8N4SV76EC-0045CDI

Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N4SV76EC-0045CDI Overview

The Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N4SV76EC-0045CDI is an advanced voltage-controlled crystal oscillator (VCXO) designed for precision timing solutions. With a focus on stability and performance, this IC delivers a frequency of 100MHz, housed in a compact 6CLCC package. Ideal for applications requiring exact timing and frequency control, the 8N4SV76EC-0045CDI utilizes state-of-the-art technology to provide reliable and consistent results. Its robust design and superior construction make it a perfect choice for critical and high-performance environments, enticing B2B customers to invest in bulk purchases for their sophisticated systems.

8N4SV76EC-0045CDI Features

• High-frequency operation at 100MHz, suitable for high-speed digital systems
• Compact 6CLCC package allows for integration in space-constrained applications
• Low jitter and phase noise, enhancing the overall system reliability and performance
• High stability and precision, ensuring consistent output under varying conditions
• Programmable output, which allows customization to specific application needs

8N4SV76EC-0045CDI Applications

• Telecommunications Equipment: Used in network routers and switches to generate precise clock signals, ensuring smooth data transmission and system synchronization.
• Data Center Servers: Provides the clock timing for server motherboards, critical for managing data flow and server communication efficiently.
• Wireless Infrastructure: Serves as a stable timing source in base stations for mobile communications, facilitating reliable and uninterrupted service.
• Broadcasting Equipment: Ensures accurate timing in broadcasting systems for seamless transmission and synchronization of broadcast content.
• Test and Measurement Instruments: Delivers precise frequency control needed for various measurement and diagnostic equipment, ensuring accuracy and repeatability in testing scenarios.