape.
8V182512IDGGREP Features
- Advanced BiCMOS Technology (ABT) for enhanced performance and reliability
- Scan test development capability for comprehensive testing and validation
- Operating voltage of 3.3V for versatile compatibility
- Compact 64-TSSOP package for space-efficient integration
- Robust construction for long-term durability and stability
8V182512IDGGREP Applications
- Automotive Electronics: The 8V182512IDGGREP finds its application in automotive electronic control units (ECUs) for scan test development, ensuring optimal performance and reliability in critical automotive systems.
- Industrial Automation: Integrated into industrial automation equipment, this IC facilitates efficient testing and validation processes, enhancing productivity and minimizing downtime in manufacturing environments.
- Telecommunication Systems: Deployed in telecommunications infrastructure, the 8V182512IDGGREP enables seamless scan test development, ensuring uninterrupted communication networks and reliable service delivery.
- Consumer Electronics: From smartphones to smart home devices, this IC plays a pivotal role in ensuring the quality and reliability of consumer electronics, contributing to an enhanced user experience.
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