8N4DV85LC-0023CDI8

Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N4DV85LC-0023CDI8 Overview

The Programmable Timers and Oscillators Intersil (Renesas Electronics Corporation) 8N4DV85LC-0023CDI8 IC is an advanced VCXO (Voltage Controlled Crystal Oscillator) designed to deliver exceptional frequency control and stability in a dual frequency format. Packaged in a compact 6CLCC format, this oscillator offers precise frequency tuning for applications demanding high reliability and precise timing. Its integration capabilities make it an ideal choice for sophisticated telecommunications infrastructure, networking, and precise timing applications. This component ensures minimal phase noise and jitter, enhancing overall system performance where timing is critical.

8N4DV85LC-0023CDI8 Features

• Dual Frequency Output: Supports multiple frequency outputs, enabling versatile use across different systems.
• Low Phase Noise: Minimizes system errors in critical communication applications, ensuring clear and precise signal transmission.
• Compact 6CLCC Package: Offers a space-saving design without compromising on performance, suitable for densely populated boards.
• Voltage Controlled Tuning: Allows for fine adjustment of frequency, providing flexibility and precision in use.
• High Stability: Ensures consistent performance under varying environmental conditions.

8N4DV85LC-0023CDI8 Applications

• Telecommunications Infrastructure: Utilized in base stations and network routers for precise timing and synchronization.
• Networking Equipment: Ensures accurate data transfer timing in switches and modems, crucial for maintaining system integrity and performance.
• Data Centers: Provides stable and reliable frequency sources for server timing, essential for large scale data operations and cloud services.
• Broadcasting Equipment: Used in broadcasting systems to maintain exact frequency requirements for seamless signal transmission.
• Test and Measurement Instruments: Critical for ensuring measurement accuracy and reliability in various electronic testing scenarios.